公开(公告)号：EP0772039A3

公开(公告)日：1997-10-22

申请号：EP96307947.0

申请日：1996-11-01

Applicant: Hewlett-Packard Company

Inventor： Heffner, Brian L. ,  Sorin, Wayne V.

IPC: G01N21/47 ,  G01N21/64

CPC classification number: G01N21/645 ,  G01N2021/6484 ,  G11B7/09 ,  G11B7/1384

Abstract: In an apparatus[100, 200, 400, 500] for applying an optical signal to a surface[104,504] and collecting the light leaving the surface[104,504] in response to the application of the optical signal, the optical signal and the collected light traverse an optical fiber[112] having an end proximate to the surface[104,504] which delivers light to the surface[104,504] with the aid of a lens[102, 509] that couples the optical signal to the surface[104,504], collects the light emitted by the surface[104,504], and couples collected light into the optical fiber[112]. A detector[111,404] measures the intensity of light delivered into the optical fiber[112] and generates a detection signal indicative of the measured intensity as a function of time. A set of actuators[120,220,320] dither the position of the lens[102, 509] relative to the proximate end of the fiber. Each actuator operates at a different dither frequency and moves the lens[102, 509] relative to fiber along a different axis. The average position of the lens[102, 509] relative to the proximate end of the fiber along each axis is adjusted so as to maximize the average power detected at the corresponding dither frequency.

公开(公告)号：EP0553460A3

公开(公告)日：1993-10-27

申请号：EP92121214.8

申请日：1992-12-12

Applicant: HEWLETT-PACKARD COMPANY

Inventor： Heffner, Brian L.

IPC: G01M11/00 ,  G01J4/00

CPC classification number: G01M11/334 ,  G01J4/00 ,  G01M11/336 ,  H04B10/2569

Abstract: An instrument includes a polarized optical source for producing three sequential predetermined states of polarization of a light beam at each of at least two wavelengths, as well as an optical polarization meter for measuring the polarization of a portion of the light beam at each wavelength transmitted by or reflected from an optical network by splitting it into four beams, passing three of the beams through optical elements, measuring the transmitted intensity of all four beams, and calculating Stokes parameters. The three sequential predetermined states of polarization at each wavelength yield three corresponding Jones input vectors at each wavelength, and the Stokes parameters for the responses of the optical network are converted to three Jones output vectors at each wavelength. A Jones matrix for the optical network to within a complex constant is then computed from the Jones input and output vectors at each wavelength. Polarization mode dispersion in the optical network is determined from these matrices.

公开(公告)号：EP0484913A3

公开(公告)日：1992-10-28

申请号：EP91118924.9

申请日：1991-11-06

Applicant: Hewlett-Packard Company

Inventor： Sorin, Wayne V. ,  Heffner, Brian L.

IPC: G01M11/00

CPC classification number: G01M11/3172 ,  G01B9/02002 ,  G01B9/02072 ,  G01B9/0209 ,  G01B2290/45 ,  G01B2290/70 ,  G01M11/3181

Abstract: An optical reflectometer for measuring an optical parameter of a device (12) under test. The reflectometer includes an interferometer having a light source (1) for providing a beam of light, a coupler (3) for dividing the beam of light into a reference signal and a test signal, an optical fiber (5) for applying the test signal to the device (12) and receiving a response signal therefrom. The coupler (3) combines the reference and response signals. The reflectometer also includes a polarization diversity receiver (14) having optical sensors (17v, 17h) responsive to optical signals of differing polarities for receiving the combined reference and response signals and an output circuit (21) for providing an output signal indicative of an optical parameter of the device (12). A polarization controller such as a linear polarizer (9) or a birefringent waveplate (23) controls the polarization of the reference signal to balance the sensor responses. The output signal is substantially independent of any polarization distortion introduced into the response signal by the device under test when the sensor responses have been balanced by the polarization controller.

公开(公告)号：EP0829700A2

公开(公告)日：1998-03-18

申请号：EP97114494.4

申请日：1997-08-21

Applicant: Hewlett-Packard Company

Inventor： Heffner, Brian L. ,  Venkatesh, Shalini ,  Sorin, Wayne V.

