Abstract:
The invention concerns a spectroscopic ellipsometer comprising a light source (1) emitting an optical beam, a polarizer (2) arranged on the path of the optical beam emitted by the light source, a sample holder (9) receiving the optical beam from the polarizer output, a polarisation analyser (3) designed to be traversed by the beam reflected by the sample to be analysed, a detection set which receives the beam from the analyser output and which comprises a monochromator (5) and a photodetector (4), means (6) for processing the signal in said detection set output, which include an electronic counter (13). Cooling means (12) maintain the detection set at a temperature lower than room temperature, minimising the noise of the detector so as to be constantly in the condition of minimum photon noise. The optimal measuring condition of the ellipsometer is reached by minimising all the sources of noise (lamps, detection, ambient noise).
Abstract:
Die Erfindung bezieht sich auf ein Polarimeter zur Ermittlung von Eigenschaften einer Probe über Phasenauflösung und Fourieranalyse mit einer Quelle (1, 2, 3, 4, 5) für linear polarisierte Strahlung, einer Probenkammer zur Aufnahme der Polarimeterröhre (6) für die Probe, einen Analysator (7), der am Ausgang der Probenkammer (6) angeordnet ist, der das von der Probe optisch beeinflusste Licht erhält und der kontinuierlich drehbar ist, einen Motor mit Inkrementalgeber (10) als Antrieb für den Analysator (7), einen Detektor (9) mit Linse (8), der das vom Analysator (7) ausgegebene Signal hinsichtlich Analysatorstellung und Intensitätssignal erfasst und an einen Analog-Digitalwandler (11) abgibt, der von dem Inkrementalgeber (19) getriggert wird, und einen Rechner (12), der das Ausgangssignal vom Analog-Digitalwandler (11) erhält und über eine Fourieranalyse eine Aussage über die Eigenschaften der Probe macht.
Abstract:
A first tunable wavelength pulse light source (22) is driven by a reference signal to emit a first optical pulse. An optical demultiplexer (24) demultiplexes a first optical pulse emitted from the first pulse light source (22) into a reference optical pulse and an incident optical pulse to be sent into an object to be measured. An optical multiplexer (26) multiplexes the reference optical pulse and an outgoing optical pulse passing through the object to output multiplexed light. A second pulse light source (23) generates a second optical pulse which is synchronous with the first optical pulse and delays a predetermined time for each period of the first optical pulse. A sampling unit (27, 27a, 27b) receives the multiplexed light and the second optical pulse to obtain an optical pulse train signal proportional to the intensity of the multiplexed light obtained in synchronism with the second optical pulse. From the optical pulse train signal from the sampling unit (27, 27a, 27b), a signal processor (37) obtains an envelope formed by peaks of individual optical pulses forming the optical pulse train. The wavelength dispersion of the object is obtained by measuring the delay time of the outgoing optical pulse passing through the object on the basis of intervals between the peaks of the envelope.
Abstract:
Le procédé de l'invention consiste à effectuer, pour chaque pixel à traiter d'une image thermique d'un objet, trois mesures différentes, par exemple à l'aide d'un polariseur à trois orientations différentes, à en déduire les paramètres de Stockes de l'onde issue de l'objet correspondant au pixel considéré, à calculer les paramètres polarimétriques d'ellipticité et d'inclinaison du grand axe de l'ellipse de l'onde partiellement polarisée, et à reconstruire la surface tridimensionnelle visible de l'objet en déterminant pour chacun de ces pixels ses coordonnées grâce aux relations existant entre les paramètres polarimétriques de l'onde et l'indice optique du matériau constituant l'objet, et le vecteur normal à la surface de l'objet à l'emplacement du pixel.
Abstract:
A system and method for controlling polarisation state determining parameters of a polarised beam of light in an ellipsometer or polarimeter and the like system, so that they are in ranges wherein the sensitivity, of a sample system characterising PSI and DELTA value monitoring detector (DET) used to measure changes in said polarisation state resulting from interaction with a "composite sample system," comprised of a sample system per se. (SS) and a beam polarisation state determining variable retarder, to noise and measurement errors etc. therein), is reduced. This allows determining sample system per se. characterising PSI and DELTA values, from Composite Sample System characterising PSI and DELTA values, by compensating for the presence of components, (VR1) and/or (VR2), added to an ellipsometer or polarimeter and the like system. The arrangement also improves the ability of an ellipsometer or polarimeter and the like system fitted with components (VR1) and/or (VR2) to provide usably accurate and precise sample system characterising PSI and DELTA determining data values, wherein a sample system per se. investigating polarised beam of light is oriented at other than a Principal or Brewster Angle of Incidence thereto, the use of which Angle of Incidence would otherwise be difficult, if not impossible. The arrangement also allows determination of the "Handedness" of a polarised beam of light, and of sample system Jones or Mueller Matrix component values; and provides means for making system components (VR1) and/or (VR2) added to an ellipsometer or polarimeter and the like system, essentially end user transparent when desired, without removal thereof from said ellipsometer or polarimeter and the like system.
Abstract:
An apparatus (10) comprises an optical filter (12), which resolves electromagnetic radiation into a sequence of resolved polarization components, an imaging device (14), having a storage device (16), and a driver (18). The imaging device (14) receives the sequence of resolved polarization components from the optical filter (12) and stores them in the storage device (16). The driver (18), which receives the video synchronization signal, produces a filter synchronization signal which is provided to the optical filter (12) to cause the optical filter (12) to produce the sequence of resolved polarization components so the optical filter (12) is in synchronization with the imaging device (14). This apparatus (10) is used to view the polarization properties of a scene.
Abstract:
A polarization viewer comprising a mechanism (12, 18, 20) for forming a broadview image having a spectral width greater than 2 angstroms and 50° based on polarization information of a scene. The polarization viewer is also comprised of a mechanism (12, 18, 20) for providing polarization information to the forming mechanism. The providing mechanism is in communication with the forming mechanism. In a first embodiment, the providing mechanism includes a camera mechanism in communication with the forming mechanism. The camera mechanism includes a fixed polarizer analyzer (12) disposed such that electromagnetic radiation entering the camera mechanism passes through the polarizer analyzer (12). The providing mechanism can also include a mechanism for steering a polarization plane of the radiation. The steering mechanism is disposed such that radiation passing through the polarizer analyser first passes through the steering mechanism. The steering mechanism preferably includes a first twist crystal (18) and at least a second twist crystal (20) aligned with the first twist crystal such that radiation passing through the first crystal has a first state and a second state.