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    POLARIZATION EVALUATION DEVICE
    1.
    发明公开
    POLARIZATION EVALUATION DEVICE 审中-公开

    公开(公告)号：EP4492020A1

    公开(公告)日：2025-01-15

    申请号：EP22931029.7

    申请日：2022-12-06

    Applicant: Toray Industries, Inc.

    Inventor： KUMAGAI, Yukihisa ,  SUGIHARA, Hiroki ,  TAKEMOTO, Kyoya

    IPC: G01J4/04 ,  G01N21/21

    Abstract: In order to provide a polarization evaluation device capable of performing polarization evaluation excluding the polarization characteristics of an optical system, in the present invention,
    there is provided a polarization evaluation device including:
    an optical system including an illumination unit that irradiates an observation target with illumination light for observation, and an imaging unit that acquires polarization images in a plurality of specific directions from reflected light that is the illumination light reflected by the observation target; and
    an image processing unit that outputs a result of evaluating polarization characteristic of the observation target from the polarization images in the plurality of specific directions acquired by the imaging unit,
    in which
    the image processing unit includes:
    a correction coefficient calculation unit that generates a correction coefficient for removing a polarization noise based on polarization characteristics of the optical system excluding the observation target;
    a correction coefficient storage unit that stores the correction coefficient; and
    a polarization characteristic evaluation unit that performs processing that involves creating corrected polarization images produced from the polarization images in the plurality of specific directions by removing the polarization noise on the basis of the correction coefficient and outputting a result of evaluating the polarization characteristics of the observation target from the corrected polarization images.

    CIRCULARLY POLARIZED LIGHT ILLUMINATOR, ANALYSIS DEVICE, AND MICROSCOPE
    4.
    发明公开
    CIRCULARLY POLARIZED LIGHT ILLUMINATOR, ANALYSIS DEVICE, AND MICROSCOPE 审中-公开

    公开(公告)号：EP4300059A1

    公开(公告)日：2024-01-03

    申请号：EP22758118.8

    申请日：2022-02-09

    Applicant: Inter-University Research Institute Corporation National Institutes of Natural Sciences

    Inventor： OKAMOTO, Hiromi ,  NARUSHIMA, Tetsuya

    IPC: G01J4/04 ,  G01N21/19 ,  G02B21/00 ,  G02B21/06 ,  G02B21/14

    Abstract: Provided are a circularly polarized light illuminator capable of measuring circular dichroism at high speed and high sensitivity, and an analysis device and a microscope using same. An analysis device and a microscope are constructed using a circularly polarized light illuminator including a light source 20 that emits pulsed light, a polarized light dividing unit that divides the pulsed light L1 emitted from the light source 20 or linearly polarized light L2 extracted from the pulsed light L1 emitted from the light source 20 into an x-axis direction polarized light component L2x and a y-axis direction polarized light component L2y, a optical delay unit 13 that delays one of a pulse Px of the divided x-axis direction polarized light component and a pulse Py of the divided y-axis direction polarized light component in relation to the other, a polarized light combining unit that combines the X-polarized light pulsed beam L2x and the Y-polarized light pulsed beam L2y emitted from the optical delay unit 13 coaxially to generate a linearly polarized beam L3 having a modulation in which the X-polarized light pulse Px and the Y-polarized light pulse Py repeat alternately, and a polarized light conversion unit that converts the linearly polarized light emitted from the polarized light synthesis unit into circularly polarized light.

    POLARIZATION DEPENDENT LOSS MEASUREMENT
    8.
    发明公开
    POLARIZATION DEPENDENT LOSS MEASUREMENT 审中-公开

    公开(公告)号：EP3910310A1

    公开(公告)日：2021-11-17

    申请号：EP21172895.1

    申请日：2021-05-07

    Applicant: EXFO Optics, SAS

    Inventor： CYR, Normand ,  RUCHET, Bernard

    IPC: G01M11/00 ,  G01J4/04

    Abstract: There is provided a method for measuring the PDL of a DUT as a function of the optical frequency v within a spectral range, which uses a single wavelength scan over which the input-SOP varies in a continuous manner. The power transmission through the DUT, curve T(v), is measured during the scan and the PDL is derived from the sideband components of the power transmission curve T(v) that results from the continuously varying input-SOP. More specifically, the Discrete Fourier Transform (DFT) of the power transmission curve T(v) is calculated, wherein the DFT shows at least two sidebands. At least two sidebands are extracted and their inverse DFT calculated individually to obtain complex transmissions

    where J is the number of sidebands on one side. The response vector |m(v)〉 of the DUT is derived from the complex transmissions (v) and a matrix determined by the continuous trajectory of the SOP of the input test lightwave; and the PDL of the DUT as a function of v (PDL curve) is derived therefrom.

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