QUASI-STATISCHE AUSLENKUNGSVORRICHTUNG FÜR SPEKTROMETER
    31.
    发明授权
    QUASI-STATISCHE AUSLENKUNGSVORRICHTUNG FÜR SPEKTROMETER 有权
    准静态AUSLENKUNGSVORRICHTUNG FOR谱仪

    公开(公告)号:EP1474666B1

    公开(公告)日:2007-08-08

    申请号:EP02701275.6

    申请日:2002-02-13

    CPC classification number: G01J3/06

    Abstract: The invention relates to a spectrometer, which comprises a suspension mechanism (3) for its dispersive element (2), said suspension element pretensioning the spectrometer in an idle position, in addition to a deflecting device, which retains the dispersive element (2) in a deflected position, in such a way that a balance of forces occurs between the retaining force and the pretensioning force. This permits the dispersive element (2) to constantly return to the position defined by the retaining force after impacts or vibrations. An inventive spectrometer therefore comprises a dispersive element (2) and a suspension mechanism (3) for bearing the dispersive element (2) and for pretensioning the latter in an idle position using a pretensioning force, if the dispersive element (2) is in a deflected position. A control device (7) controls a retaining device (6a, 6b), to vary the deflected position, so that different spectral components can be recorded by a detector (9) of the spectrometer.

    INTERFERENCE FILTER TRANSMISSION WAVELENGTH SCANNING PHOTOMETER
    32.
    发明公开
    INTERFERENCE FILTER TRANSMISSION WAVELENGTH SCANNING PHOTOMETER 有权
    WELLENLÄNGENABTASTENDES光度计传输干扰滤波器

    公开(公告)号:EP1184662A4

    公开(公告)日:2004-09-08

    申请号:EP01906343

    申请日:2001-02-27

    Applicant: WATANABE ATSUO

    Inventor: WATANABE ATSUO

    CPC classification number: G01J3/06 G01J3/12 G01J3/26 G01N21/31 G01N2021/317

    Abstract: An interference filter transmission wavelength scanning photometer wherein the angle of inclination of an interference filter (3) is periodically varied, the wavelength of the light to be transmitted is modulated with the periodical variation centered at the maximum absorption wavelength of the component to be measured, the variation of the intensity of the light transmitted through a sample is extracted by an infrared sensor (11) as an electrical signal, the time between the rise and fall zero cross points of the AC component of the electrical signal is determined by a microprocessor (16), the ratio (full period - 2 x half period)/(full period) is calculated from the full and half periods determined from the determined time, and the concentration of the component to be measured is determined from the variation of the result of the calculation of the ratio, thereby quantitatively determining the component without being influenced by the disturbance coexistent components.

    Spectrometer
    34.
    发明公开
    Spectrometer 有权
    光谱仪

    公开(公告)号:EP1371957A1

    公开(公告)日:2003-12-17

    申请号:EP02291455.0

    申请日:2002-06-11

    Inventor: Ukon, Juichiro

    CPC classification number: G01J3/28 G01J3/0243 G01J3/06 G01J2003/2866

    Abstract: The present invention concerns a spectrometer comprising means for producing a parallel beam from a light source whose spectrum is to be measured and directing it to an orientable grating (10) which produces a diffracted beam, means for focusing said diffracted beam to a detector (18) which measures the power of a selected line of the spectrum (1), said means comprising a reflector (12), and means for measuring the wavelength of the selected line.
    The means for measuring the wavelength comprise a reference light source producing a reference spectrum (3), comparison means for comparing the wavelength of the measured reference spectrum (1) with the stored reference spectrum (3), means for rotating the grating (10) providing a coarse positioning of the diffracted beam relatively to the detector (18) and measuring the grating position, and means for rotating the reflector (12) providing a fine positioning of the diffracted beam relatively to the detector (18) and measuring the reflector (12) position.

    Abstract translation: 本发明涉及一种光谱仪,包括用于从光源产生平行光束的装置,其光谱将被测量并将其引导到产生衍射光束的可定向光栅(10),用于将所述衍射光束聚焦到检测器(18 ),其测量所述光谱(1)的选定行的功率,所述装置包括反射器(12),以及用于测量所选择的线的波长的装置。 用于测量波长的装置包括产生参考光谱的参考光源(3),用于将测量的参考光谱(1)的波长与存储的参考光谱(3)进行比较的比较装置, 光栅(10)相对于检测器(18)提供衍射光束的粗略定位并测量光栅位置,以及用于旋转反射器(12)的装置,其提供相对于检测器(18)的衍射光束的精细定位,以及 测量反射器(12)的位置。

    Wavelength measurement apparatus
    36.
    发明公开
    Wavelength measurement apparatus 审中-公开
    Vorrichtung zurWellenlängenmessung

    公开(公告)号:EP1233255A1

    公开(公告)日:2002-08-21

    申请号:EP02003576.2

    申请日:2002-02-15

    Inventor: Funakawa, Seiji

    CPC classification number: G01J3/06

    Abstract: Light under measurement whose wavelength is continuously swept is incident on fiber-opticEtalon. The fiber-opticEtalon transmits the light under measurement each time the wavelength of the light under measurement satisfies specific conditions. A PD detects the transmitted light of the fiber-optic Etalon and outputs the intensity of the light under measurement. A counter counts the number of peaks of the output of the PD. A CPU calculates the wavelength of the light under measurement based on the count value of the counter.

    Abstract translation: 波长不断扫描的测量光入射到光纤电缆上。 每次测量光的波长满足特定条件时,光纤电子传输测量光。 PD检测光纤Etalon的透射光,并输出测量光的强度。 计数器计数PD输出的峰值数。 CPU根据计数器的计数值计算被测光的波长。

    Apparatus and method for driving diffraction gratings
    37.
    发明公开
    Apparatus and method for driving diffraction gratings 失效
    方法和装置的衍射光栅的驱动

    公开(公告)号:EP0810424A3

    公开(公告)日:1998-04-29

    申请号:EP97303718.7

    申请日:1997-05-30

    CPC classification number: G01J3/06

    Abstract: A grating drive apparatus (100) for use in a multiple-grating spectrometer (500) is provided. The spectrometer has an entrance slit (521), an exit port (550), an optical path (525) between the entrance slit and the exit port, and a plurality of diffraction gratings (237-239). Each of the gratings is rotatable about a respective preferred axis for selecting a wavelength during spectrometer operation. The grating drive apparatus includes a turret (200) having a plurality of gratings mounted on it, a mechanical stop assembly (300), and a drive assembly (400). The drive assembly causes the turret to engage the stop assembly to rotate the turret and select a grating. The drive assembly also rotates the selected grating to select an operational wavelength.

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