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    LOW-VOLTAGE SELF-CALIBRATED CMOS PEAK DETECTOR
    71.
    发明公开
    LOW-VOLTAGE SELF-CALIBRATED CMOS PEAK DETECTOR 有权
    SELBSTKALIBRIERTER低压CMOS峰值检测器

    公开(公告)号：EP2338226A1

    公开(公告)日：2011-06-29

    申请号：EP09736687.6

    申请日：2009-10-07

    申请人： NXP B.V.

    发明人： TOURRET, Jean-Robert

    IPC分类号： H03K5/1532 ,  G01R19/04

    CPC分类号： H03K5/1532 ,  G01R19/04 ,  G01R35/005

    摘要： The present invention relates to a low-voltage self-calibrated peak detector (100). Using a two-step calibration process that compensates the offset errors introduced by the respective first, second and third comparators (122, 128, 130), the peak detection is made accurate whatever temperature, process or mismatch spreads. Its input bandwidth can be as high as the bandwidth of an operational amplifier of unity gain. In a rail-to-rail configuration, it can be implemented into a fully differential low-voltage self-calibrated CMOS peak detector (200), which can have a very high conversion gain (α) and a very high input signal dynamic ranging.

    Signal measurement and processing method and apparatus
    73.
    发明公开
    Signal measurement and processing method and apparatus 有权
    SIGNALMESSUNGS- UND VERARBEITUNGSVERFAHREN UND VORRICHTUNG

    公开(公告)号：EP2270521A1

    公开(公告)日：2011-01-05

    申请号：EP10075658.4

    申请日：2004-10-27

    申请人： Ultra Electronics Limited

    发明人： Stothers, Ian McGregor ,  Langley, Andrew

    IPC分类号： G01R27/02 ,  G01D5/00

    CPC分类号： G01D5/24 ,  G01D5/20 ,  G01R27/02 ,  G01R27/14 ,  G01R35/005

    摘要： Apparatus for generating an output dependent upon the impedance or at least one component of the impedance of a device, the apparatus comprising: a load component (2) having a known impedance or at least one component thereof for connection in series with the device to allow for the measurement of a voltage drop across the load component (2); a generator arrangement for applying a signal having a voltage to the series connected load component and device; a measurement arrangement adapted to measure a first voltage one side of said load component (2), and one of a second voltage on the other side of said load component (2) or a difference voltage comprising the voltage difference across said load device; and a signal processing arrangement for processing the measurements to generate an output dependent upon the impedance or at least one component of the impedance of the device, wherein said processing arrangement is adapted to: determine a first parameter indicative of the complex amplitude of the first voltage on a first side of said load component connected to said device, and a second parameter indicative of the complex amplitude of said difference voltage or a calculated difference voltage comprising the difference between the first and second voltages; multiply each of the first and second determined parameters by the complex conjugate of the second determined parameter to generate third and fourth parameters respectively; and compare said third and fourth parameters to generate an output or compare one or more components or derivatives of the third parameter and said fourth parameter to generate said output.

    摘要翻译： 用于产生取决于装置的阻抗或至少一个部件的输出的装置的装置，所述装置包括：具有已知阻抗的负载部件（2）或其至少一个部件，用于与装置串联以允许 用于测量负载组件（2）两端的电压降; 用于向串联连接的负载部件和装置施加具有电压的信号的发生器装置; 测量装置，其适于测量所述负载组件（2）的第一电压的一侧，以及所述负载组件（2）的另一侧的第二电压中的一个或包含所述负载装置两端的电压差的差电压; 以及信号处理装置，用于处理所述测量以根据所述阻抗或所述装置的阻抗的至少一个分量产生输出，其中所述处理装置适于：确定指示所述第一电压的复振幅的第一参数 在连接到所述装置的所述负载分量的第一侧上，以及指示所述差值电压的复幅度的第二参数或包括所述第一和第二电压之间的差的计算差值电压; 将第一和第二确定参数中的每一个乘以第二确定参数的复共轭，以分别产生第三和第四参数; 并比较所述第三和第四参数以产生输出或比较第三参数和所述第四参数的一个或多个分量或导数以产生所述输出。

    Proximity sensor
    74.
    发明公开
    Proximity sensor 有权
    接近传感器

    公开(公告)号：EP2261682A1

    公开(公告)日：2010-12-15

    申请号：EP10075617.0

    申请日：2004-10-27

    申请人： Ultra Electronics Limited

    发明人： Stothers, Ian McGregor ,  Langley, Andrew

    IPC分类号： G01R27/02 ,  G01D5/00

    CPC分类号： G01D5/24 ,  G01D5/20 ,  G01R27/02 ,  G01R27/14 ,  G01R35/005

    摘要： A proximity sensor for sensing the proximity of a target comprising: an electrical component for sensing the proximity of the target, said electrical component having electrical properties that vary with the proximity of the target; an impedance component (21) having a known impedance and a first end connected to a first end of said electrical component; a switch (31) connected to switch between said first end of said impedance component (21) and a second end of said impedance component (21); a signal generator connected to said second end of said impedance component (21) for generating an electrical signal for application to the impedance component and electrical component; an analogue-to-digital converter for receiving an electrical signal and for generating a digital signal; and a processor connected to the analogue-to-digital converter for receiving a digital voltage signal and for generating a proximity signal, wherein said processor (23) is adapted to control said switch to switch (31) to connect to said first and second ends of said impedance component sequentially.

