Invention Application
WO2016186930A1 TRANSMITTER CONFIGURED FOR TEST SIGNAL INJECTION TO TEST AC-COUPLED INTERCONNECT
审中-公开
发射机配置用于测试信号注射到测试交流耦合互连
- Patent Title: TRANSMITTER CONFIGURED FOR TEST SIGNAL INJECTION TO TEST AC-COUPLED INTERCONNECT
- Patent Title (中): 发射机配置用于测试信号注射到测试交流耦合互连
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Application No.: PCT/US2016/031919Application Date: 2016-05-11
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Publication No.: WO2016186930A1Publication Date: 2016-11-24
- Inventor: MCLEOD, Scott, D. , IM, Hsung, Jai , CHEN, Stanley, Y.
- Applicant: XILINX, INC.
- Applicant Address: Attn: Legal Dept. 2100 Logic Drive San Jose, CA 95124 US
- Assignee: XILINX, INC.
- Current Assignee: XILINX, INC.
- Current Assignee Address: Attn: Legal Dept. 2100 Logic Drive San Jose, CA 95124 US
- Agency: PARANDOOSH, David A. et al.
- Priority: US14/717,985 20150520
- Main IPC: G01R31/3185
- IPC: G01R31/3185 ; H03K5/00
Abstract:
In one example, a driver circuit includes a differential transistor pair (504) configured to be biased by a current source (502) and including a differential input (516) and a differential output (512). The driver circuit further includes a resistor pair (506) coupled between a node pair and the differential output, a transistor pair coupled between a voltage supply and the node pair, and a bridge transistor coupled between the node pair. The driver circuit further includes a pair of three-state circuit elements (510) having a respective pair of input ports, a respective pair of control ports, and a respective pair of output ports. The pair of output ports is respectively coupled to the node pair. The pair of control ports is coupled to a common node comprising each gate of the transistor pair and a gate of the bridge transistor.
Information query
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