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公开(公告)号：EP0042179A3
公开(公告)日：1983-06-22
申请号：EP81104660
申请日：1981-06-16
发明人： Tamaki, Hiroshi , Ohtomo, Fumio , Kimura, Kazuaki
IPC分类号： G01D05/245 , H03K13/18
摘要： An interpolation encoder comprising a sensor array, a code plate arranged in opposition to the sensor array and having a plurality of groups of lattice patterns, and an arithmetic unit for processing data of the code plate detected by the sensor array. The lattice patterns (20) of at least one of the groups are are inclined.
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公开(公告)号：EP0042178A2
公开(公告)日：1981-12-23
申请号：EP81104659.8
申请日：1981-06-16
发明人： Tamaki, Hiroshi , Ohtomo, Fumio , Kimura, Kazuaki
摘要： An absolute encoder comprising a sensor array, a code plate arranged-in opposition to the sensor array and having a plurality of blocks in the direction of normal displacement, each block having an adress track and a fine reading track, and an arithmetic unit for processing data of the code plate detected by the sensor array. Each of the blocks of the code plate (8) has a reference track (12), an address track and a fine reading track (14). The fine reading track of each block has fine reading patterns which change in a direction crossing said direction of normal displacement.
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公开(公告)号：EP0013799A3
公开(公告)日：1981-07-29
申请号：EP79302233
申请日：1979-10-16
IPC分类号： G01D05/36 , G01D05/244 , H03K13/18 , G01B11/02 , G01B11/26 , G01B07/02 , G01B07/30 , G08C09/00
CPC分类号： G01D5/36 , G01D5/24409 , H03M1/301 , H03M1/305
摘要： An encoder for measuring devices having a code plate (10) including binary grating patterns arranged in a given regular fashion and forming a first scale, a linear sensor (14) Including photodiode elements (16) arranged with fixed intervals and forming a second scale disposed in parallel with the code plate (10), and processor means (20) for absolute-interpolating one pitch of the first or second scale on the basis of reading data or information (RI) obtained from the linear sensor (14) corresponding to a relative position of the patterns (12) to the elements (16). When the number of the scale divisions of the first scale within a fixed range is N, the number of the scale divisions of the second scale is N + 1. Accordingly, when the first scale is a main scale, the second scale is a vernier scale. The processor means (20) detects a phase inverting point (X) corresponding to the interpolation point (X) on the basis of the reading data (RI). The processor means (20) performs the absolute Interpolation by detecting the phase inverting point (X).
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公开(公告)号：EP0013799A2
公开(公告)日：1980-08-06
申请号：EP79302233.6
申请日：1979-10-16
CPC分类号： G01D5/36 , G01D5/24409 , H03M1/301 , H03M1/305
摘要： An encoder for measuring devices having a code plate (10) including binary grating patterns arranged in a given regular fashion and forming a first scale, a linear sensor (14) Including photodiode elements (16) arranged with fixed intervals and forming a second scale disposed in parallel with the code plate (10), and processor means (20) for absolute-interpolating one pitch of the first or second scale on the basis of reading data or information (RI) obtained from the linear sensor (14) corresponding to a relative position of the patterns (12) to the elements (16).
When the number of the scale divisions of the first scale within a fixed range is N, the number of the scale divisions of the second scale is N + 1. Accordingly, when the first scale is a main scale, the second scale is a vernier scale. The processor means (20) detects a phase inverting point (X) corresponding to the interpolation point (X) on the basis of the reading data (RI). The processor means (20) performs the absolute Interpolation by detecting the phase inverting point (X).-
公开(公告)号：EP0042179B1
公开(公告)日：1986-05-07
申请号：EP81104660.6
申请日：1981-06-16
发明人： Tamaki, Hiroshi , Ohtomo, Fumio , Kimura, Kazuaki
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公开(公告)号：EP0042179A2
公开(公告)日：1981-12-23
申请号：EP81104660.6
申请日：1981-06-16
发明人： Tamaki, Hiroshi , Ohtomo, Fumio , Kimura, Kazuaki
摘要： An interpolation encoder comprising a sensor array, a code plate arranged in opposition to the sensor array and having a plurality of groups of lattice patterns, and an arithmetic unit for processing data of the code plate detected by the sensor array. The lattice patterns (20) of at least one of the groups are are inclined.
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公开(公告)号：EP0039921A2
公开(公告)日：1981-11-18
申请号：EP81103499.0
申请日：1981-05-07
发明人： Minami, Masana , Ohtomo, Fumio , Kimura, Kazuaki
CPC分类号： G01D5/2492 , H03M1/305 , H03M1/60
摘要： An encoder device is characterized by comprising a code plate (1) which is divided into a plurality of blocks (N 1 ,..., Np, .., N n-1 , N n ) along the longitudinal direction, in each of which is encoded address information consisting of code sequences arranged in a row along the longitudinal direction and representing the absolute address of the respective blocks; a line sensor (4) having a plurality of sensor elements arranged in a row for reading the information stored in the code plate; and means (6) for processing an electric output signal from the line sensor (4) to read the block address.
摘要翻译： 一种编码器装置的特征在于包括沿着纵向被分成多个块（N1 ...，Np，...，Nn-1，Nn）的代码板（1），每个块被编码 地址信息，包括沿着纵向排列成一行的代码序列，并表示相应块的绝对地址; 线传感器（4），其具有排列成行的多个传感器元件，用于读取存储在代码板中的信息; 以及用于处理来自线传感器（4）的电输出信号以读取块地址的装置（6）。
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8.发明公开Method and apparatus for measuring the displacement between a code plate and a sensor array 失效方法和装置用于测量编码板和传感器阵列之间的位移。
公开(公告)号：EP0039082A2
公开(公告)日：1981-11-04
申请号：EP81103189.7
申请日：1981-04-28
CPC分类号： G01D5/36 , G01D5/2457 , H03M1/287
摘要： An encoder has an optical measuring part establishing a vernier relationship between a code plate (1) and a line sensor (5), and counters (12,17) for obtaining a coarse reading from time serial output signals of the line sensor (5) and a fine reading from the vernier relationship. Correction data including a change component in a magnification of a lens system (4) is obtained from a counter (23). The correction data and the fine reading are supplied to a converting circuit (13a) to provide a corrected fine reading.
摘要翻译： 一个编码器具有光学测定部建立代码板之间的游标关系（1）和线传感器（5），和计数器（12,17），用于获得一个粗读放在fromtime的线传感器的串行输出信号（5） 从游标关系的精确读取。 校正数据包括在透镜系统的放大倍数的变化成分（4）是由一个计数器（23）中获得。 校正数据和读取FNE被提供给一个转换电路（13A），以提供经过校正的精细读。
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9.发明授权Method and apparatus for measuring the displacement between a code plate and a sensor array 失效用于测量代码板和传感器阵列之间位移的方法和装置
公开(公告)号：EP0039082B1
公开(公告)日：1986-10-08
申请号：EP81103189.7
申请日：1981-04-28
CPC分类号： G01D5/36 , G01D5/2457 , H03M1/287
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公开(公告)号：EP0057446B1
公开(公告)日：1985-10-16
申请号：EP82100637.6
申请日：1982-01-29
发明人： Tamaki, Hiroshi , Kimura, Kazuaki
CPC分类号： H03K17/7955 , G01C15/00 , H03K17/941 , H03K17/9631
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