    摘要翻译： 1。一种用于感测目标的接近度的接近度传感器，包括：电子部件，用于感测目标的接近度，所述电子部件具有随目标的接近程度而变化的电特性; 具有已知阻抗的阻抗元件（21），以及连接到所述电气元件的第一端的第一端; 开关（31），其连接成在所述阻抗元件（21）的所述第一端与所述阻抗元件（21）的第二端之间切换; 连接到所述阻抗部件（21）的所述第二端的信号发生器，用于产生施加到所述阻抗部件和电部件的电信号; 一个模拟 - 数字转换器，用于接收电信号并产生数字信号; 以及连接到所述模拟 - 数字转换器的处理器，用于接收数字电压信号并且用于生成接近信号，其中所述处理器（23）适于控制所述开关以切换（31）以连接到所述第一和第二端 的所述阻抗分量的顺序。

    MEASUREMENT ERROR CORRECTING METHOD AND ELECTRONIC PART CHARACTERISTIC MEASURING INSTRUMENT
    77.
    发明公开
    MEASUREMENT ERROR CORRECTING METHOD AND ELECTRONIC PART CHARACTERISTIC MEASURING INSTRUMENT 审中-公开
    MESSFEHLERKORREKTURVERFAHREN UND INSTRUMENT ZUR MESSUNG DER EIGENSCHAFTEN VON ELEKTRONIKTEILEN

    公开(公告)号：EP2241899A1

    公开(公告)日：2010-10-20

    申请号：EP08872059.4

    申请日：2008-12-08

    申请人： Murata Manufacturing Co. Ltd.

    发明人： MORI, Taichi

    IPC分类号： G01R27/28 ,  G01R35/00

    CPC分类号： G01R27/28 ,  G01R35/005

    摘要： Provided are a method for correcting measurement errors and an electronic component characteristics measurement device that can improve the correction precision by eliminating the correction errors caused by leakage signal components between the ports of the measurement jigs.
    An equation CA ij that correlates measurement values in a test measurement jig mounted state with measurement values in a standard measurement jig mounted state is determined from a result of measuring electric characteristics S D , S T on correction data obtaining samples having different electric characteristics with each other in a state in which they are mounted on a standard measurement jig 20 and on a test measurement jig 30. The equation CA ij is an equation that assumes presence of leakage signals that are directly transmitted between at least two ports of at least one of the standard measurement jig and the test measurement jig. By using the equation CA ij determined by measuring the electric characteristics on an arbitrary electronic component in a state in which it is mounted on the test measurement jig 30, the electric characteristics that would be obtained if measured on the electronic component in a state in which it is mounted on the standard measurement jig 20 are calculated.

    摘要翻译： 提供了一种用于校正测量误差的方法以及通过消除由测量夹具的端口之间的泄漏信号分量引起的校正误差来提高校正精度的电子部件特性测量装置。 将测试测试夹具安装状态中的测量值与标准测量夹具安装状态下的测量值相关联的等式CA ij根据对具有彼此具有不同电特性的样本的校正数据获得样本的电特性SD，ST的测量结果确定 它们被安装在标准测量夹具20和测试测量夹具30上的状态。等式CA ij是假定在至少两个标准的至少两个端口之间直接传输的泄漏信号的存在的等式 测量夹具和测试测量夹具。 通过使用通过在安装在测试测量夹具30上的状态下测量任意电子部件上的电特性而确定的等式CA ij，如果在电子部件上测量的电特性， 它被安装在标准测量夹具20上。

    Method and system for tracking scattering parameter test system calibration
    80.
    发明公开
    Method and system for tracking scattering parameter test system calibration 有权
    Verfahren und System zur Verfolgung der Streuparameter-Prüfsystemkalibrierung

    公开(公告)号：EP2081031A1

    公开(公告)日：2009-07-22

    申请号：EP09150811.9

    申请日：2009-01-16

    申请人： Com Dev International Limited

    发明人： Albert-Lebrun, Xavier M. H. ,  Lisi, Mario ,  Van Lingen, Charles ,  Peach, Robert Christopher

    IPC分类号： G01R27/28 ,  G01R35/00

    CPC分类号： G01R35/005 ,  G01R27/32

    摘要： Embodiments describe methods of correcting S-parameter measurements for a DUT. The method includes coupling at least one tracking module associated with a set of electrical standards to a S-parameter measurement device to form a test system. An initial calibration for the test system is then determined. This may include measuring the S-parameters of the electrical standards, generating a calibration along a calibration plane, generating a calibration along a correction plane and determining at least one error adapter from the calibrations. The DUT is coupled to the test system and the S-parameters of the DUT are measured. Changes in the initial calibration are tracked using the tracking modules. Tracking may include measuring the S-parameters of the electrical standards, generating a correction plane calibration and generating a corrected calibration plane calibration from the correction plane calibration and the error adapter(s). The measured S-parameters are corrected using the tracked changes.

    摘要翻译： 实施例描述了校正DUT的S参数测量的方法。 该方法包括将与一组电气标准相关联的至少一个跟踪模块耦合到S参数测量装置以形成测试系统。 然后确定测试系统的初始校准。 这可以包括测量电气标准的S参数，沿着校准平面产生校准，沿校正平面生成校准，并根据校准确定至少一个错误适配器。 DUT耦合到测试系统，并测量DUT的S参数。 使用跟踪模块跟踪初始校准的变化。 跟踪可以包括测量电气标准的S参数，产生校正平面校准并从校正平面校准和错误适配器生成校正的校准面校准。 测量的S参数使用跟踪的变化进行校正。