公开(公告)号：EP3414620B1

公开(公告)日：2023-06-14

申请号：EP17750735.7

申请日：2017-02-09

Inventor： WHITE, Nigel, Thornton, Hopley ,  COLE, Lindsay, John

IPC: G02F1/11 ,  G01J3/447 ,  G01N21/19

公开(公告)号：EP4148416A1

公开(公告)日：2023-03-15

申请号：EP22203419.1

申请日：2016-08-29

Applicant: Apple Inc.

Inventor： ARBORE, Mark Alan ,  SIMON, David I. ,  KANGAS, Miikka M ,  BISHOP, Michael J. ,  HILLENDAHL, James ,  CHEN, Robert

IPC: G01N21/47 ,  G01N21/27 ,  G02B26/04 ,  G02B3/00 ,  G01J3/02 ,  G01J3/32 ,  G01J3/42 ,  G01J3/433 ,  G01J3/447 ,  G01J3/36 ,  G01N21/49 ,  G01N21/21 ,  G01N21/35

Abstract: This relates to systems and methods for measuring a concentration and type of substance in a sample at a sampling interface. The system (1700) includes a light source (1702) configured to output light to a sample (1720);
a first output region (1793) located at an interface of the system and configured to receive a first light from a first location within the sample;
a second output region (1995) located at the interface of the system and configured to receive a second light from a second location within the sample;
a detector (1730); and
an optics unit (1712, 1719, 1723, 1729), comprising:
first optics configured to receive the first light from the first output region and direct the first light from the first output region to the detector; and
second optics configured to receive the second light from the second output region and direct the second light from the second output region to the detector.

公开(公告)号：EP4070054A1

公开(公告)日：2022-10-12

申请号：EP20895563.3

申请日：2020-12-06

Applicant: Purdue Research Foundation

Inventor： JACOB, Zubin ,  BAO, Fanglin ,  WANG, Xueji

IPC: G01J3/28 ,  G01J3/447 ,  G02F1/33 ,  G02F1/35 ,  G06F15/00

公开(公告)号：EP3347687B1

公开(公告)日：2019-07-03

申请号：EP16757191.8

申请日：2016-08-15

Applicant: Robert Bosch GmbH

Inventor： HERRMANN, Ingo ,  HUSNIK, Martin ,  BAUMGART, Eugen ,  HUBER, Christian ,  STEIN, Benedikt

IPC: G01J3/02 ,  G01J3/28 ,  G01J3/453 ,  G01J3/447 ,  G01J3/45

公开(公告)号：EP2663853A1

公开(公告)日：2013-11-20

申请号：EP11811465.1

申请日：2011-12-21

Applicant: Nanometrics Incorporated

Inventor： VAGOS, Pedro ,  ROVIRA, Pablo I.

IPC: G01N21/21 ,  G01N21/23 ,  G01J3/447 ,  G01J4/04

CPC classification number: G01N21/211 ,  G01N21/23

Abstract: An optical metrology device produces a broadband beam of light that is incident on and reflected by a sample and introduces multiple variations in the polarization state of the beam of light induced by an optical chiral element. Using the detected light, the Muller matrix or partial Mueller matrix for the sample is determined, which is then used to determine a characteristic of the sample. For example, simulated spectra for a Mueller matrix for a model is fit to the measured spectra for the Mueller matrix of the sample by adjusting the parameters of the model until an acceptable fit between the simulated spectra and measured spectra from the Mueller matrices is produced. The varied parameters are then used as the sample parameters of interested, which can be reported, such as by storing in memory or displaying.

公开(公告)号：EP2439716A3

公开(公告)日：2012-10-31

申请号：EP11180655.0

申请日：2011-09-09

Applicant: Ricoh Company, Ltd.

Inventor： Xue, Li ,  Hirai, Hideaki

IPC: G08G1/16 ,  G01J4/00 ,  G06K9/20 ,  G01N21/21 ,  G06T5/00 ,  G01J3/453 ,  G01J3/447 ,  G01J9/02 ,  G01J3/28

CPC classification number: G08G1/16 ,  G01J3/0229 ,  G01J3/28 ,  G01J3/447 ,  G01J3/453 ,  G01J9/0246 ,  G01N21/314 ,  G06K9/00798 ,  G06K9/00805 ,  G06K9/00825 ,  G06K9/2018 ,  G06T5/002 ,  G06T5/50 ,  G08G1/165 ,  G08G1/166 ,  G08G1/167

Abstract: An object identification device includes an image capturing device to capture images polarized in different directions for an object; a noise removal unit to remove noise in the polarized images using a noise removing parameter; an index value computing unit to compute an object identification index value for identification-processing areas in the polarized images using noise removed polarized images data; an object identification processing unit that conducts an object identification by determining identification processing areas corresponding to an identification target object based on the object identification index value; an environment information obtaining unit to obtain environment information of the object; an environmental condition determination unit to determine an environmental condition of the object based on the environment information; and a parameter storage unit to store noise removing parameters prepared for mutually exclusive environmental conditions. The noise removal unit reads a noise removing parameter from the parameter storage unit to conduct a noise removing.

公开(公告)号：EP1588133A4

公开(公告)日：2010-09-01

申请号：EP04703873

申请日：2004-01-21

Applicant: SPECRYS LTD

Inventor： SIRAT GABRIEL ,  NEUHAUSER DANIEL ,  WILNER KALMAN ,  VAKNIN DAVID

IPC: G01J3/447 ,  G01N21/21 ,  G01J3/02 ,  G01J3/42

CPC classification number: G01N21/21 ,  G01J3/447

Abstract: Apparatus for analyzing light having at least one wavelength, the apparatus comprising: (a) a light deflector for deflecting the light so as to provide a deflected light beam characterized by at least one wavelength-dependent angle, respectively corresponding to the at least one wavelength of the light; (b) an encoder, capable of encoding the deflected light beam so as to provide an encoded light beam characterized by at least one angle-dependent polarization state, respectively corresponding to the at least one wavelength-dependent angle; and (c) a decoder, for decoding the encoded light beam so as to determine at least one spectral component of the light.

