摘要:
An imaging system (100) includes a radiation source (110) with a focal spot (204) that emits a beam of x-ray photons that traverses an examination region (106). The imaging system further includes a photon counting detector array (122) that detects a sub-set of the x-ray photons that traverse an examination region. The imaging system further includes a controller (116) that generates and transmits a pause signal, in response to a calculated drop in an intensity of the emitted the beam of x-ray photons below a predetermined intensity level, which causes the photon counting detector array to pause detecting the sub-set of the x-ray photons. The imaging system further includes a counter (136) that counts, for each of a plurality of counting periods, the x-ray photons of the sub-set detected by the photon counting detector array in the corresponding counting period.
摘要:
The present invention is directed towards a photon counting radiation detector (10) comprising an array of pixels (13) comprising a plurality of detection pixels (131) for detecting imaging information. At least one pixel of the array of pixels (132) is shielded from receiving radiation. A dark current is determined from the shielded pixel (132) and is used to compensate for dark current in the other, non-shielded pixels (131). Embodiments are directed to integrating pixel shielding within an Anti Scatter Grid or in a mask.
摘要:
A phase contrast imaging apparatus (MA) and related image processing method. The imaging apparatus includes a movable arm (AR) that carries a detector (D) and one or more interferometric gratings (G0, G1, G2). The imaging apparatus includes a rigidizer (RGD) to control the rigidity of at least the arm (AR) or a mounting (GM) for the gratings (G0, G1, G2). This allows controlling a drift of a Moiré pattern as detected in a sequence of readouts. A phase of the so controlled Moiré pattern can be used to calibrate the imaging apparatus by using the image processing method.
摘要:
An imaging system including a radiation source (110) that emits poly-chromatic radiation that traverses an examination region and a detector (116) that detects radiation traversing the examination region and produces a signal indicative of the energy of a detected photon. The system further includes an energy discriminator (122) that energy resolves the signal based on a plurality of different energy thresholds, wherein at least two of the energy thresholds have values corresponding to at least two different K-edge energies of two different elements in a mixture disposed in the examination region. The system also includes a signal decomposer (132) that decomposes the energy-resolved signal into at least a multi K-edge component representing the at least two different K-edge energies. In one instance, a stoichiometric ratio of the two different elements in the contrast agent is known and substantially constant.
摘要:
The present invention relates to a detector (22′) for detecting ionizing radiation, comprising: a directly converting semi-conductor layer (36) for producing charge carriers in response to incident ionizing radiation; and a plurality of electrodes (34) corresponding to pixels for registering the charge carriers and generate a signal corresponding to registered charge carriers; wherein an electrode of the plurality of electrodes (34) is structured to two-dimensionally intertwine with at least two adjacent electrodes to register the charge carriers by said electrode and by at least one adjacent electrode. The present invention further relates to a detection method and to an imaging apparatus.
摘要:
An imaging system includes a radiation source (108) configured to rotate about an examination region (106)and emit radiation that traverses the examination region. The imaging system further includes an array of radiation sensitive pixels (112) configured to detect radiation traversing the examination region and output a signal indicative of the detected radiation. The array of radiation sensitive pixels is disposed opposite the radiation source, across the examination region. The imaging system further includes a rigid flux filter device (130) disposed in the examination region between the radiation source and the radiation sensitive detector array of photon counting pixels. The rigid flux filter device is configured to filter the radiation traversing the examination region and incident thereon. The radiation leaving the rigid flux filter device has a predetermined flux.
摘要:
The invention relates to a source-detector arrangement (11) of an X-ray apparatus (10) for grating based phase contrast computed tomography. The source-detector arrangement comprises an X-ray source (12) adapted for rotational movement around a rotation axis (R) relative to an object (140) and adapted for emittance of an X-ray beam of coherent or quasi-coherent radiation in a line pattern (21); and an X-ray detection system (16) including a first grating element (24) and a second grating element (26) and a detector element (6); wherein the line pattern of the radiation and a grating direction of the grating elements are arranged orthogonal to the rotation axis; and wherein the first grating element has a first grating pitch varied dependent on a cone angle (β) of the X-ray beam and/or the second grating element has a second grating pitch varied dependent on the cone angle of the X-ray beam.
摘要:
The present invention relates to an X-ray detector comprising a directly converting semiconductor layer (60) having a plurality of pixels for converting incident radiation into electrical measurement signals with a band gap energy characteristic of the semiconductor layer, wherein said incident radiation is x-ray radiation emitted by an x-ray source (2) or light emitted by at least one light source (30, 33). Further, an evaluation unit (67) is provided for calculating evaluation signals per pixel or group of pixels from first electrical measurement signals generated per pixel or group of pixels when light from said at least one light source at a first intensity is coupled into the semiconductor layer and second electrical measurement signals generated per pixel or group of pixels when light from said at least one light source at a second intensity is coupled into the semiconductor layer, wherein said evaluation unit is configured to detect per pixel or group of pixels a noise peak in said first and second electrical measurement signals and to determine offset and gain per pixel or group of pixels from the detected noise peaks. A detection unit (69) is provided for determining detection signals from electrical measurement signals generated when x-ray radiation is incident onto the semiconductor layer, and a calibration unit (68) is provided for calibrating the detection unit on the basis of the evaluation signals.