A MULTIPLE BLADE ACCESSORY FOR A FOOD PROCESSOR
    81.
    发明公开
    A MULTIPLE BLADE ACCESSORY FOR A FOOD PROCESSOR 审中-公开
    随着对食品加工多个刀片配件

    公开(公告)号:EP2155027A1

    公开(公告)日:2010-02-24

    申请号:EP08748037.2

    申请日:2008-06-04

    CPC分类号: A47J43/0722

    摘要: A multiple blade accessory device for a food processor is provided. The accessory has a hollow hub that is adapted to carry a pair of lower blades and a pair of upper blades. The lower blades and the upper blades being similar, each formed from a single blank. Each blank is formed to present two cutting edges, diametrically opposed. The upper blade pair is moulded into a separate sleeve. The hub is adapted to be assembled with the sleeve.

    INSTRUMENT AND METHOD FOR BREAKING-UP SAMPLE
    83.
    发明授权
    INSTRUMENT AND METHOD FOR BREAKING-UP SAMPLE 有权
    仪器及技术切割用样品

    公开(公告)号:EP1721140B1

    公开(公告)日:2008-10-01

    申请号:EP04801920.2

    申请日:2004-12-17

    IPC分类号: G01N1/28 B01L3/14

    CPC分类号: G01N1/286

    摘要: The present invention provides a sample breaking-up instrument and a method thereof, in which a pressing member is pressed by a centrifugal force against a sample within a cylindrical body provided with a filter member to thereby break-up the sample safely and efficiently. Provided is an instrument for breaking-up a sample, comprising: a cylindrical body having a through hole opening in both ends thereof; a filter member installed in one end of said cylindrical body within said through hole; and a pressing member to be operatively inserted into said hole of said cylindrical body from the other end thereof so as to be slidable therethrough in a sealed manner, wherein a force is exerted on said pressing member so that said pressing member presses said sample placed between said pressing member and said filter member against said filter member and thereby said sample is forced to pass through said filter member and is thus broken-up.

    PROBE FOR AN ATOMIC FORCE MICROSCOPE
    86.
    发明公开
    PROBE FOR AN ATOMIC FORCE MICROSCOPE 审中-公开
    SONDEFÜREIN ATOMKRAFTMIKROSKOP

    公开(公告)号:EP1644937A1

    公开(公告)日:2006-04-12

    申请号:EP04743406.3

    申请日:2004-07-15

    IPC分类号: G12B21/08 G12B21/02 G12B21/20

    CPC分类号: G01Q60/38 G01Q70/14

    摘要: A probe (22) for an atomic force microscope is adapted such that, as a sample (14) is scanned, it experiences a biasing force Fdirect urging the probe towards the sample. This improves probe tracking of the sample surface and faster scans are possible. This is achieved by either including a biasing element (24, 50), which is responsive to an externally applied force, on the probe (22) and / or reducing the quality factor of a supporting beam. The biasing element may, for example, be a magnet (24) or an electrically-conducting element (50). The quality factor may be reduced by coating the beam with a mechanical-energy dissipating material.

    摘要翻译: 用于原子力显微镜的探针被适配成使得当扫描样品时,其经历将探针推向样品的偏压力。 这可以改善样品表面的探针跟踪,并且可以进行更快的扫描。 这可以通过在探针上包括对外部施加的力作出反应的偏置元件和/或降低支撑梁的品质因子来实现。 该偏置元件可以是例如磁体或导电元件。 通过用机械能量消散材料涂覆光束可以降低品质因数。

    SEAL CUP FOR A WELLBORE TOOL AND METHOD
    87.
    发明公开
    SEAL CUP FOR A WELLBORE TOOL AND METHOD 审中-公开
    密封罩的坑井工具和手段

    公开(公告)号:EP1581720A1

    公开(公告)日:2005-10-05

    申请号:EP03778206.7

    申请日:2003-12-08

    申请人: Tesco Corporation

    IPC分类号: E21B33/126

    摘要: A seal cup and method is disclosed that can be used on a wellbore tool. The seal cup includes an external circumferential seal land adjacent the cup lip and an outer surface capable of permitting drainage away from the seal land of fluids, which may seep past the seal land. This acts against pressure invasion in the interfacial contacting region between the seal cup and the structure, for example, a wellbore liner against which it is sealed.

    LOAD-INDICATING FASTENER
    89.
    发明公开
    LOAD-INDICATING FASTENER 审中-公开
    固定元件与影响指标

    公开(公告)号:EP1509703A1

    公开(公告)日:2005-03-02

    申请号:EP02767622.0

    申请日:2002-09-03

    IPC分类号: F16B31/02

    CPC分类号: F16B31/025 G01L5/24

    摘要: A load-indicating fastener makes use of a probe attachment which is locatable within a bore hole (20) made in the fastener. The attachment includes a sensor (52) with sensing surface (58) located at one end and can be secured to the fastener at or near its opposite end. When secured, an air gap (28) is left between the sensing surface (58) and an internal surface (22) of the bore hole. This arrangement of surfaces (22, 58) with air gap (28) effectively defines a capacitor which is sealed within the fastener. When the fastener is loaded, an elastic displacement occurs between the two surfaces (22, 58), which changes the capacitance of the capacitor. Electric cabling (34) is provided for supply and extraction of signals that enable measurement of a parameter indicative of capacitive reactance across this capacitor. This measurement provides an indication of strain experienced by the fastener.

    SCANNING NEAR-FIELD OPTICAL MICROSCOPE
    90.
    发明授权
    SCANNING NEAR-FIELD OPTICAL MICROSCOPE 有权
    近场

    公开(公告)号:EP1360538B1

    公开(公告)日:2004-11-10

    申请号:EP02711015.4

    申请日:2002-02-06

    IPC分类号: G02B21/00 G01B11/30 G01N21/59

    CPC分类号: G01Q60/22 G01B9/04

    摘要: A scanning near-field optical microscope detects the evanescent field formed about an illuminated sample (14) via an interaction between the field and a local probe (20). The probe (20) is scanned across the sample surface in order to collect a complete image as a succession of scan lines. In the microscope of this invention, image collection is more rapidly performed by translating the probe (20) whilst it is oscillated at or near its resonance frequency. In this way a series of scan lines covering an area of the sample surface are rapidly collected, the length of each scan line being determined by oscillation amplitude.