IPC: G01B11/06

CPC classification number: G01B11/0675

Abstract: An apparatus[10, 500, 600] and method for measuring the thickness of a film [15, 216, 315, 415] having top and bottom surfaces. The apparatus[10, 500, 600] includes low coherence light source[12] that generates a probe light signal. The film[15, 216, 315, 415] is positioned against a roller[314,460] having a partially reflecting surface that is positioned at a fixed distance from the film[15, 216, 315, 415]. The probe light signal is applied to the film[15, 216, 315, 415] and is then reflected back through the film[15, 216, 315, 415] by the partially reflecting surface. The light leaving the film[15, 216, 315, 415] is collected to form the input to a receiver[18] that determines the time delay between light reflected from the top and bottom surfaces of the film[15, 216, 315, 415]. The receiver output may also be used to determine the thickness of the various layers in a multi-layer film[15, 216, 315, 415].

Abstract translation: 在apparatusÄ10，500，600U和用于测量的膜AE15，216，315的厚度的方法，415Ü具有顶面和底面。 的apparatusÄ10，500，600U包括低相干光sourceÄ12Ü做基因速率的探测光信号。 的filmÄ15，216，315，415Ü抵靠一个rollerÄ314,460Ü具有部分反射面并在距filmÄ15，216，315，415Ü一个固定的距离的位置。 探测光信号被施加到filmÄ15，216，315，和415Ü然后由反射部分反射表面往回通过filmÄ15，216，315，415Ü。 离开filmÄ15，216，315中的光，415Ü被收集，以形成输入到receiverÄ18Ü确实确定性地雷从filmÄ15，216，315，415Ü的顶表面和底表面反射的光之间的时间延迟。 因此，该接收器的输出可被用于确定性的矿井的各个层的厚度在多层filmÄ15，216，315，415Ü。

公开(公告)号：EP0536538B1

公开(公告)日：1997-01-29

申请号：EP92115177.5

申请日：1992-09-04

Applicant: Hewlett-Packard Company

Inventor： Heffner, Brian L.

IPC: G01J4/00 ,  G01J4/04 ,  G01M11/00

CPC classification number: G01M11/00 ,  G01J4/04

公开(公告)号：EP0762078A3

公开(公告)日：1998-01-07

申请号：EP96305828.4

申请日：1996-08-08

Applicant: Hewlett-Packard Company

Inventor： Venkatesh, Shalini ,  Heffner, Brian L. ,  Sorin, Wayne V.

IPC: G01B11/06 ,  G01N21/41

CPC classification number: G01N21/41 ,  G01B11/0675

Abstract: Apparatus (10,100) and a method for measuring the thickness of a film (15) having top and bottom surfaces provides a low coherence light source (12) that generates a probe light signal. The film (15) is positioned between first and second reference reflectors, the first reference reflector being partially reflecting. The probe light signal is applied to the film (15) after passing through the first reference reflector. Part of the portion of the probe light signal leaving the film (15) is reflected back toward the first reference reflector by the second reference reflector. The light exiting through the first reference reflector is collected to form the input to a receiver (18) that determines the time delay between light reflected from the top and bottom surfaces of the film (15) as well as the change in optical path length between said first and second reflector (25,26) resulting from the introduction of said film (15) between said first and second reflector (25,26). In the preferred embodiment the receiver (18) is constructed from an optical autocorrelator or an optical spectrum analyzer that includes circuitry for providing the Fourier transform of the frequency domain spectrum measured from the combined light signal. Embodiments in which only one of the reference reflectors is utilized provide a means for simplifying the output spectrum from the receiver (18) when multi-layer films (15) are utilized.

公开(公告)号：EP0592187B1

公开(公告)日：1996-07-10

申请号：EP93307902.2

申请日：1993-10-05

Applicant: Hewlett-Packard Company

Inventor： Heffner, Brian L.

IPC: G01J4/04

CPC classification number: G01J4/04

公开(公告)号：EP0484913B1

公开(公告)日：1995-04-26

申请号：EP91118924.9

申请日：1991-11-06

Applicant: Hewlett-Packard Company

Inventor： Sorin, Wayne V. ,  Heffner, Brian L.

