Invention Grant
- Patent Title: Nonvolatile memory device and method of programming the same
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Application No.: US15381724Application Date: 2016-12-16
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Publication No.: US09899097B2Publication Date: 2018-02-20
- Inventor: Youngmin Kim , Il Han Park , Sung-Won Yun , Hyejin Yim
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-si, Gyeonggi-Do
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Suwon-si, Gyeonggi-Do
- Agency: F. Chau & Associates, LLC
- Priority: KR10-2015-0181882 20151218
- Main IPC: G11C16/34
- IPC: G11C16/34 ; G11C11/56 ; G11C16/08 ; G11C16/10

Abstract:
A nonvolatile memory device is provided as follows. A memory cell array includes a plurality of memory cells. An address decoder provides a first verify voltage to selected memory cells among the plurality of memory cells in a first program loop and provides a second verify voltage to the selected memory cells in a second program loop. A control logic determines the second program loop as a verify voltage offset point in which the first verify voltage is changed to the second verify voltage based on a result of a verify operation of the first program loop.
Public/Granted literature
- US20170178740A1 NONVOLATILE MEMORY DEVICE AND METHOD OF PROGRAMMING THE SAME Public/Granted day:2017-06-22
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