NON-LINEAR OPTICAL STRUCTURE
    104.
    发明公开

    公开(公告)号:EP3809191A1

    公开(公告)日:2021-04-21

    申请号:EP19290104.9

    申请日:2019-10-17

    IPC分类号: G02F1/00 G02B5/22 A61F9/02

    摘要: The invention concerns an optical structure with non-linear optical properties comprising at least one stack comprising a central filter (1) and two optical sandwiching elements (2,3) between which said central filter (1) is interposed, wherein said central filter (1) is in a sol-gel matrix material, said material being doped with at least one optical limiting doping agent, the central filter (1) and the two optical elements (2,3) on either side thereof being assembled by bonding layers (4a, 4b) of a material based on the same sol-gel matrix as that of the central filter, the optical elements (2,3) on either side of the central filter (1) and the bonding layers (4a, 4b) each having a refractive index equal to that of the material of the central filter or only differing from this refractive index within a range of plus or minus 0.05, preferably within a range of plus or minus 0.02.

    HIGH SENSITIVITY PHASE MICROSCOPY IMAGING
    109.
    发明公开

    公开(公告)号:EP3620840A1

    公开(公告)日:2020-03-11

    申请号:EP18306171.2

    申请日:2018-09-05

    IPC分类号: G02B21/14

    摘要: Device for phase microscopy comprising:
    • a spatial light modulator (31),
    • a connecting means (33) adapted to fix the spatial light modulator onto a phase microscope (1), said phase microscope (1) comprising a light path comprising at least a sample area (5), a lighting device (3) for lighting said sample area and an imaging device (13) for capturing a phase image of said sample, said phase image being a 2D matrix of pixels, so that the spatial light modulator (31) is positioned in the light path in a conjugated plane of the sample area (5) and
    • a command (35) of the spatial light modulator (31) connected to the imaging device (13) and adapted to measure the phase shift of a plurality of pixels of the phase image and to command the spatial light modulator (31) in order to substract the measured phase shifts.