Invention Application
- Patent Title: FEEDBACK CORRECTION IN SUB-RESONANT TAPPING MODE OF AN ATOMIC FORCE MICROSCOPE
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Application No.: PCT/US2018/015897Application Date: 2018-01-30
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Publication No.: WO2018140926A1Publication Date: 2018-08-02
- Inventor: ECHOLS-JONES, Piers , MESSNER, William, C. , SOKOLOV, Igor
- Applicant: TUFTS UNIVERSITY
- Applicant Address: Medford, MA 02155 US
- Assignee: TUFTS UNIVERSITY
- Current Assignee: TUFTS UNIVERSITY
- Current Assignee Address: Medford, MA 02155 US
- Agency: LICHAUCO, Faustino
- Priority: US62/452,057 20170130
- Main IPC: G01Q40/00
- IPC: G01Q40/00
Abstract:
A method of carrying out sub-resonant tapping in an atomic force microscope includes causing a probe that is disposed above a sample to be translated in a direction parallel to a horizontal plane defined by the sample and to oscillate in a vertical direction that is perpendicular to the horizontal plane about an equilibrium line that is separated from the horizontal plane by a vertical offset. As a result, the probe repeatedly taps a surface of the sample. Each tap begins with a first contact of the probe on the surface followed by a progressive increase in force exerted by the sample on the probe until a peak force is attained. The vertical offset is controlled by relying at least in part on a feature other than the peak force as a basis for controlling the vertical offset.
Public/Granted literature
- WO2018140926A9 FEEDBACK CORRECTION IN SUB-RESONANT TAPPING MODE OF AN ATOMIC FORCE MICROSCOPE Public/Granted day:2018-08-02
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