Invention Grant
- Patent Title: Method for forming contact vias
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Application No.: US14919226Application Date: 2015-10-21
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Publication No.: US09905455B2Publication Date: 2018-02-27
- Inventor: Boon Teik Chan , Safak Sayan
- Applicant: IMEC VZW
- Applicant Address: BE Leuven
- Assignee: IMEC VZW
- Current Assignee: IMEC VZW
- Current Assignee Address: BE Leuven
- Agency: McDonnell Boehnen Hulbert & Berghoff LLP
- Priority: EP14189847 20141022
- Main IPC: H01L21/4763
- IPC: H01L21/4763 ; H01L21/302 ; H01L21/461 ; H01L23/48 ; H01L23/52 ; H01L29/40 ; H01L21/768 ; H01L21/3105 ; H01L21/311

Abstract:
A method for forming contact vias includes providing a substrate comprising a plurality of contact structures embedded in a first dielectric layer, the contacts abutting an upper surface of the first dielectric layer. The method also includes providing a second dielectric layer on the upper surface of the first dielectric layer, and providing contact vias in the second dielectric layer by patterning the second dielectric layer at least at positions corresponding to the contact structures, wherein patterning the second dielectric layer comprises using a DSA patterning technique.
Public/Granted literature
- US20160118295A1 Method for Forming Contact Vias Public/Granted day:2016-04-28
Information query
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