摘要:
A method for making superconductive ceramics laminates comprises forming a thick film (2) of a composite oxide comprising bismuth, strontium, calcium, copper and oxygen on a flat plane of a substrate (1), and orienting and crystallizing the thus formed film by heat treatment to cause the c-axis of composite oxide crystals to be substantially perpendicular to said flat plane of said substrate. An intermediate layer formed of a noble metal, MgO, SrTiO₃, yttria-stabilized zirconia or an oxide of a superconductive ceramics-constituting element may be interposed between the film and the substrate.
摘要:
In the present invention, an iron based alloy which contains by mass%; 0.20% or less of C; 6.0 to 16.0% of Cr; 6.0 to 16.0% of Ni and whose martensitic transformation starting temperature (Ms point temperature) is in the range of 0-170°C, inclusive of 0°C and exclusive of 170°C, is used as a welding material. With respect to a weld metal, the weld metal has a iron alloy composition which contains by mass%: 0.20% or less of C; 3.0 to 13.0% of Cr; 3.0 to 13.0% of Ni and whose martensitic transformation starting temperature (Ms point temperature) is in the range of 50-360°C, inclusive of both 50°C and 360°C.
摘要:
There is provided a ultra micro indentation testing apparatus comprising: a lever stand (4) provided with a center lever (3) having a silicon probe (1) and a diamond indenter (2) disposed therein; a moving mechanism (7) for moving the lever stand (4) in a triaxial direction; aindentationg-in mechanism (6) for pushing the diamond indenter (2) in a sample; a displacement gage (10) for measuring a displacement of the silicon probe (1) or the diamond indenter (2); and an optical picture device (11) for use in positioning the silicon probe (1) or the diamond indenter (2) and observing the surface of the sample; wherein the apparatus has, in combination, all of the hardness measuring function based on measurement of the force and depth of the diamond indenter pushed in the surface of the sample, the atomic force microscopic function of acquiring the shape of the surface of the sample based on a displacement of the diamond indenter or the silicon probe, and the optical microscopic function of observing the surface of the sample by the optical picture device. Furthermore, the testing apparatus is equipped with both of the function of measuring the hardness of the surface of material in a ultra micro region and the surface observing function with high accuracy.