摘要:
A signal processing device (100), preferably an undersampling ADC using coherent sampling, is presented for processing a signal (102) , the signal processing device (100) comprising a comparator unit (105) for comparing the signal (102) with a reference signal (106), a generation unit (105, 130) for generating digital result signals (110) indicative of the result of the comparing, an evaluation unit (112) for determining transition times of the digital result signals (110), and an output signal calculation unit (115) adapted for calculating essentially uniformly spaced output signals (116).
摘要:
An asynchronous sigma delta digital to analog converter (100) for converting a digital input signal (u[k]) into an analog output signal (f(t)), the digital to analog converter (100) comprising an asynchronous sigma delta modulator (120) comprising a low pass filter (104) and a comparator (106) and being supplied with the digital input signal (u[k]), and a clock sample unit (108) adapted to sample a signal (x(t)) processed by the comparator (106) based on a clock signal (fb), thereby generating the analog output signal (f(t)).
摘要:
A signal processing device (100) for processing a repetitive signal (102), the signal processing device (100) comprising a determining unit (103) for determining a number of points of time for undersampling the repetitive signal (102), a comparator unit (105) for comparing, at the number of points of time, the repetitive signal (102) with a reference signal (106), a generation unit (105) for generating digital result signals (110) indicative of the result of the comparing, and an evaluation unit (112) for determining transition times of the digital result signals (110).
摘要:
A signal processing device (102) comprising a plurality of processing stages (106 to 108), each of the plurality of processing stages (106 to 108) being adapted for applying an input signal to each of at least one item under examination (109) to be coupled to a respective one of the plurality of processing stages (106 to 108), and at least one signal reconditioning unit (116), each of the at least one signal reconditioning unit (116) being adapted for reconditioning the input signal in a signal path between a preceding one of the plurality of processing stages (106) and a subsequent one of the plurality of processing stages (107).
摘要:
Automated semiconductor device tester apparatus includes a plurality of tester channels for devices under test. The apparatus includes an automated switching module, for switching an unused operative tester channel in the place of any tester channel found to be malfunctioning. The apparatus provides continued test operation irrespective of tester channel malfunctioning.
摘要:
A device (100) for processing data adapted for being converted between an analog format and a digital format, the device (100) comprising a scrambling unit (101) adapted for scrambling the data based on at least a part of the data to thereby decorrelate the data in the analog format with respect to the data in the digital format.
摘要:
There is disclosed a manipulator (100) for positioning an interface of an automatic test system (104). In an embodiment, the manipulator (100) includes a support device (106) to support the interface. A base portion (108) is in connection to the support device (106). The base portion (108) includes a rotational adjustment mechanism (110) for moving the support device (106) about an axis (112) of rotation. A planar adjustment mechanism (114) moves the support device (106) within a plane (116) orthogonal to the axis (112) of rotation. There is disclosed a method of positioning an interface unit (102) of an automatic test system (104). In an embodiment, the method includes moving a support device (106) supporting the interface unit (102) a distance from a docking region of a material handling device (132); and rotating the support device (106) about an axis (112) of rotation passing through the interface unit (102). Other embodiments are also disclosed.