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公开(公告)号：EP0059480B1
公开(公告)日：1987-01-28
申请号：EP82101639.1
申请日：1982-03-03
发明人： Tamaki, Hiroshi
IPC分类号： G01M11/02
CPC分类号： G01M11/0235
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公开(公告)号：EP0042179A3
公开(公告)日：1983-06-22
申请号：EP81104660
申请日：1981-06-16
发明人： Tamaki, Hiroshi , Ohtomo, Fumio , Kimura, Kazuaki
IPC分类号： G01D05/245 , H03K13/18
摘要： An interpolation encoder comprising a sensor array, a code plate arranged in opposition to the sensor array and having a plurality of groups of lattice patterns, and an arithmetic unit for processing data of the code plate detected by the sensor array. The lattice patterns (20) of at least one of the groups are are inclined.
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公开(公告)号：EP0042178A2
公开(公告)日：1981-12-23
申请号：EP81104659.8
申请日：1981-06-16
发明人： Tamaki, Hiroshi , Ohtomo, Fumio , Kimura, Kazuaki
摘要： An absolute encoder comprising a sensor array, a code plate arranged-in opposition to the sensor array and having a plurality of blocks in the direction of normal displacement, each block having an adress track and a fine reading track, and an arithmetic unit for processing data of the code plate detected by the sensor array. Each of the blocks of the code plate (8) has a reference track (12), an address track and a fine reading track (14). The fine reading track of each block has fine reading patterns which change in a direction crossing said direction of normal displacement.
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公开(公告)号：EP0161207A3
公开(公告)日：1988-07-27
申请号：EP85730065
申请日：1985-04-30
发明人： Tamaki, Hiroshi , Sugai, Hiroo , Kondo, Fumitomo
IPC分类号： G01C05/02
CPC分类号： G01C5/02
摘要： A liquid prism is disclosed. It includes a liquid in order to obtain a free liquid surface which is perpendicular to the direction of gravity, and a liquid container for sealing the liquid in it. At least a part of the bottom surface portion of the container is formed of a light transmitting material. A good thermal conductive material such as a metallic material is provided deep enough under the free liquid surface of the liquid so that the free liquid surface will not interfere with the free liquid surface, even when the container is inclined at angles within the range of measurement. At least a part of the good thermal conductive material is formed with an opening to permit the light from the bottom surface portion of the liquid container to transmit therethrough. The good thermal conductive material may be formed with an irregular portion.
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公开(公告)号：EP0042179B1
公开(公告)日：1986-05-07
申请号：EP81104660.6
申请日：1981-06-16
发明人： Tamaki, Hiroshi , Ohtomo, Fumio , Kimura, Kazuaki
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公开(公告)号：EP0042179A2
公开(公告)日：1981-12-23
申请号：EP81104660.6
申请日：1981-06-16
发明人： Tamaki, Hiroshi , Ohtomo, Fumio , Kimura, Kazuaki
摘要： An interpolation encoder comprising a sensor array, a code plate arranged in opposition to the sensor array and having a plurality of groups of lattice patterns, and an arithmetic unit for processing data of the code plate detected by the sensor array. The lattice patterns (20) of at least one of the groups are are inclined.
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7.发明公开Method and apparatus for measuring the displacement between a code plate and a sensor array 失效方法和装置用于测量编码板和传感器阵列之间的位移。
公开(公告)号：EP0039082A2
公开(公告)日：1981-11-04
申请号：EP81103189.7
申请日：1981-04-28
CPC分类号： G01D5/36 , G01D5/2457 , H03M1/287
摘要： An encoder has an optical measuring part establishing a vernier relationship between a code plate (1) and a line sensor (5), and counters (12,17) for obtaining a coarse reading from time serial output signals of the line sensor (5) and a fine reading from the vernier relationship. Correction data including a change component in a magnification of a lens system (4) is obtained from a counter (23). The correction data and the fine reading are supplied to a converting circuit (13a) to provide a corrected fine reading.
摘要翻译： 一个编码器具有光学测定部建立代码板之间的游标关系（1）和线传感器（5），和计数器（12,17），用于获得一个粗读放在fromtime的线传感器的串行输出信号（5） 从游标关系的精确读取。 校正数据包括在透镜系统的放大倍数的变化成分（4）是由一个计数器（23）中获得。 校正数据和读取FNE被提供给一个转换电路（13A），以提供经过校正的精细读。
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8.发明授权Method and apparatus for measuring the displacement between a code plate and a sensor array 失效用于测量代码板和传感器阵列之间位移的方法和装置
公开(公告)号：EP0039082B1
公开(公告)日：1986-10-08
申请号：EP81103189.7
申请日：1981-04-28
CPC分类号： G01D5/36 , G01D5/2457 , H03M1/287
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公开(公告)号：EP0057446B1
公开(公告)日：1985-10-16
申请号：EP82100637.6
申请日：1982-01-29
发明人： Tamaki, Hiroshi , Kimura, Kazuaki
CPC分类号： H03K17/7955 , G01C15/00 , H03K17/941 , H03K17/9631
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公开(公告)号：EP0078062A1
公开(公告)日：1983-05-04
申请号：EP82109941.3
申请日：1982-10-27
发明人： Tamaki, Hiroshi
CPC分类号： A61B3/107 , G01B11/255
摘要： A curvature measuring apparatus comprises:
an illuminating optical system (1) for illuminating a surface to be measured, said illuminating optical (1) system including light source means (8) forming a pattern of at least two groups of straight lines having different directions of arrangement, each being composed of at least two parallel straight lines in a virtual plane, and collimator lens means for orienting a principal ray of an illuminating beam of light emitted from said light source means (8) through a pin hole (10) arranged on the optical axis, to be parallel to said optical axis; detecting means (2) for detecting said illuminating beam of light reflected from said surface positioned in a plane which is not optically conjugate with said light source (8); and arithmetic means for calculating the radius of curvature of said surface from changes in inclination and pitch of the projected straight-line pattern which is formed by said reflected light detected by said detecting means (2) and which corresponds to said light source.
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