公开(公告)号：EP1630542A4

公开(公告)日：2007-04-11

申请号：EP04734599

申请日：2004-05-24

Applicant: AISIN SEIKI

Inventor： OHTAKE HIDEYUKI ,  YOSHIDA MAKOTO ,  TANAKA KOICHIRO ,  NAGAI MASAYA

IPC: G01J3/42 ,  G01J3/447 ,  G01N21/27 ,  G01N21/35 ,  G01N21/3586 ,  G01N21/552

CPC classification number: G01N21/3581 ,  G01N21/552

Abstract: A reflection type terahertz spectrometer characterized by comprising an incident-side optical path (1) through which terahertz waves are propagated, irradiating means (2) for irradiating a measuring subject article with the terahertz waves propagated through the incident-side optical path (1), an outgoing-side optical path (3) through which terahertz waves sent from the irradiating means (2) are propagated, and a detector (4) for receiving and detecting the terahertz waves propagated through the outgoing-side optical path (3), wherein the irradiating means (2) has at least one planar interface (21) and a refractive index greater than that of a peripheral region contacting the planar interface (21) and is disposed between the incident-side optical path (1) and the outgoing-side optical path (3) such that the terahertz waves propagated through the incident-side optical path (1) to be incident on the planar interface (21) are internally totally reflected thereby, and wherein the measuring subject article is disposed in the peripheral region contacting the planar interface (21) of the irradiating means (2), and the measuring subject article is irradiated with evanescent waves radiated from the planar interface (21) to the peripheral region contacting the planar interface (21) when the terahertz waves are subjected to the internal total reflection at the planar interface (21), thereby performing spectrometry.

公开(公告)号：EP1387161A4

公开(公告)日：2007-03-07

申请号：EP02700687

申请日：2002-02-21

Applicant: CITIZEN WATCH CO LTD

Inventor： MATSUMOTO KENJI

IPC: G01B9/02 ,  G01N21/21 ,  A61B5/00 ,  G01J3/447 ,  G01N21/27 ,  G02B5/18 ,  G02B5/30

CPC classification number: G01N21/21 ,  A61B5/14558

Abstract: An angle-of-rotation measuring device and method, for measuring the concentration of a rotatory-polarizing substance (such as saccharide, amino acid, vitamin) in a sample in a noncontact manner. A coherent light flux is branched into two light fluxes an object beam and a reference beam -, the object beam that has passed through the sample is converted by means of a quarter-wave plate into orthogonal polarization components having a phase difference proportional to the angle of rotation of the sample, and the angle of rotation of the sample is determined from a phase difference between beat signals obtained by interference between the object beam and the reference beam. Alternatively, a coherent light flux incident to and passed through a sample is converted by means of a quarter-wave plate into orthogonal polarization components having a phase difference proportional to the angle of rotation of the sample, the orthogonal polarization components are allowed to interfere with each other by a polarizer, and the angle of rotation of the sample is measured by the phase of a beat signal thus obtained.

公开(公告)号：EP1507137A1

公开(公告)日：2005-02-16

申请号：EP04012448.9

申请日：2004-05-26

Applicant: SICK AG

Inventor： Blöhbaum, Frank

IPC: G01N21/21 ,  G01J4/04 ,  G01J3/447 ,  G02B5/30

CPC classification number: G01N21/211 ,  G01J4/04 ,  G02B5/3058

Abstract: Bei einem Verfahren zur Untersuchung einer Oberfläche oder einer Schicht wird polarisierte optische Strahlung als Beleuchtungsstrahlung auf die Oberfläche bzw. Schicht gestrahlt und es werden in Abhängigkeit von dem Ort auf der Oberfläche bzw. in der Schicht im Wesentlichen gleichzeitig wenigstens eine Polarisationseigenschaft der von der Oberfläche als Messstrahlung zurückgeworfenen bzw. von der Schicht als Messstrahlung abgegebenen optischen Strahlung erfasst. Eine Vorrichtung (10) zur Untersuchung einer Oberfläche (12) oder einer Schicht umfasst eine Quelle (16) für polarisierte optische Strahlung zur Abgabe von Beleuchtungsstrahlung (18) auf die Oberfläche (12) oder Schicht und eine Detektionseinrichtung (22,24,28,30) zur ortsaufgelösten Erfassung wenigstens einer Polarisationseigenschaft der von der Oberfläche (12) als Messstrahlung (36) zurückgeworfenen bzw. von der Schicht als Messstrahlung (36) abgegebenen optischen Strahlung.
Die Detektions einricht (22,24,28,30) umfasst eine Kamera (22), eine Auswerteeinrichtung (30), ein Feld (24) von Photodetektionselementen und eine Polarisations filter anordnung (28). Die Anordnung (28) umfasst matrix förmig angeordnete Bereiche mit zueinander verschiedenen Polarisationsrichtungen.

Abstract translation: 用于检查表面（12）或其中偏振视觉辐射（18）的层的方法，用来照亮来自表面上的位置（38）的表面或层和测量辐射（36）反射或散射的始发被测量以确定矿表面 偏振特性。 因此独立权利要求中包括了以下内容： - 用于检查表面和偏振特性（a）中的装置; （B），用于测量的光辐射与光电检测器元件在其上的偏振滤光器，在一个金属的形式特别喜欢的一个场传感器被施加。