Invention Grant
- Patent Title: Systems and methods for analyzing a sample from a surface
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Application No.: US15318846Application Date: 2015-06-16
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Publication No.: US09960028B2Publication Date: 2018-05-01
- Inventor: Zheng Ouyang , Xiao Wang , Xiaoyu Zhou
- Applicant: Purdue Research Foundation
- Applicant Address: US IN West Lafayette
- Assignee: Purdue Research Foundation
- Current Assignee: Purdue Research Foundation
- Current Assignee Address: US IN West Lafayette
- Agency: Brown Rudnick LLP
- Agent Adam M. Schoen
- International Application: PCT/US2015/035935 WO 20150616
- International Announcement: WO2015/195607 WO 20151223
- Main IPC: H01J37/04
- IPC: H01J37/04 ; H01J49/04 ; H01J49/24 ; H01J49/00

Abstract:
The invention generally relates to systems and methods for analyzing a sample from a surface. In certain aspects, the invention provides systems that include a sample introduction member that has an inlet, an outlet, and an opening along a wall of the sample introduction member. The sample introduction member may be configured such that the opening couples with a surface that includes a sample in a manner in which molecules of the sample enter the sample introduction member via the opening and exit the sample introduction member via the outlet. A mass spectrometer is configured to receive the molecules of the sample.
Public/Granted literature
- US20170140912A1 SYSTEMS AND METHODS FOR ANALYZING A SAMPLE FROM A SURFACE Public/Granted day:2017-05-18
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