Invention Grant
- Patent Title: Memory diagnosis system
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Application No.: US15403497Application Date: 2017-01-11
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Publication No.: US09965005B2Publication Date: 2018-05-08
- Inventor: Kyung-Ryun Kim , Ki-Tae Park
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-si, Gyeonggi-Do
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Suwon-si, Gyeonggi-Do
- Agency: F. Chau & Associates, LLC
- Priority: KR10-2016-0022906 20160226
- Main IPC: G06F1/20
- IPC: G06F1/20 ; G06F12/16 ; G06F11/07 ; G06F11/30 ; G06F11/32

Abstract:
A memory diagnosis system includes a memory device and a server. The memory device includes a memory module configured to adjust operational parameters in response to a parameter control signal, a memory controller configured to generate the parameter control signal in response to a feedback signal, and a memory state monitor configured to monitor the memory module to generate an information signal that includes information on a state of the memory module. The server is configured to generate the feedback signal in response to the information signal.
Public/Granted literature
- US20170249227A1 MEMORY DIAGNOSIS SYSTEM Public/Granted day:2017-08-31
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