Abstract:
A mass spectrometer system having: a primary ion source capable of irradiating a segment on a planar sample with a beam of primary ions, an orthogonal ion mass-to-charge ratio, the analyzer being configured to separate secondary elemental atomic ions according to their mass-to-charge ratio by time of flight; an ion detector for detecting secondary elemental atomic ions and producing mass spectra measurements; and a synchronizer. In the system, the beam of primary ions scans across the planar sample in two dimensions and the synchronizer associates the mass spectra measurements with positions on the planar sample.
Abstract:
An ionising apparatus for ionising a sample of gaseous fluid. The ionising apparatus comprises an ioniser configured to provide reactant ions; an ion modifier configured to modify the reactant ions, and a reaction region arranged to receive the modified reactant ions and a sample and to combine the sample with the modified reactant ions to ionise the sample for analysis by a detector configured to identify a substance of interest in the sample.
Abstract:
According to an embodiment, a position correction sample (20) is used to correct an irradiation position of an ion beam with respect to a sample platform where an analysis object is disposed in mass spectrometry. The position correction sample (20) comprises a stacked body (LB1). The stacked body includes a first layer (201), a second layer (202), and a third layer (203). The first layer includes a first material. The second layer is provided on the first layer. The second layer includes a second material. The third layer is provided on the second layer. The third layer includes a third material.
Abstract:
A device for ionizing sample particles of a sample gas flow comprises a first flow tube for providing the sample gas flow, and an introducing means for providing H2SO4 molecules to an interaction region. In addition the device comprises a generator for producing reagent primary ions from particles of candidate reagent gas flow essentially in a primary ion production region. The device is configured to introduce said reagent primary ions with H2SO4 molecules in said interaction region in order to arrange interaction between the reagent primary ions and the H2SO4 molecules, thereby producing HSO4− ions and again to produce HSO4− ion clusters comprising HSO4− ions and at least two H2SO4 molecules via interactions of HSO4− with other H2SO4 molecules in said interaction region. Furthermore the device is configured to introduce said HSO4− ion clusters with the sample particles of the sample gas flow in order to provide reactions between said HSO4− ion clusters and the sample particles, and thereby provide a sample cluster comprising the HSO4− ion clusters and said base sample to be determined.
Abstract:
A method of ion imaging is disclosed comprising testing a first portion of a sample by automatically varying one or more parameters of a laser or other ionization device and manually or automatically determining from the first portion one or more optimum or preferred parameters of the laser or other ionization device. A second portion of the sample is then analyzed using the one or more optimum or preferred parameters.