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    MASS SPECTROMETRY DEVICE AND METHOD FOR CONTROLLING SAME
    77.
    发明公开
    MASS SPECTROMETRY DEVICE AND METHOD FOR CONTROLLING SAME 审中-公开

    公开(公告)号：EP4283290A1

    公开(公告)日：2023-11-29

    申请号：EP22742552.7

    申请日：2022-01-17

    Applicant: HITACHI HIGH-TECH CORPORATION

    Inventor： SUGAWARA Yuka ,  HASHIMOTO Yuichiro ,  YASUDA Hiroyuki ,  SUGIYAMA Masuyuki ,  TAMURA Riku

    IPC: G01N27/62 ,  H01J49/00 ,  H01J49/42

    Abstract: The purpose of the present disclosure is to provide: a mass spectrometry device that can reduce a deviation in a mass axis due to the generation of heat from an AC voltage control circuit; and a method for controlling the mass spectrometry device. The mass spectrometry device according to the present disclosure: comprises a quadrupole electrode 111, to which an AC voltage is applied, and a control unit 100, that controls the voltage value of the AC voltage; and uses the quadrupole electrode 111 as a mass filter. Before a measurement, the mass spectrometry device applies the AC voltage of a prescribed amplitude V1 to the multipole electrode for a prescribed time T1, and a heating value J1 that is generated when the AC voltage of the prescribed amplitude V1 is applied to the multipole electrode for the prescribed time T1 is equivalent to a heating value that is generated when the AC voltage of the amplitude that is applied during the measurement is applied until a thermally steady state is reached (see fig. 3A ).

    MASS SPECTROMETRY DEVICE
    79.
    发明公开
    MASS SPECTROMETRY DEVICE 审中-公开

    公开(公告)号：EP4257966A3

    公开(公告)日：2023-11-29

    申请号：EP23189772.9

    申请日：2016-08-26

    Applicant: Hamamatsu Photonics K.K.

    Inventor： NAITO, Yasuhide ,  KOTANI, Masahiro ,  OHMURA, Takayuki

    IPC: H01J49/04 ,  H01J49/00 ,  G01N27/623

    Abstract: A surface-assisted laser desorption/ionization method according to an aspect includes: a first process of preparing a sample support (2) having a substrate (21) in which a plurality of through-holes (S) passing from one surface (21a) thereof to the other surface (21b) thereof are provided and a conductive layer (23) that covers at least the one surface (21a); a second process of placing a sample (10) on a sample stage (1) and arranging the sample support (2) on the sample (10) such that the other surface (21b) faces the sample (10); and a third process of applying a laser beam (L) to the one surface (21a) and ionizing the sample (10) moved from the other surface (21b) side to the one surface (21a) side via the through-holes (S) due to a capillary phenomenon.

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