Abstract:
A rotation angle measuring device (1) provided with a fixed unit (18) and a movable unit (9) relatively rotating with respect to the fixed unit, comprising a light source (2) installed on either one of the fixed unit or the movable unit and for emitting a detection light and a reference position signal light, a polarizing plate (4) for converting a detection light emitted from the light source to a polarized light, a polarized light rotating unit for rotating the polarized light around an optical axis (7) of the light source as the center, a reference position signal light emitted at a reference rotating position of the polarized light, a stationary polarizing plate (5) provided on either one of the fixed unit or the movable unit (10) and to stand still with respect to a rotation of the polarized light, a photodetection sensor (6) provided on the fixed unit or on the movable unit and for receiving the polarized light passing through the stationary polarizing plate and the reference position signal light, and an arithmetic unit (10) for calculating a detection waveform (21, 22, 23) of a change of light amount based on a signal from the photodetection sensor, for detecting the reference position signal light and for calculating a relative rotation angle between the fixed unit and the movable unit from a phase of the detection waveform and a predetermined detection reference phase when the reference position signal light is detected.
Abstract:
A terahertz ellipsometer, the basic preferred embodiment being a sequential system having a backward wave oscillator (BWO); a first rotatable polarizer that includes a wire grid (WGP1); a rotating polarizer that includes a wire grid (RWGP); a stage (STG) for supporting a sample (S); a rotating retarder (RRET) comprising first (RP), second (RM1), third (RM2) and fourth (RM3) elements; a second rotatable polarizer that includes a wire grid (WGP2); and a Golay cell detector (DET).
Abstract:
Ellipsometry systems and ellipsometry data collection methods with improved stabilities are disclosed. In accordance with the present disclosure, multiple predetermined, discrete analyzer angles are utilized to collect ellipsometry data for a single measurement, and data regression is performed based on the ellipsometry data collected at these predetermined, discrete analyzer angles. Utilizing multiple discrete analyzer angles for a single measurement improves the stability of the ellipsometry system.
Abstract:
The invention describes a method to eliminate instrumental offset in measurement of optically active scattering and circular dichroism. The method uses the time-average measurement of the light that is systematically transformed by series of optical devices. The optical devises perform the function of rotating linearly polarized light, interconventing left and right circular polarized light, converting circular polarized light to rotating linear polarized light and converting linear polarized light to alternating left and right circular polarized light.
Abstract:
Low aberration relay systems modified to perform as spatial filters in reflectometer, spectrophotometer, ellipsometer, polarimeter and the like systems.
Abstract:
A method of characterizing materials comprising the steps of: providing a substrate; synthesizing an array of materials on said substrate; providing at least one reactant gas wherein said reactant gas is in contact with said array of materials; activating at least one of said materials on said array with a heating source; and periodically monitoring an infrared emission from said activated material with an infrared camera, wherein said infrared camera outputs a series of signals corresponding to an emission intensity varying with time of said activated material.