IPC: G01M11/00

CPC classification number: G01M11/3172 ,  G01B9/02002 ,  G01B9/02072 ,  G01B9/0209 ,  G01B2290/45 ,  G01B2290/70 ,  G01M11/3181

公开(公告)号：EP0536538A3

公开(公告)日：1993-12-15

申请号：EP92115177.5

申请日：1992-09-04

Applicant: Hewlett-Packard Company

Inventor： Heffner, Brian L.

IPC: G01J4/00 ,  G01J4/04 ,  G01M11/00

CPC classification number: G01M11/00 ,  G01J4/04

Abstract: An instrument (8) includes a polarized optical source (9) for producing three sequential predetermined states of polarization of a light beam (ℓ) and an optical polarization meter (10) for measuring the polarization of a portion (Δℓ) of the light beam (ℓ) transmitted by or reflected from an optical network (30,51,52;100) by splitting it into four beams (Δℓa - Δℓd), passing three of the beams (Δℓb - Δℓd) through optical elements, measuring the transmitted intensity of all four beams (Δℓa - Δℓd), and calculating Stokes parameters. The portion (Δℓ) of the light beam (ℓ) enters the optical polarization meter (10) through a single-mode optical fiber (11) that acts as a spatial filter for controlling the position and alignment of the beam with respect to the optical elements (12). The distortion of the light beam polarization caused by this optical fiber is corrected by introducing two different linearly polarized light beams (ℓ₁,ℓ₂) and measuring Stokes parameters which are used to construct a calibration matrix that is inverted and multiplied times measured normalized Stokes parameters of subsequent measurements to yield true Stokes parameters. The three sequential predetermined states of polarization yield three corresponding Jones input vectors, and the Stokes parameters for the responses of the optical network (30,51,52) are converted to three Jones output vectors. A Jones matrix for the optical network (30,51,52) to within a complex constant is then computed from the Jones input and output vectors. Relative polarization sensitivity can be determined from this matrix for the optical network (30,51,52). The relative distortion caused by the optical network (30,51,52) can be corrected by multiplying by the inverse of the matrix during later measurements through the optical network (30,51,52). Additionally, power measurements on the optical network (30,51,52) and a substituted optical through enable absolute determinations and corrections.

公开(公告)号：EP0982705A3

公开(公告)日：2000-10-11

申请号：EP99112851.3

申请日：1999-07-02

Applicant: Hewlett-Packard Company

Inventor： Mertz, Pierre H. ,  Heffner, Brian L.

IPC: G09F13/16

CPC classification number: G09F13/16

Abstract: A display[100] that includes an array[12] of reflective pixels, a linear light source[104]; and a reflector[102]. The reflector[102] includes a cylindrical surface, the axis of the cylindrical surface being parallel to the linear light source[104]. The linear light source[104] is positioned relative to the reflector[102] such that light from the linear light source[104] is reflected by the reflector[102] onto the array[12] of reflective pixels. The reflector[102] is constructed from a material that is partially reflecting. The linear light source[104] preferably includes a plurality of light emitting diodes[106] and an optical diffuser[105]. In a color display[100], the light emitting diodes[106] include diodes having different emission spectra. In one embodiment of the invention, the reflector[102] is constructed from a material that reflects light of a first linear polarization while transmitting light having a linear polarization orthogonal to the first linear polarization. In this embodiment, each pixel in the array[12] of reflective pixels preferably includes a polarization rotating cell that rotates the linear polarization vector of light reflected by the pixel in response to the receipt of an electrical signal by the pixel.

Abstract translation: 包括反射像素阵列[12]的显示器[100]，线性光源[104] 和反射器[102]。 反射器[102]包括圆柱形表面，圆柱形表面的轴线平行于线性光源[104]。 线性光源[104]相对于反射器[102]定位，使得来自线性光源[104]的光被反射器[102]反射到反射像素的阵列[12]上。 反射器[102]由部分反射的材料构成。 线性光源[104]优选包括多个发光二极管[106]和光学扩散器[105]。 在彩色显示器[100]中，发光二极管[106]包括具有不同发射光谱的二极管。 在本发明的一个实施例中，反射器[102]由反射第一线偏振光的材料构成，同时透射具有与第一线偏振正交的线偏振的光。 在该实施例中，反射像素阵列[12]中的每个像素优选地包括偏振旋转单元，其响应于像素接收电信号而旋转由像素反射的光线性偏振矢量。