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公开(公告)号：EP3049775A1
公开(公告)日：2016-08-03
申请号：EP14789313.5
申请日：2014-09-26
CPC分类号： G01J3/45 , G01J3/0205 , G01J3/453 , G01J2003/283
摘要： The invention concerns an evanescent wave microspectrometer comprising: a planar diopter (D) separating two transparent media, an optical sensor (30) comprising a pixel array, and disposed in the second transparent medium (M2), and an interference device ((10, F1); (11, F1_1, F1_2)) disposed such that at least a part of said interference device is in contact with evanescent waves generated at the surface of the diopter. It is essentially characterised in that it also comprises: a memory storing a map (40) comprising a set of set of data grids (41, 42, 43) comprising the optical response of said sensor (30) for a set of quasi-monochromatic wavelengths of a calibration light source, and a calculator (50) configured to determine the spectrum (ψ) of a test light source configured to generate evanescent waves at the surface of said diopter (D), on the basis of said map (40) and the optical response of said sensor (30).
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2.发明公开
公开(公告)号：EP4305403A1
公开(公告)日：2024-01-17
申请号：EP22714227.0
申请日：2022-03-08
发明人： BRUYANT, Aurélien , ARNAUD, Laurent
IPC分类号： G01N21/552
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3.发明公开
公开(公告)号：EP3044697A1
公开(公告)日：2016-07-20
申请号：EP14784277.7
申请日：2014-09-10
CPC分类号： G01J9/02 , G01B9/02002 , G01B9/02041 , G06F17/10
摘要： The invention concerns an electronic method for extracting the amplitude Es and the phase φε of an electrical signal in synchronous detection, the signal containing a modulated part lmod of the form lmod ∝ Es f(t)*cos(ϕs -ϕR(t)),, in which ϕR(t) and f(t) are two known temporal modulation functions. The method comprises the following steps: -multiplying the signal with two reference signals C(t) and S(t) constructed from ϕR(t) and f(t); -integrating the resulting signals during a period tint; -determining the amplitude and the phase of said signal from quantities X and Y resulting from the preceding integration operations. The method is characterised in that: -said signal is multiplied by two orthogonal signals C and S that can be decomposed on the same set of frequencies as those present in lmod; f(t) is periodic or constant during integration period tint; ϕR(t) is periodic during integration period tint; and X and Y are linked to Es*cos(ϕs) and Es*sin(ϕs) by two calculated proportionality coefficients. The invention concerns the interferometric assemblies for implementing the above method, and the execution of same using analogue components, circuit boards or software solutions.
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公开(公告)号：EP3899497A1
公开(公告)日：2021-10-27
申请号：EP19845705.3
申请日：2019-12-17
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公开(公告)号：EP3427003A1
公开(公告)日：2019-01-16
申请号：EP17709074.3
申请日：2017-03-07
IPC分类号： G01B9/02 , G01N21/552 , G01N21/45 , G01D5/26 , G01N33/68
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6.发明公开DISPOSITIF INTERFEROMETRIQUE ET SPECTROMETRE CORRESPONDANT 审中-公开INTERFEROMETRISCHE VORRICHTUNG UND ENTSPRECHENDES SPEKTROMETER
公开(公告)号：EP3004821A1
公开(公告)日：2016-04-13
申请号：EP14734872.6
申请日：2014-06-06
CPC分类号： G01J3/453 , G01J3/4532 , G01J2003/4538 , G01N21/553
摘要： The invention relates to an interferometric device including: a separator (20), for separating a collimated beam (F0) into first (F1) and second (F2) incident beams; at least one transducer (13); and a transparent optical system (10), including at least three planar dioptres (D1, D2, D3). The invention is characterised essentially in that the transducer (13) is based on plasmon resonance and in contact with the dioptre (D1); the dioptre (D2) has a network of nanostructures; the optical system (10) and the separator (20) being configured such that the beam (F1) and the beam (F2) undergo total internal reflection on the dioptre (D1) and on the dioptre (D3), respectively, prior to interfering on the dioptre (D2) by total internal reflection and to forming an interferogram in which the central fringe is located at a convergence point (ZOPD).
摘要翻译： 一种干涉仪装置：包括用于将准直光束（F0）分离为第一（F1）和第二（F2）入射光束的分离器; 至少一个换能器; 以及包括至少三个平面屈光度（D1，D2，D3）的透明光学系统。 传感器基于等离子体共振并与屈光度（D1）接触; 屈光度（D2）具有纳米结构网络; 光学系统和分离器被配置为使得光束（F1）和光束（F2）在干涉屈光度（D2）之前分别在屈光度（D1）和屈光度（D3）上经历全内反射， 通过全内反射并形成其中中心条纹位于会聚点（ZOPD）处的干涉图。
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7.发明公开SPECTROMETRE COMPACT A ECHANTILLONAGE BIDIMENSIONNEL 审中-公开KOMPAKTSPEKTROMETERFÜRZWEIDIMENSIONALE ABTASTUNG
公开(公告)号：EP2260277A1
公开(公告)日：2010-12-15
申请号：EP09732105.3
申请日：2009-03-17
CPC分类号： G01J3/0205 , G01J3/02 , G01J3/021 , G01J3/2803 , G01J3/45 , G01J3/453
摘要： The present invention relates to a spectrometer including a diopter (11); a recording means (15, 18) for recording, at said diopter (11), an interferogram (12) formed from two interference beams (F1, F2) and forming interference lines (13) along the transverse axis (Ox) of the interferogram (12) in the plane (xOy) of the diopter (11), said recording means (15, 18) including a network (18) of detection elements (19) so arranged to detect the spatial distribution of said interferogram (12); and is characterized in that said network (18) of detection elements (19) is two-dimensional, wherein at least one portion of said recording means (15, 18) and said interferogram (12) are angled into each other along the transverse axis (Ox) of the interferogram (12). The present invention also relates to a spectroscopic imaging device, including a means for emitting two interference beams (F1, F2), and to such a spectrometer.
摘要翻译： 本发明涉及一种包括屈光度（11）的光谱仪; 在来自两个干涉光束（F1，F2）的干涉图（12）的所述屈光度（11）的所述屈光度（11）处的捕获装置（15,18），并沿着干涉图（12）的横轴（Ox）形成干涉线 屈光度计（11）的平面（xOy），所述捕获装置（15,18）包括检测元件（19）的网络（18），以便检测所述干涉图（12）的空间分布，其特征在于所述 检测元件（19）的网络（18）是二维的，并且所述捕获装置（15,18）和所述干涉图（12）的至少一部分相对于彼此沿横向轴线（Ox）倾斜， 的干涉图（12）。 本发明还涉及一种分光成像装置，包括用于发射两个干涉光束（F1，F2）的装置以及这种光谱仪。
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