Abstract:
For analog-to-digital converters (ADCs) which utilize a feedback digital-to-analog converter (DAC) for conversion, the final analog output can be affected or distorted by errors of the feedback DAC. A digital measurement technique can be implemented to determine timing mismatch error for the feedback DAC in a continuous-time delta-sigma modulator (CTDSM) or in a continuous-time pipeline modulator. The methodology utilizes cross-correlation of each DAC unit elements (UEs) output to the entire modulator output to measure its timing mismatch error respectively. Specifically, the timing mismatch error is estimated using a ratio based on a peak value and a value for the next tap in the cross-correlation function. The obtained errors can be stored in a look-up table and fully corrected in digital domain or analog domain.
Abstract:
Die Erfindung betrifft eine Messvorrichtung (1) mit wenigstens zwei Messkanälen (2a, 2b), jeder Messkanal (2a, 2b) umfassend einen A/D-Wandler (4a, 4b) für die Umwandlung einer analogen Spannung in einen digitalen Spannungswert, und eine Logikeinheit (5a, 5b), die mit dem A/D-Wandler (4a, 4b) verbunden ist, um den digitalen Spannungswert zu empfangen, wobei wenigstens ein Messkanal (2a, 2b) als sicherer Messkanal (2a, 2b) mit einem Multiplexer (3a, 3b) ausgeführt ist, wobei mit dem Multiplexer (3a, 3b) die analoge Spannung zwischen einer Messspannung (U Mess1 , U Mess2 ) und einer Referenzspannung (U Ref1 , U Ref2 ) umschaltbar ist, und die Logikeinheit (5a, 5b) wenigstens eines anderen Messkanals (2a, 2b) als Referenzerzeuger ausgeführt ist, um die Referenzspannung (U Ref1 , U Ref2 ) bereitzustellen und den Multiplexer (3a, 3b) zwischen der Messspannung (U Mess1 , U Mess2 ) und der Referenzspannung (U Ref1 , U Ref2 ) umzuschalten.
Abstract:
A method for measuring the resistance value of the conversion resistance of a current mode analog/digital converter, involves keeping a current signal inputted to the current mode analog/digital converter constant (S11); obtaining a first digital quantity AD 0 transformed by the current mode analog/digital converter (S12); connecting a resistance R j , of which precision is higher than that of the conversion resistance R z of the current mode analog/digital converter, with the conversion resistance R z in parallel (S13); obtaining again a second digital quantity AD 1 transformed by the current mode analog/digital converter (S14); acquiring the resistance value of the conversion resistance R z by the following formula(I):
wherein, R 1 is the acquired resistance value of the conversion resistance R z , and R 2 is the resistance value of the resistance R j , of which precision is higher than that of the conversion resistance R z . The method can improve the precision of measuring and controlling the measured physical objects.
Abstract:
Die Erfindung betrifft eine Schaltungsanordnung, sowie ein Verfahren zur Feststellung von Zählfehlern in einer Positionsmesseinrichtung, die eine dem Positionsverschiebungsausmaß eines zu messenden Objekts entsprechende Impulsreihe feststellt, wobei mittels eines Zählers (4) Zählsignale, die aus wenigstens einem verdoppelten, verdreifachten oder vervierfachten Basissignal (Phase A, Phase B) zur Berechnung des Positionsverschiebungsausmaßes erzeugt werden, gezählt werden und mittels eines Vergleichers (6) wenigstens ein Ausgangssignal (Z0, Z1) des Zählers (4) mit einem aus dem wenigstens einen Basissignal (Phase A, Phase B) abgeleiteten Vergleichssignal verglichen wird. Bei Bestehen einer bestimmten Beziehung gibt der Vergleicher (6) ein Zählfehlerausgangssignal (E) aus.
Abstract:
A histogram-based method for testing an electronic converter device, such as an analogue to digital converter, the method comprising: defining at least one histogram hyperbin arranged to store hits for at least one subrange of output codes; applying an input test stimulus to an input of the device to test a subrange of output codes matched to the hyperbin; and accumulating the histogram.
Abstract:
In one aspect, the invention is an integrated circuit (IC) for use in testing an analog-to-digital (ADC) converter includes a first channel of a parametric measurement unit (PMU) configured to send a force signal to the ADC. The IC also includes a first digital-to-analog converter (DAC) connected to the first channel of the PMU. The DAC has a DC level of accuracy of less than 1 millivolt.In another aspect, the invention is an integrated circuit (IC) for use in testing a digital-to-analog-converter-device-under-test (DACDUT). The IC includes a first channel of a parametric measurement unit (PMU) configured to send a force signal to the DACDUT and including an output port for taking measurements, a first digital-to-analog converter (DAC) connected to the first channel of the PMU and a PMU measurement path connected to the output port having a DC level of accuracy of less than 1 mV.
Abstract:
An analog-to-digital converter (10) comprises a set of comparators (12a-12f) for providing a set of different output signals whose logic states are a function of an analog input signal voltage and one or more reference voltage signals supplied by a resistive network (16). The comparators are connected to a decoder (20) for processing the thermometer code outputs of the comparators to generate a digital word output corresponding to the voltage amplitude of the analog signal. Several of the comparators are also connected to an error checking network (22), including a preconditioning circuit (100) and a detection circuit (102) for processing these comparator outputs to provide an error signal whenever one or more of the comparators are not operating properly. The error checking network and decoder are connected to an error correction circuit (26) for correcting the digital word signal in accordance with the error signal. Also, comparator circuits are provided which are well-adapted for high-speed operation and error checking.
Abstract:
An error correction circuit (16) corrects errors in the thermometer code (T₁-T₇) developed by a parallel or "flash" analog-to-digital converter (10). The error correction circuit employs plural similar bit exchange modules (34) of which each includes a 2-input OR gate (46) having common inputs (48 and 50) that constitute the inputs of the bit exchange module. The output (52) of the AND gate and the output (54) of the OR gate constitute the outputs of the bit exchange module. The bit exchange modules receive the digital-to-analog converter thermometer code and are interconnected to correct errors therein resulting from the presence of more than one transition between different logic states for adjacent bits in the thermometer code. The error correction circuit manipulates the thermometer code bits to provide a corrected thermometer code (T 1C -T 7C ) that has only one transition between different logic states for adjacent bits thereof.