公开(公告)号：EP4428507A1

公开(公告)日：2024-09-11

申请号：EP24161950.1

申请日：2024-03-07

Applicant: Seiko Epson Corporation

Inventor： ITO, Masaki ,  TOKUDA, Takeshi

IPC: G01J3/06 ,  G01J3/50 ,  H04N1/04 ,  H04N1/10

CPC classification number: G01J3/06 ,  G01J2003/06220130101 ,  G01J3/50 ,  H04N1/04 ,  H04N1/1013 ,  H04N1/1026

Abstract: A color measurement apparatus to which a colorimeter that measures a color of a color measurement target is configured to be attached, includes a support base of the color measurement target, a carriage that supports the colorimeter, a gantry that supports the carriage, a first scanning mechanism that causes the carriage to perform scanning in a first direction on the support base, and a second scanning mechanism that causes the gantry to perform scanning in a second direction, in which the first scanning mechanism includes a first motor that generates a driving force for causing the carriage to perform scanning in the first direction, and a first transmission mechanism portion that transmits the driving force from the first motor to the carriage, and the first motor overlaps the gantry in a third direction.

公开(公告)号：EP3198689A4

公开(公告)日：2018-05-23

申请号：EP15845489

申请日：2015-09-23

Applicant: HEPTAGON MICRO OPTICS PTE LTD

Inventor： RIEL PETER ,  ROENTGEN PETER

IPC: H01S3/091 ,  G01J3/06 ,  G01J3/10 ,  G01J3/26 ,  H01S3/094 ,  H01S3/16 ,  H01S5/00 ,  H01S5/028 ,  H01S5/04 ,  H01S5/10 ,  H01S5/183 ,  H01S5/30 ,  H01S5/323 ,  H01S5/343 ,  H01S5/40

CPC classification number: G01J3/10 ,  G01J3/06 ,  G01J3/108 ,  G01J3/26 ,  H01S3/094096 ,  H01S5/0071 ,  H01S5/0287 ,  H01S5/041 ,  H01S5/1096 ,  H01S5/183 ,  H01S5/32375 ,  H01S5/34306 ,  H01S5/34313 ,  H01S5/34326 ,  H01S5/3438 ,  H01S5/4043 ,  H01S5/4087

Abstract: The present disclosure describes broadband optical emission sources that include a stack of semiconductor layers, wherein each of the semiconductor layers is operable to emit light of a different respective wavelength; a light source operable to provide optical pumping for stimulated photon emission from the stack; wherein the semiconductor layers are disposed sequentially in the stack such that a first one of the semiconductor layers is closest to the light source and a last one of the semiconductor layers is furthest from the light source, and wherein each particular one of the semiconductor layers is at least partially transparent to the light generated by the other semiconductor layers that are closer to the light source than the particular semiconductor layer. The disclosure also describes various spectrometers that include a broadband optical emission device, and optionally include a tuneable wavelength filter operable to allow a selected wavelength or narrow range of wavelengths to pass through.

公开(公告)号：EP3209983A2

公开(公告)日：2017-08-30

申请号：EP15853575.7

申请日：2015-10-22

Applicant: Verifood Ltd.

Inventor： GOLDRING, Damian ,  SHARON, Dror ,  BRODETZKI, Guy ,  ROSEN, Sagee ,  KEILAF, Omer ,  KINROT, Uri ,  NIR, Ittai ,  WAISBERG, Nitzan ,  RACHMAN, Ofer ,  CARMI, Assaf

IPC: G01J3/00 ,  G01J3/06 ,  G01J3/10

CPC classification number: G01J3/0291 ,  G01J3/0205 ,  G01J3/0208 ,  G01J3/0216 ,  G01J3/0256 ,  G01J3/0262 ,  G01J3/0264 ,  G01J3/027 ,  G01J3/0272 ,  G01J3/0283 ,  G01J3/0286 ,  G01J3/0297 ,  G01J3/06 ,  G01J3/10 ,  G01J3/26 ,  G01J3/2823 ,  G01J3/32 ,  G01J3/36 ,  G01J2003/2826

Abstract: A protective sheath having a closed end and an open end is sized to receive a hand held spectrometer. The spectrometer can be placed in the sheath to calibrate the spectrometer and to measure samples. In a calibration orientation, an optical head of the spectrometer can be oriented toward the closed end of the sheath where a calibration material is located. In a measurement orientation, the optical head of the spectrometer can be oriented toward the open end of the sheath in order to measure a sample. To change the orientation, the spectrometer can be removed from the sheath container and placed in the sheath container with the calibration orientation or the measurement orientation. Accessory container covers can be provided and placed on the open end of the sheath with samples placed therein in order to provide improved measurements.

