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    CIRCULARLY POLARIZED LIGHT ILLUMINATOR, ANALYSIS DEVICE, AND MICROSCOPE
    2.
    发明公开
    CIRCULARLY POLARIZED LIGHT ILLUMINATOR, ANALYSIS DEVICE, AND MICROSCOPE 审中-公开

    公开(公告)号：EP4300059A1

    公开(公告)日：2024-01-03

    申请号：EP22758118.8

    申请日：2022-02-09

    申请人： Inter-University Research Institute Corporation National Institutes of Natural Sciences

    发明人： OKAMOTO, Hiromi ,  NARUSHIMA, Tetsuya

    IPC分类号： G01J4/04 ,  G01N21/19 ,  G02B21/00 ,  G02B21/06 ,  G02B21/14

    摘要： Provided are a circularly polarized light illuminator capable of measuring circular dichroism at high speed and high sensitivity, and an analysis device and a microscope using same. An analysis device and a microscope are constructed using a circularly polarized light illuminator including a light source 20 that emits pulsed light, a polarized light dividing unit that divides the pulsed light L1 emitted from the light source 20 or linearly polarized light L2 extracted from the pulsed light L1 emitted from the light source 20 into an x-axis direction polarized light component L2x and a y-axis direction polarized light component L2y, a optical delay unit 13 that delays one of a pulse Px of the divided x-axis direction polarized light component and a pulse Py of the divided y-axis direction polarized light component in relation to the other, a polarized light combining unit that combines the X-polarized light pulsed beam L2x and the Y-polarized light pulsed beam L2y emitted from the optical delay unit 13 coaxially to generate a linearly polarized beam L3 having a modulation in which the X-polarized light pulse Px and the Y-polarized light pulse Py repeat alternately, and a polarized light conversion unit that converts the linearly polarized light emitted from the polarized light synthesis unit into circularly polarized light.

    POLARIZATION DEPENDENT LOSS MEASUREMENT
    6.
    发明公开
    POLARIZATION DEPENDENT LOSS MEASUREMENT 审中-公开

    公开(公告)号：EP3910310A1

    公开(公告)日：2021-11-17

    申请号：EP21172895.1

    申请日：2021-05-07

    申请人： EXFO Optics, SAS

    发明人： CYR, Normand ,  RUCHET, Bernard

    IPC分类号： G01M11/00 ,  G01J4/04

    摘要： There is provided a method for measuring the PDL of a DUT as a function of the optical frequency v within a spectral range, which uses a single wavelength scan over which the input-SOP varies in a continuous manner. The power transmission through the DUT, curve T(v), is measured during the scan and the PDL is derived from the sideband components of the power transmission curve T(v) that results from the continuously varying input-SOP. More specifically, the Discrete Fourier Transform (DFT) of the power transmission curve T(v) is calculated, wherein the DFT shows at least two sidebands. At least two sidebands are extracted and their inverse DFT calculated individually to obtain complex transmissions

    where J is the number of sidebands on one side. The response vector |m(v)〉 of the DUT is derived from the complex transmissions (v) and a matrix determined by the continuous trajectory of the SOP of the input test lightwave; and the PDL of the DUT as a function of v (PDL curve) is derived therefrom.