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    SIMULTANEOUS X-RAY DIFFRACTION AND COMPUTED TOMOGRAPHY SYSTEM AND METHOD
    2.
    发明公开
    SIMULTANEOUS X-RAY DIFFRACTION AND COMPUTED TOMOGRAPHY SYSTEM AND METHOD 审中-公开
    同时进行的X射线衍射和计算机断层摄影系统和方法

    公开(公告)号：EP3182104A1

    公开(公告)日：2017-06-21

    申请号：EP16185367.6

    申请日：2016-08-23

    申请人： Tsinghua University ,  Nuctech Company Limited

    发明人： Chen, Zhiqiang ,  Zhang, Li ,  Yang Dai, Tianyi ,  Huang, Qingping ,  Sun, Yunda ,  Jin, Xin

    IPC分类号： G01N23/20 ,  G01N23/04 ,  G01V5/00

    CPC分类号： G01N23/046 ,  G01N23/083 ,  G01N23/20083 ,  G01N23/207 ,  G01N2223/056 ,  G01N2223/316 ,  G01N2223/419 ,  G01N2223/643 ,  G01V5/005 ,  G21K1/02

    摘要： The present disclosure relates to a multi-modality detection method and system. The multi-modality detection system includes: a distributed radiation source (101) configured to irradiate an object under detection; a primary collimator (102) configured to separate rays of the distributed radiation source into two parts, wherein one part is for CT detection and the other part is for XRD detection; a CT detection device (103) configured to perform a CT detection to acquire a CT image of the object under detection; and an XRD detection device (104) configured to perform an XRD detection to acquire an XRD image of the object under detection, wherein the CT detection and the XRD detection are performed simultaneously.

    摘要翻译： 本公开涉及一种多模式检测方法和系统。 该多模式检测系统包括：分布式辐射源（101），配置为照射被检测物体; 主要准直器（102），配置为将分布式辐射源的射线分成两部分，其中一部分用于CT检测，另一部分用于XRD检测; CT检测装置（103），被配置为执行CT检测以获取检测对象的CT图像; 以及XRD检测装置（104），被配置为执行XRD检测以获取检测对象的XRD图像，其中CT检测和XRD检测同时进行。

    X-ray analysis apparatus
    5.
    发明公开
    X-ray analysis apparatus 失效
    X射线分析装置。

    公开(公告)号：EP0118932A1

    公开(公告)日：1984-09-19

    申请号：EP84200131.5

    申请日：1984-02-01

    申请人： Philips Electronics N.V.

    发明人： Brouwer, Geert ,  Wadman, Sipke

    IPC分类号： G01N23/20 ,  G01N23/207

    CPC分类号： G01N23/207 ,  G01N23/20008 ,  G01N2223/056 ,  G01N2223/1016 ,  G01N2223/315 ,  G01N2223/316 ,  G01N2223/606 ,  G01N2223/607

    摘要： In an X-ray analysis apparatus, a specimen (96) to be examined is mounted on the circumference of a focus cylinder (94), which can be rolled along an auxiliary cylinder (88) arranged concentrically around the beam focus (98) of an X-ray beam (84). Independently of the movement mechanism (100) used, a fixed part of the specimen then remains continuously in the beam path. Invariably the same surface area of the specimen is irradiated by the X-ray beam. The movement mechanism (107) may have added to it a device by means of which during the movement of the specimen (96) and the detector (106) the detector is continuously optimally directed to the specimen. The specimen holder may have added to it a device for rotating and/or tilting a specimen included therein.

    X-RAY DIFFRACTOMETER
    7.
    发明公开
    X-RAY DIFFRACTOMETER 审中-公开
    RÖNTGENSTRAHLDIFFRAKTOMETER

    公开(公告)号：EP3147654A1

    公开(公告)日：2017-03-29

    申请号：EP15802969.4

    申请日：2015-01-14

    申请人： Rigaku Corporation

    发明人： OSAKABE, Takeshi ,  OZAWA, Tetsuya ,  OMOTE, Kazuhiko ,  JIANG, Licai ,  VERMAN, Boris

    IPC分类号： G01N23/207

    CPC分类号： G01N23/20008 ,  G01N23/205 ,  G01N23/207 ,  G01N2223/056

    摘要： Only X-rays having a specific wavelength out of focusing X-rays 2 diffracted from a sample S is reflected from a monochromator 60 based on a Bragg's condition, passed through a receiving slit 30 and detected by an X-ray detector 20. The monochromator 60 is configured to be freely removable, and arranged between the sample S and a focal point 2a at which the focusing X-rays 2 diffracted from the sample S are directly focused. At this time, the monochromator 60 is approached to the focal point 2a as closely as possible. The monochromator 60 comprises a multilayer mirror having an internal interplanar spacing which varies continuously from one end to the other end.

    摘要翻译： 仅从取样S衍射的聚焦X射线2中的特定波长的X射线基于布拉格条件从单色仪60反射，通过接收狭缝30并由X射线检测器20检测。单色仪 60被配置为可自由移除，并且布置在样本S和焦点2a之间，聚焦X射线2从样本S衍射的焦点直接聚焦。 此时，单色器60尽可能接近接近焦点2a。 单色器60包括具有从一端到另一端连续变化的内部晶面间距的多层反射镜。