摘要:
The invention concerns an evanescent wave microspectrometer comprising: a planar diopter (D) separating two transparent media, an optical sensor (30) comprising a pixel array, and disposed in the second transparent medium (M2), and an interference device ((10, F1); (11, F1_1, F1_2)) disposed such that at least a part of said interference device is in contact with evanescent waves generated at the surface of the diopter. It is essentially characterised in that it also comprises: a memory storing a map (40) comprising a set of set of data grids (41, 42, 43) comprising the optical response of said sensor (30) for a set of quasi-monochromatic wavelengths of a calibration light source, and a calculator (50) configured to determine the spectrum (ψ) of a test light source configured to generate evanescent waves at the surface of said diopter (D), on the basis of said map (40) and the optical response of said sensor (30).
摘要:
The invention relates to a three-dimensional reconstruction of at least one entity from data representative of the entity in the form of a plurality of sets, called sections (S i ), of points (P n ) sequenced in two dimensions representative of the entity, the plurality of sets being sequenced according to a third dimension representative of the entity, each of the points being cataloged according to a plurality of parameters, at least one part of which defines the point in one of the sections, characterised in that it comprises a determination of a polygonal line joining all the consecutive points of each of the curves and a triangulation of the strips between the polygonal lines, by at least one iterative advancing front of defined successive triangles (FT), from a segment (ST) connecting a polygonal line (LP i ) to the following polygonal line (LP i+1 ), forming a triangle with the point (Pn) of one of said two polygonal lines (LP i , LP i+1 ) which is the least furthest away from the polygonal line (LP i+1 , LP i ) to which it does not belong.
摘要:
The invention relates to a system for determining the identification of a first photographic apparatus on the basis of a photograph as well as the method implemented in such a system. This system comprises a device (10) for analyzing photographs for processing said photograph and a processing device (12) for establishing statistics on the basis of said analysis, the system operating said identification on the basis of parameters "a" and "b" defining a photographic apparatus. According to the invention the system comprises an output facility (14) which operates by statistical comparison with a second photographic apparatus so as to determine whether the photograph has been taken by said first apparatus or said second apparatus.
摘要:
The invention relates to a method of analyzing flight data recorded during N flights of at least one aircraft, by means of a flight data recorder of an aircraft, the data being grouped together by flight i in a signature vector of the flight Xi of size d, the components of which correspond to data recorded during said flight i of the aircraft, a flight i being thus defined by the signature vector Xi, the method comprising the following steps: Gaussian kernel entropy component analysis of the flight signatures Xi to obtain a zone of normal flights and classifying the flight signatures Xi with respect to their distance to said zone; determining, for each flight i, an abnormality score zi defined by the distance of a flight signature Xi with respect to the zone of normal flights; detecting, as a function of the abnormality score zi, at least one abnormal flight.
摘要:
The present invention relates to a method of nanostructuring a film (2) of material, comprising a step of immersing said film (2) of material in an aqueous solution (3) and, during this step, an interference pattern (6) comprising bright areas (6b) and dark areas (6a) is applied on at least one of the faces of the film (2). According to the method of the invention, said material is an oxide or semiconductor inorganic material which can be dissolved to form an aqueous solution under the effect of light absorption. The nanostructuring of the film (2) takes place, on its surface in contact with the aqueous solution (3), by photodissolution in the bright areas (6a) and by growth in the dark areas (6b) of the interference pattern (6). The present invention also relates to a nanostructured coating film (5) obtained by such a method of preparation and to a nanostructured 3D film.