IMAGING TARGET MOVEMENT COMPENSATION IN A FOURIER-DOMAIN OPTICAL COHERENCE TOMOGRAPHY IMAGING SYSTEM

    公开(公告)号:EP4386312A1

    公开(公告)日:2024-06-19

    申请号:EP22214175.6

    申请日:2022-12-16

    申请人: Optos PLC

    摘要: A Fourier-domain optical coherence tomography imaging system (10) comprising an Fourier-domain optical coherence tomography scanner (20) arranged to generate complex optical coherence tomography data (25) by performing a scan of an imaging target (30) to acquire samples whose complex values are indicative of an optical property of the imaging target at respective scan locations in the imaging target. The imaging system (10) further comprises a controller (40) arranged to calculate a two-dimensional cross-correlation using phase information of the acquired samples, and control the scanner (20), based on the calculated cross-correlation, to compensate for relative movement between the imaging target (30) and the scanner (20) during the scan.

    SPACE DIVISION MULTIPLEXING OPTICAL COHERENCE TOMOGRAPHY USING AN INTEGRATED PHOTONIC DEVICE

    公开(公告)号:EP4289348A3

    公开(公告)日:2024-01-17

    申请号:EP23197907.1

    申请日:2018-05-14

    申请人: Zhou, Chao

    发明人: Zhou, Chao

    摘要: Integrated photonic chips and related systems and methods suitable for space-division multiplexing optical coherence tomography scanning are disclosed. In one embodiment, the photonic chip comprises a substrate, an optical input port which receives an incident sampling beam from an external light source, a plurality of optical output ports configured to transmit a plurality of sampling beams from the chip to a sample to capture scanned images of the sample, and a plurality of interconnected and branched waveguide channels formed in the substrate. Waveguide channels in a splitter region divide the sampling beam into the plurality of sampling beams at the output ports. Terminal portions of the waveguide channels in a time delay region associated with each output port have different predetermined lengths to create an optical time delay between the sampling beams. In some embodiments, the chip further comprises an interferometer region to create interference patterns.