Abstract translation: 具有封闭端和开放端的保护套的尺寸被设定为容纳手持式光谱仪。 可以将光谱仪放在护套中以校准光谱仪并测量样品。 在校准方向上，光谱仪的光学头可以朝向校准材料所在的鞘的封闭端定向。 在测量方向上，光谱仪的光学头可以朝向护套的开口端定向以测量样品。 为了改变方向，光谱仪可以从护套容器中取出并且放置在具有校准方向或测量方向的护套容器中。 可以提供附件容器盖并将其放置在护套的开口端，其中放置有样本以提供改进的测量。

公开(公告)号：EP2351169A4

公开(公告)日：2017-08-30

申请号：EP09822830

申请日：2009-10-24

Applicant: CYMER LLC

Inventor： FIGUEROA EFRAIN ,  PARTLO WILLIAM N ,  ALGOTS JOHN MARTIN

IPC: H01S3/10 ,  G01J3/02 ,  G01J3/06 ,  G01J3/12 ,  G01J3/14 ,  G01J3/18 ,  G02B5/18 ,  H01S3/08 ,  H01S3/1055 ,  H01S3/106

CPC classification number: H01S3/08009 ,  G01J3/02 ,  G01J3/0237 ,  G01J3/027 ,  G01J3/06 ,  G01J3/14 ,  G01J3/18 ,  G01J2003/1208 ,  G02B5/1828 ,  H01S3/08004 ,  H01S3/1055 ,  H01S3/1067

Abstract: The bandwidth selection mechanism includes a first actuator mounted on a second face of a dispersive optical element, the second face being opposite from a reflective face, the first actuator having a first end coupled to a first end block and a second end coupled to a second end block, the first actuator being operative to apply equal and opposite forces to the first end block and the second end block to bend the body of the dispersive optical element along the longitudinal axis of the body and in a first direction normal to the reflective face of the dispersive optical element. The bandwidth selection mechanism also includes a second actuator being operative to apply equal and opposite forces to bend the body along the longitudinal axis of the body, in a second direction perpendicular to the reflective face of the dispersive optical element.

Abstract translation: 带宽选择机构包括安装在色散光学元件的第二面上的第一致动器，第二面与反射面相对，第一致动器具有耦合到第一端块的第一端和耦合到第二端的第二端 所述第一致动器可操作以将相等且相反的力施加到所述第一端块和所述第二端块上，以使所述色散光学元件的所述主体沿所述主体的所述纵向轴线弯曲，并沿垂直于所述反射面的第一方向弯曲 的色散光学元件。 带宽选择机构还包括第二致动器，第二致动器可操作以在垂直于色散光学元件的反射面的第二方向上施加相等且相反的力以沿着主体的纵向轴线弯曲主体。

公开(公告)号：EP3105559A1

公开(公告)日：2016-12-21

申请号：EP15719114.9

申请日：2015-04-16

Applicant: Raytheon Company

Inventor： ROBINSON, Ian S. ,  BLOOMER, John D. ,  FLANDERS, Bradley

IPC: G01J3/45 ,  G01J3/453

CPC classification number: G01J3/4535 ,  G01J3/0202 ,  G01J3/06 ,  G01J3/45 ,  G01J2003/4538

Abstract: Interferometric transform spectrometer (ITS) systems and methods of operation thereof. In one example, an ITS system includes a Michelson interferometer that introduces a varying optical path length difference (OPD) between its two arms so as to produce an interferogram, a detector that receives and samples the interferogram, and a scan controller coupled to the detector and to Michelson interferometer. The scan controller controls the Michelson interferometer to vary the OPD in discrete steps such that the detector provides M samples of the interferogram for each of two scan segments. In the first scan segment, the M samples have a uniform or non-uniform sample spacing and the OPD has a first maximum value. In the second scan segment, the M samples have an incrementally increasing sample spacing and the OPD has a second maximum value that is at least twice the first maximum value.

