DATA GATHERING SYSTEM
    75.
    发明公开
    DATA GATHERING SYSTEM 审中-公开
    DATENSAMMELSYSTEM

    公开(公告)号:EP2531099A4

    公开(公告)日:2017-05-03

    申请号:EP11737770

    申请日:2011-01-28

    IPC分类号: A61B5/00 A61K9/00 H04B7/24

    摘要: A device for gathering data has first and second electrodes. The first electrode is coupled to a surface of interest, and the second electrode is coupled to “everything else” or “the air”. The first electrode is shielded from the second, and from most sources of parasitic capacitance, by a shield that is driven by an active driver that drives the shield to track, and ideally to match, the instantaneous potential of the electrode. The second electrode is likewise shielded in a similar way from most sources of parasitic capacitance. These shields likewise help to limit the extent to which RFI from the device electronics couples with either of the electrodes. In this way the sensing device achieves a markedly better signal-to-noise ratio at frequency bands of interest.

    摘要翻译: 用于收集数据的设备具有第一和第二电极。 第一电极耦合到感兴趣的表面,并且第二电极耦合到“其他一切”或“空气”。 第一个电极与第二个电极以及大多数寄生电容源隔离,屏蔽由驱动屏蔽层跟踪的有源驱动器驱动,并理想地匹配电极的瞬时电位。 第二个电极的屏蔽方式与绝大多数寄生电容相似。 这些屏蔽同样有助于限制装置电子设备的RFI与任一电极耦合的程度。 以这种方式,感测装置在感兴趣的频带处实现显着更好的信噪比。

    SYSTEM FOR SUPPLY CHAIN MANAGEMENT
    80.
    发明公开
    SYSTEM FOR SUPPLY CHAIN MANAGEMENT 有权
    供应链管理系统

    公开(公告)号:EP2497054A4

    公开(公告)日:2014-12-03

    申请号:EP10829125

    申请日:2010-11-04

    发明人: ZDEBLICK MARK J

    IPC分类号: H04B5/00 G06Q10/00 G06Q10/06

    摘要: A system for tracking a product from origin to destination is disclosed. The system includes a probe that comprises two plates, a power source and a processor. The power source is controlled by the processor to produce an oscillating output at the plates. Using the oscillating voltage, the probe interrogates a device through capacitive coupling. The device includes a control unit, a memory unit, and first and second materials physically associated with the device for communication using capacitive coupling. Information associated with the device is transferred from the device to the probe through capacitive coupling between the first and second materials and the first and second plates, respectively.