ADC Testing
    1.
    发明公开
    ADC Testing 审中-公开
    ADC-测试

    公开(公告)号:EP2372916A2

    公开(公告)日:2011-10-05

    申请号:EP11250312.3

    申请日:2011-03-16

    申请人: Ateeda Ltd.

    IPC分类号: H03M1/12

    摘要: A histogram-based method for testing an electronic converter device, such as an analogue to digital converter, the method comprising: defining at least one histogram hyperbin arranged to store hits for at least one subrange of output codes; applying an input test stimulus to an input of the device to test a subrange of output codes matched to the hyperbin; and accumulating the histogram.

    摘要翻译: 一种用于测试诸如模数转换器的电子转换器装置的基于直方图的方法,所述方法包括:定义至少一个布置成存储输出码的至少一个子范围的命中的直方图超列; 将输入测试激励应用到所述设备的输入端以测试与所述超字节匹配的输出代码的子范围; 并累积直方图。

    ADC Testing
    2.
    发明公开
    ADC Testing 审中-公开
    ADC-测试

    公开(公告)号:EP2372916A3

    公开(公告)日:2013-04-17

    申请号:EP11250312.3

    申请日:2011-03-16

    申请人: Ateeda Ltd.

    IPC分类号: H03M1/10 H03M1/12

    摘要: A histogram-based method for testing an electronic converter device, such as an analogue to digital converter, the method comprising: defining at least one histogram hyperbin arranged to store hits for at least one subrange of output codes; applying an input test stimulus to an input of the device to test a subrange of output codes matched to the hyperbin; and accumulating the histogram.