公开(公告)号：EP3101412A1

公开(公告)日：2016-12-07

申请号：EP15170743.7

申请日：2015-06-04

Applicant: rascope AG

Inventor： Schneider, Urs

IPC: G01N21/64 ,  G01N21/65 ,  G01N21/94

CPC classification number: G01N21/65 ,  G01J3/0218 ,  G01J3/0272 ,  G01J3/06 ,  G01J3/44 ,  G01N21/6408 ,  G01N21/6456 ,  G01N21/6486 ,  G01N21/94 ,  G01N2021/1734 ,  G01N2021/1738 ,  G01N2021/8845

Abstract: The invention relates to an apparatus for analyzing a surface area of an object, comprising: a laser device (10) configured to emit monochromatic incident light (101) of a first wavelength (λ 1 ) as well as optionally a monochromatic incident light (102) of a second wavelength (λ 2 ) that differs from the first wavelength (λ 1 ), a first deflection means (20) configured to deflect said incident light (101, 102) onto a point (P ij (x i , y j )) of a surface area (A) of an object that is to be analyzed so that scattered light (104) is generated at said point (P ij (x i , y j )), wherein said deflection means (20) is further configured to deflect said incident light (101, 102) such that said surface area (A) is scanned in a pointwise fashion by said incident light (101, 102), a first sensor means (40) configured to detect said scattered light (104) and to provide from said detected scattered light (104) a scatter data set (S ij (λ k )) for the respective point (P ij (x i , y j )), wherein the respective scatter data set (S ij (λ k )) comprises intensities of the detected scattered light (104) for different wave numbers, and a processing unit (50) for processing and/or analyzing said data sets. Further, the invention relates to a method for analyzing a surface area of an object.

Abstract translation: 本发明涉及到用于分析的物体的表面区域，包括：配置成发射第一波长的单色入射光（101）（»1）以及任选的单色入射光的激光装置（10）（102 ）的第二波长的（“2）的确不同于第一波长（»1），被配置为到一个点（P IJ偏转所述入射光（101，102）第一偏转装置（20）（XI，YI）） 的物体的表面面积（A）的所做的是要被分析为没有散射光（104）在所述点（P IJ（XI，YI））产生的，worin所述偏转装置（20）进一步被配置为偏转所述 入射光（101，102）求在于所述表面面积（A）在由所述入射光（101，102），被配置为检测所述散射光（104）和以提供第一传感器装置（40）逐点的方式被扫描 从散射光（104），用于所述respectivement点散射的数据集（S IJ（“k））的（P IJ（XI，YI））所述检测到的磨片 纯粹的respectivement散射数据集（S IJ（“K））包括用于不同波数所检测到的散射光（104）的强度，以及用于处理和/或分析的处理单元（50），所述数据集。 此外，本发明涉及一种用于分析对象的表面区域的方法。

公开(公告)号：EP2295942B1

公开(公告)日：2016-08-10

申请号：EP10251585.5

申请日：2010-09-13

Applicant: Ricoh Company Ltd.

Inventor： Shimbo, Kohei ,  Seo, Manabu ,  Kamijo, Naohiro

IPC: G01J3/02 ,  G01J3/06 ,  G01J3/18 ,  G01J3/28 ,  G01J3/50 ,  H04N1/028

CPC classification number: G01J3/50 ,  G01J3/02 ,  G01J3/0208 ,  G01J3/0229 ,  G01J3/06 ,  G01J3/18 ,  G01J3/2803 ,  G01J3/2823 ,  G02B3/0087 ,  G02B13/22 ,  G02B27/0025

公开(公告)号：EP3029440A1

公开(公告)日：2016-06-08

申请号：EP15202700.9

申请日：2007-12-21

Applicant: RIC Investments, LLC.

Inventor： RUSSELL, James, T.

IPC: G01J5/02 ,  G01J3/40 ,  G01J3/18 ,  G02B7/182 ,  H02K33/00

CPC classification number: G01J3/18 ,  G01J3/02 ,  G01J3/0208 ,  G01J3/021 ,  G01J3/0256 ,  G01J3/0291 ,  G01J3/06 ,  G01J3/36 ,  G01N21/3504 ,  G01N2021/3133 ,  G01N2021/317 ,  G01N2021/3185 ,  G02B26/0841 ,  G02B26/106 ,  H02K33/06

Abstract: A spectrometer is disclosed, which comprises a diffraction grating (204); and a resonant scanner drive system (200) comprising:
a taut band (202) providing a rotational axis for the diffraction grating (204), wherein the diffraction grating (204) is fastened at a first side of the taut band (202); a permanent magnet (206) fastened to a second side of the taut band (202); and a first and a second spacer (208), wherein the first spacer is provided between the diffraction grating (204) and the taut band (202), wherein the second spacer is provided between the permanent magnet (206) and the taut band (202).

