Invention Application
- Patent Title: SYSTEMS, DEVICES AND METHODS FOR AUTOMATIC MICROSCOPE FOCUS
-
Application No.: PCT/US2019/029076Application Date: 2019-04-25
-
Publication No.: WO2019212848A1Publication Date: 2019-11-07
- Inventor: PUTMAN, John, B. , PUTMAN, Matthew, C. , PINSKIY, Vadim , SHAROUKHOV, Denis, Y.
- Applicant: NANOTRONICS IMAGING, INC.
- Applicant Address: 2251 Front Street, Suite 110 Cuyahoga Falls, OH 44223 US
- Assignee: NANOTRONICS IMAGING, INC.
- Current Assignee: NANOTRONICS IMAGING, INC.
- Current Assignee Address: 2251 Front Street, Suite 110 Cuyahoga Falls, OH 44223 US
- Agency: BYRNE, Matthew, T. et al.
- Priority: US15/967,802 20180501; US16/207,727 20181203
- Main IPC: G02B21/24
- IPC: G02B21/24 ; G02B21/00 ; B82Y20/00 ; B82Y15/00
Abstract:
An automatic focus system for an optical microscope that facilitates faster focusing by using at least two offset focusing cameras. Each offset focusing camera can be positioned on a different side of an image forming conjugate plane so that their sharpness curves intersect at the image forming conjugate plane. Focus of a specimen can be adjusted by using sharpness values determined from images taken by the offset focusing cameras.
Information query