公开(公告)号：EP0411250A1

公开(公告)日：1991-02-06

申请号：EP90107211.6

申请日：1990-04-14

Applicant: Deutsche Aerospace AG

Inventor： Posselt, Winfried ,  Kunkel, Bernd ,  Herbig, Henning ,  Blechinger, Fritz

IPC: G01J3/28 ,  G01J3/45

CPC classification number: G01J3/06 ,  G01J3/4532

Abstract: Die Erfindung bezieht sich auf ein Zweistrahl-Interferometer zur Fou­rierspektroskopie, Insbesondere zur Emissionsmessung von Spurengas-Kon­zentrationen an Bord von Raumfahrzeugen, bei dem die optische Weglängen­differenz durch einen gleichförmigen rotierenden Exzenter (11,12), der über ein Gestänge (13,14) die lineare Auslenkung von Retroreflektoren (17,18) bewirkt, ermittelt wird. Ein terrestrischer Einsatz, etwa zur Emissionsmessung von Schorn­steinen, wie auch ein Einsatz in Flugzeugen sind ebenfalls möglich. Ein Ausführungsbeispiel ist erläutert und in den Figuren der Zeichnung skizziert.

Abstract translation: 本发明涉及一种用于傅立叶光谱的双光束干涉仪，特别是用于宇宙飞船上的痕量气体浓度的发射测量，其中光学波长差异由一致的旋转偏心（11,12）确定，其产生线性偏转 后向反射器（17,18）经由连杆（13,14）。 地面用途，例如用于测量烟囱的排放，以及在飞机上的使用同样是可能的。 在附图中解释并示出了示例性实施例。

公开(公告)号：EP0320530A1

公开(公告)日：1989-06-21

申请号：EP87118796.9

申请日：1987-12-18

Applicant: Hewlett-Packard GmbH

Inventor： Hadbawnik, Detlev ,  Kraiczek, Karsten

IPC: G01J3/28

CPC classification number: G01J3/06 ,  G01J3/02 ,  G01J3/021 ,  G01J3/1838 ,  G01J3/2803 ,  G01J2003/062 ,  G01J2003/064 ,  G01J2003/067 ,  G01N21/31 ,  G01N30/74

Abstract: A photodiode array spectrometer for determining the spectral composi­tion of a polychromatic beam of radiation comprises diffraction means (10) which generate from the polychromatic beam a diffracted beam with a plurality of spatially separated diffracted rays of different wavelengths (λ₁ ,λ₂ ,λ₃ ) . A photodiode array (11) receives the dif­fracted beam whereby each photodiode intercepts a different spectral portion of the beam. A rotatable transparent plate (8) is provided in the beam path in front of the diffraction means (10) which, due to refraction of the beam upon entering and leaving the plate (8), per­mits to vary the direction of the beam impinging on the diffraction means (10) and therefore the direction of the diffracted beam in small steps depending on the angle of rotation of the plate (8). By the stepwise displacement of the diffracted beam across the photodiode array (11) , a better sampling of the diffracted beam and therefore an improved spectral resolution is achieved. The invention can be used in the spectrometric analysis of a sample contained in a sample cell (5), whereby the sample cell is irradiated with polychromatic light from a light source (1).

Abstract translation: 用于确定多色辐射光束的光谱组成的光电二极管阵列光谱仪包括衍射装置（10），其从多色光束产生衍射光束，其具有多个不同波长（λ1，λ2，λ3）的空间分离的衍射光线 ）。 光电二极管阵列（11）接收衍射光束，由此每个光电二极管截取光束的不同光谱部分。 可旋转的透明板（8）设置在衍射装置（10）前面的光束路径中，由于光束在进入和离开板（8）时由于折射而允许改变射入的光束的方向 衍射装置（10），并因此衍射光束的方向取决于板（8）的旋转角度而以小的步长。 通过衍射光束跨越光电二极管阵列（11）的逐步位移，实现了衍射光束的更好采样，从而实现了改进的光谱分辨率。 本发明可以用于样品池（5）中包含的样品的光谱分析，由此用来自光源（1）的多色光照射样品池。

公开(公告)号：EP0096317B1

公开(公告)日：1987-12-16

申请号：EP83105287.3

申请日：1983-05-27

Applicant: KÖZPONTI ELELMISZERIPARI KUTATO INTEZET

Inventor： Kaffka, Károly, Dr. ,  Nadai, Béla, Dr. ,  Czabaffy, András ,  Horváth, Loránd, Dr.

IPC: G01J3/12 ,  G01J3/20

CPC classification number: G01J3/18 ,  G01J3/06 ,  G01J3/20

公开(公告)号：EP0087568B1

公开(公告)日：1987-01-07

申请号：EP83100499.9

申请日：1983-01-20

Applicant: THE PERKIN-ELMER CORPORATION

Inventor： Talmadge, Paul C. ,  Vergato, Joseph A.