Abstract translation: 公开了一种光谱仪，其包括衍射光栅（204）; 以及谐振扫描器驱动系统（200），包括：提供所述衍射光栅（204）的旋转轴线的拉紧带（202），其中所述衍射光栅（204）紧固在拉紧带（202）的第一侧; 固定在拉紧带（202）的第二侧的永磁体（206）; 以及第一和第二间隔件（208），其中所述第一间隔件设置在所述衍射光栅（204）和拉紧带（202）之间，其中所述第二间隔件设置在所述永磁体（206）和拉紧带 202）。

公开(公告)号：EP3004841A1

公开(公告)日：2016-04-13

申请号：EP14804707.9

申请日：2014-05-21

Applicant: Canon Kabushiki Kaisha

Inventor： KYOGAKU, Masafumi

IPC: G01N21/27 ,  G01N21/65

CPC classification number: G01J3/4412 ,  G01J3/06 ,  G01N21/3151 ,  G01N21/65 ,  G01N2021/653 ,  G02B21/002

Abstract: A spectral microscopy device includes a spectral detecting unit including a light source that is capable of controlling an output wavelength, a microscope section that is provided with an observation area that is illuminated with light output from the light source, and a signal detector that detects light from the observation area as spectral data; a moving unit configured to move the observation area; and a controller that performs a control operation to allow the spectral detecting unit and the moving unit to move in response to each other. The spectral microscopy device is controlled so that switching between different measurement conditions is performed at an observation area movement time in which the observation area is moved by the moving unit and measurement is performed and at an observation area movement stoppage time in which the observation area is fixed and measurement is performed.

Abstract translation: 本发明提供一种光谱显微镜装置，该光谱显微镜装置具备：光谱检测部，其具有能够控制输出波长的光源;显微镜部，其具备被从光源射出的光照射的观察区域;以及信号检测部， 从观测区域获取光谱数据; 移动单元，被配置为移动观察区域; 以及控制器，执行控制操作以允许频谱检测单元和移动单元响应于彼此而移动。 对光谱显微镜装置进行控制，使得在通过移动单元移动观察区域并进行测量的观察区域移动时间和在观察区域移动停止时间的观察区域移动停止时间执行不同测量条件之间的切换 固定并进行测量。

公开(公告)号：EP2975369A1

公开(公告)日：2016-01-20

申请号：EP15166308.5

申请日：2015-05-05

Applicant: Tecan Trading AG

Inventor： Niggl, Lutz ,  Steinbacher, Andreas

IPC: G01J3/06 ,  G01J3/18

CPC classification number: G01J3/18 ,  G01J3/06 ,  G01J2003/062 ,  G01N21/255 ,  G01N21/64 ,  G01N2201/0635

Abstract: Ein Monochromator (1) umfasst zumindest ein gegenüber einfallendem Licht einer Lichtquelle (3) drehbar ausgebildetes optisches Gitter (2); eine Antriebs-Einheit (8) zum Drehen des optischen Gitters (2) mittels einer mit diesem verbundenen Antriebs-Stange (7) um eine Längsachse (9); und eine Steuereinheit (10), welche die Antriebs-Einheit (8) und damit die Drehung des optischen Gitters (2) steuert. Die Antriebs-Einheit (8) des Monochromators (1) umfasst zudem ein erstes Dämpfungs-Element (11) mit zumindest einer elektrisch leitfähigen Fläche und ein zweites Dämpfungs-Element (12), das zumindest ein Magnetfeld mit einer magnetischen Achse (14) bereitstellt, welche die elektrisch leitfähige Fläche durchdringt. Dabei ist das erste oder zweite Dämpfungs-Element (11,12) mit der Antriebs-Stange (7) fest verbunden und mit dieser um deren Längsachse (9) drehbar in Relation zum zweiten oder ersten Dämpfungs-Element (12,11) ausgebildet.

Abstract translation: 单色仪具有至少一个相对于光源的入射光可旋转的光栅;驱动单元，用于通过围绕纵轴的连接的驱动杆旋转光栅;以及控制单元，用于控制驱动单元和 从而光栅的旋转。 驱动单元还具有带有至少一个导电表面的第一阻尼元件和提供至少一个具有穿过导电表面的磁轴的磁场的第二阻尼元件。 第一和第二阻尼元件中的一个固定到驱动杆上，并且与驱动杆一起围绕其纵向轴线相对于第二或第一阻尼元件中的另一个可旋转。