PROCESS FOR MINIMIZING CHIPPING WHEN SEPARATING MEMS DIES ON A WAFER
    2.
    发明公开
    PROCESS FOR MINIMIZING CHIPPING WHEN SEPARATING MEMS DIES ON A WAFER 审中-公开
    PROCEDURE FOR MINIMIZED SPAN教育在MEMS芯片上的晶片中的分离

    公开(公告)号:EP2567401A1

    公开(公告)日:2013-03-13

    申请号:EP11778212.8

    申请日:2011-05-03

    申请人: S3C, Inc.

    IPC分类号: H01L23/58

    摘要: A method for separating a plurality of dies on a Micro-Electro-Mechanical System (MEMS) wafer comprising scribing a notch on a first side of the wafer between at least two of the plurality of dies on a first surface and depositing a metal on the first surface of the plurality of dies. The method further comprises scribing a second side of the wafer between at least two of the plurality of dies from a second surface thereof through the notch. The first side and second side are substantially parallel and opposite each other and the first surface and the second surface are substantially parallel and opposite each other. In a process in accordance with the present invention, a method to minimize chipping of the bonding portion of a MEMs device during sawing of the wafer is provided, which minimally affects the process steps associated with separating the die on a wafer.

    SENSOR DEVICE PACKAGING AND METHOD
    3.
    发明公开
    SENSOR DEVICE PACKAGING AND METHOD 审中-公开
    传感器器件封装及相应方法

    公开(公告)号:EP2316008A1

    公开(公告)日:2011-05-04

    申请号:EP09808902.2

    申请日:2009-08-21

    申请人: S3C, Inc.

    IPC分类号: G01L9/06

    CPC分类号: B81B7/0077 B81B7/0019

    摘要: A sensor device and a method of forming comprises a die pad receives a sensor device, such as a MEMS device. The MEMS device has a first coefficient of thermal expansion (CTE). The die pad is made of a material having a second CTE compliant with the first CTE. The die pad includes a base and a support structure with a CTE compliant with the first and second CTE. The die pad has a support structure that protrudes from a base. The support structure has a height and wall thickness which minimize forces felt by the die pad and MEMS device when the base undergoes thermal expansion or contraction forces from a header.