IPC: G01J3/42

CPC classification number: G01J3/42 ,  G01J3/06 ,  G01J3/08

公开(公告)号：EP0183415A2

公开(公告)日：1986-06-04

申请号：EP85308144.6

申请日：1985-11-08

Applicant: C. Reichert Optische Werke AG

Inventor： Lihl, Reinhard

IPC: G02B21/00 ,  G01J3/02

CPC classification number: G02B21/002 ,  G01J3/02 ,  G01J3/0256 ,  G01J3/06 ,  G01J3/08 ,  G01J3/26 ,  G02B21/0096

Abstract: A photometer adapted to receive light deflected from a microscope observation axis (15) to alternatively provide image or wavelength scanning modes. The photometer comprises an entrance axis (29) for light received from the microscope, a pin hole occluder (12) positioned at one end of the entrance axis (29), a detector axis (27) having a detector (18) at one end thereof, and first and second scanning axes (16, 28) selectively connecting the entrance axis (29). The first scanning axis (16) is provided with a first imaging means (14) positioned thereon for imaging the pin hole occluder (12 near said detector (18). The second scanning axis (28) is provided with monochromator means (32) to reflect a single wavelength of light and a second imaging means for imaging the pin hold occluder (12) near the detector (18). The photometer also includes selector means (26) for connecting a chosen scanning axis (16, 28) to said entrance and detector axes (29, 27). By means of this arrangement image scanning' can be performed when said first scanning axis (16) connects said entrance and detector axes (29, 27), and wavelength scanning can be performed when said second scanning axis (28) connects said entrance and detector axes (29, 27).

Abstract translation: 适于接收从显微镜观察轴（15）偏转的光的光度计，以交替地提供图像或波长扫描模式。 所述光度计包括用于从所述显微镜接收的光的入口轴线（29），位于所述入口轴线（29）的一端的针孔闭塞器（12），在一端具有检测器（18）的检测器轴线 以及选择性地连接入口轴线（29）的第一和第二扫描轴（16,28）。 第一扫描轴（16）设置有定位在其上的第一成像装置（14），用于对针孔闭塞器（12）在所述检测器（18）附近进行成像，第二扫描轴（28）设置有单色仪装置 反射单个波长的光和第二成像装置，用于对检测器（18）附近的针保持闭塞器（12）进行成像。光度计还包括选择器装置（26），用于将所选择的扫描轴线（16,28）连接到所述入口 和检测器轴（29,27），通过该布置，当所述第一扫描轴（16）连接所述入口和检测器轴（29,27）时，可执行图像扫描，并且当所述第二扫描轴 （28）连接所述入口和检测器轴（29,27）。

公开(公告)号：EP0096316A1

公开(公告)日：1983-12-21

申请号：EP83105286.5

申请日：1983-05-27

Applicant: KÖZPONTI ELELMISZERIPARI KUTATO INTEZET

Inventor： Nádai, Béla, Dr. ,  Czabaffy, András ,  Horváth, Loránd, Dr. ,  Kaffka, Károly, Dr.

IPC: G01J3/28

CPC classification number: G01J3/28 ,  G01J3/06

Abstract: The invention relates on the one part to a method for measuring spectra in the course of which the intensity of the radiation to be tested is measured while varying the wavelength of the radiation. The measurement is performed either by varying the wavelength of the radiation step-by-step and keeping the product of the measuring period and the intensity detected at a constant value for each wavelength, or by varying the wavelength of the radiation continuously with a rate proportional to the momentary value of the intensity detected. The invention is on the other part an apparatus for measuring spectra comprising a device (7) for varying the wavelength of the radiation to be measured and a radiation detector (3) sensing the intensity of the radiation to be measured. In the apparatus an input (17) of a comparator (5) of adjustable threshold value is connected to an output (19) of the radiation detector (3) via an integrator (4), the output (18). of the comparator (5) is connected to the control input of the device (7) for varying the wavelength step-by-step, and there is a time measuring unit (12) for measuring the time interval necessary for the output signal of the integrator (4) to change from an initial value up to the adjustable threshold value (Figure 1).

Abstract translation: 本发明一方面涉及一种测量光谱的方法，其中在测量辐射的波长的同时测量待测辐射的强度。 测量可以通过逐步改变辐射波长并将每个波长的测量周期和所检测强度的乘积保持在恒定值，或者通过以比例连续变化辐射的波长来进行 到所检测的强度的瞬时值。 本发明另一方面是一种用于测量光谱的装置，其包括用于改变要测量的辐射的波长的装置（7）和感测要测量的辐射的强度的辐射检测器（3）。 在该装置中，具有可调阈值的比较器（5）的输入端（17）经由积分器（4）与比较器的输出端（18）连接到放射线检测器（3）的输出端（19） 5）连接到设备（7）的控制输入端，用于逐步改变波长，并且存在用于测量积分器（4）的输出信号所需的时间间隔的时间测量单元（12） 从初始值改变到可调阈值。

公开(公告)号：EP0015608A1

公开(公告)日：1980-09-17

申请号：EP80200150.3

申请日：1980-02-22

Applicant: PHILIPS ELECTRONICS UK LIMITED ,  Philips Electronics N.V.

Inventor： Perkins, Charles Vincent PHILIPS ELECTRONIC AND ,  Firth, John Richard PHILIPS ELECTRONIC AND ASS.

