Invention Grant
- Patent Title: Automatic analyzer
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Application No.: US14901370Application Date: 2014-07-25
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Publication No.: US09958468B2Publication Date: 2018-05-01
- Inventor: Yoshihiro Yamashita , Toshiharu Suzuki , Takaaki Hagiwara , Kazunori Yamazawa
- Applicant: HITACHI HIGH-TECHNOLOGIES CORPORATION
- Applicant Address: JP Tokyo
- Assignee: Hitachi High-Technologies Corporation
- Current Assignee: Hitachi High-Technologies Corporation
- Current Assignee Address: JP Tokyo
- Agency: Mattingly & Malur, PC
- Priority: JP2013-166844 20130809
- International Application: PCT/JP2014/069762 WO 20140725
- International Announcement: WO2015/019880 WO 20150212
- Main IPC: G01N35/00
- IPC: G01N35/00 ; G01N21/00 ; G01N1/00 ; G01N15/00 ; G01N33/00 ; G01N33/48 ; G01N31/00

Abstract:
The present invention provides an automatic analyzer capable of reducing the time necessary for analysis processing by making various operations pertaining to the analysis processing more efficient. More specifically, the present invention is characterized in that, from among a plurality of ending operation items set as analysis ending operations to perform at the end of analysis operations for analyzing a sample under analysis, one or more ending operation items to be performed are selected, and on the basis of monitoring results of monitoring the status of an automatic analyzer during the period from the end of the analysis ending operations to the start of analysis preparation operations for preparing for the analysis operations, one or more preparation operation items to be performed are selected from among a plurality of preparation operation items set as analysis preparation operations.
Public/Granted literature
- US20160154016A1 AUTOMATIC ANALYZER Public/Granted day:2016-06-02
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