IPC: F16H53/06 ,  G01J3/12

CPC classification number: G01J3/18 ,  G01J3/06 ,  Y10T74/2107

Abstract: A cam and follower arrangement in which the cam consists of a track (21), carried by a rotatable member (12), and has one or more abrupt directional transitions (30) and the follower (17) is biassed to engage one wall or the other (31, 32) of the track (21) appropriate to the direction of rotation of the member (12), by means including a direct-current electric motor (20) operated in a stalled condition. The arrangement is employed in a monochromator for spectrophotometric apparatus to drive a filter-holder 18, to position one of a number of optical filters (22, 23, 24, 25) in the incoming beam of light (26).

公开(公告)号：EP4390498A1

公开(公告)日：2024-06-26

申请号：EP23217214.8

申请日：2023-12-15

Applicant: Weigele Scientific GmbH

Inventor： Weigele, Uwe Dieter

IPC: G02B23/16 ,  G01J3/06 ,  G01J3/28

CPC classification number: G01J3/06 ,  G01J3/2823 ,  G02B23/165 ,  G02B23/16

Abstract: Anordnung (38) zur Beobachtung eines Himmelskörpers umfassend
• ein Beobachtungsinstrument (11) mit einem Spektrographen (20) zur Zerlegung von durch die Eingangsöffnung (14) einfallendem Licht in Spektrallinien (23) sowie mindestens einem elektronischen Bildsensor (24) zur Detektion mindestens einer der Spektrallinien (23),
• eine Ausgleichsvorrichtung (40) mit mindestens einer Ausgleichsachse (48, 56, 58) zum Ausgleich einer durch die Erdrotation hervorgerufenen Relativbewegung zwischen dem Himmelskörperbild und dem Beobachtungsinstrument (11),
• mindestens eine Scanachse (45, 47, 63) zur Erzeugung einer Relativbewegung zwischen dem Himmelskörperbild und dem Beobachtungsinstrument (11),
sowie
Verfahren zum Bewegen eines Himmelskörperbildes gegenüber einem Beobachtungsinstrument (11) unter Verwendung der Anordnung (38) .

公开(公告)号：EP4390494A1

公开(公告)日：2024-06-26

申请号：EP23217385.6

申请日：2023-12-16

Applicant: Weigele Scientific GmbH

Inventor： Weigele, Uwe Dieter

IPC: G02B17/06 ,  G01J3/06 ,  G01J3/28

CPC classification number: G01J3/06 ,  G02B17/0621 ,  G01J3/2803 ,  G01J3/18 ,  G01J1/0462

Abstract: Beobachtungsinstrument (12) zur Beobachtung eines Himmelskörpers (14) mit
• einer Eingangsebene (18) mit einem Eingangsspalt (20) zum Einlass mindestens eines Teils eines Himmelskörperbildes,
• einem Spektrographen (22) zur Zerlegung von durch den Eingangsspalt (20) einfallendem Licht (24) in Spektrallinien (26),
• einer Bilderzeugungsvorrichtung (28) zur Erzeugung des Himmelskörperbildes auf der Eingangsebene (18), umfassend
oein erstes Reflexionselement (30) mit einer ersten optischen Achse (32),
oein zweites Reflexionselement (34) mit einer zweiten optischen Achse (36),
wobei das erste Reflexionselement (30) mit dem zweiten Reflexionselement (34) in optischer Wirkverbindung steht, und wobei die zweite optische Achse (36) gegenüber der ersten optischen Achse (32) einen translatorischen und/oder winkligen Versatz aufweist.

公开(公告)号：EP4382892A1

公开(公告)日：2024-06-12

申请号：EP22852751.1

申请日：2022-06-30

Applicant: Shimadzu Corporation

Inventor： SASAYAMA, Tomoki

IPC: G01N21/65 ,  G01J3/06 ,  G01J3/44 ,  G02B21/00

CPC classification number: G01J3/06 ,  G01N21/65 ,  G01J3/44 ,  G02B21/00

Abstract: [Problem to be solved] An object of the present invention is to provide a microscopic Raman spectroscopy device that can achieve downsizing and cost reduction by simplifying a structure of a spectrometer and can always analyze samples with high accuracy.
[Solution] A microscopic Raman spectroscopy device 1 includes laser oscillators (excitation light sources) 2 and 3 that emit excitation laser lights (excitation lights) L1 and L2 of different wavelengths, a spectrometer 10 that uses a diffraction grating 12 or 13 to disperse Raman scattering light R1 or R2 emitted from a sample S by irradiation with the excitation laser light L1 or L2 from the laser oscillator 2 or 3, and a CCD detector 20 that detects and photoelectrically converts the Raman scattering light R1 or R2 dispersed by the spectrometer 10. The spectrometer 10 includes incident apertures 11a and 11b, a plurality of (two) optical systems I and II that guide the Raman scattering light R1 or R2 incident from the incident aperture 11a or 11b to the diffraction grating 12 or 13, and a plurality of light beams dispersed by the diffraction grating 12 or 13 are incident on one imaging lens 14 in tandem.