APPARATUS AND METHOD FOR PROVIDING MARKS ON EXTRUDED FILMS

    公开(公告)号:EP4219118A3

    公开(公告)日:2023-09-06

    申请号:EP23152058.6

    申请日:2014-08-13

    摘要: The invention relates to an apparatus for providing marks on extruded films, in particular on stretched films, which are exiting an extrusion lip of a film extruder and a respective method. The apparatus comprises at least one nozzle means for directing a gas stream, preferably an air stream to a surface of the film exiting the extrusion lip of the film extruder, wherein the nozzle means are configured and arranged in such a manner that the gas stream locally causes a cooling of the extruded film to create a local mark

    APPARATUS AND METHOD FOR PROVIDING MARKS ON EXTRUDED FILMS

    公开(公告)号:EP4219118A2

    公开(公告)日:2023-08-02

    申请号:EP23152058.6

    申请日:2014-08-13

    摘要: The invention relates to an apparatus for providing marks on extruded films, in particular on stretched films, which are exiting an extrusion lip of a film extruder and a respective method. The apparatus comprises at least one nozzle means for directing a gas stream, preferably an air stream to a surface of the film exiting the extrusion lip of the film extruder, wherein the nozzle means are configured and arranged in such a manner that the gas stream locally causes a cooling of the extruded film to create a local mark

    DEVICE FOR THE DIRECT DETECTION OF PRESSURE VARIATIONS OF A FLUID IN A BODY CAVITY

    公开(公告)号:EP4205634A1

    公开(公告)日:2023-07-05

    申请号:EP21218308.1

    申请日:2021-12-30

    IPC分类号: A61B3/16 A61F9/007

    摘要: A direct detection device of pressure variations of a fluid within a body cavity comprises a pressure transducer, pressure transmission means which extend between a distal tip suitable for partial insertion into the body cavity and a proximal port in direct contact with the sensitive surface of the pressure transducer. The distal tip is suitable to form an access port which places the pressure transducer outside the body cavity into direct fluid communication with the inside of the body cavity. The pressure transmission means comprise, between the distal tip and the proximal port, a flexible cannula having a length sufficient to allow the anchoring of an intermediate stretch of the flexible cannula and/or the pressure transducer to an anchoring zone distant from the body cavity.

    Apparatus and process for measuring the thickness of electrically non conductive and non ferromagnetic materials in the form of films, webs and the like
    5.
    发明授权
    Apparatus and process for measuring the thickness of electrically non conductive and non ferromagnetic materials in the form of films, webs and the like 有权
    用于测量膜,网等形式的不导电和非铁磁材料厚度的装置和方法

    公开(公告)号:EP1947416B1

    公开(公告)日:2018-02-07

    申请号:EP08000902.0

    申请日:2008-01-18

    IPC分类号: G01B7/06 G01B13/06

    CPC分类号: G01B7/06 G01B2210/42

    摘要: There are disclosed herein an apparatus (1) and a process for measuring the thickness of an electrically non-conductive, non-ferromagnetic film or web material (2), comprising: - a roll (3) having a metal surface (31); - a measuring head (4) that defines, in combination with the roll (3), a gap for the passage of the electrically non-conductive and non-ferromagnetic film or web material (2), having a top surface (21) facing towards said measuring head (4) and spaced therefrom, and a bottom surface (22) in contact with said metal surface (31), said measuring head (4) having a first measuring device (41) and a second measuring device (42) which operate in two coaxial regions in space, so that measurements thereof relate to a common measurement axis (X), said first measuring device (41) being an induction device (41), adapted to measure the distance of a measuring point (x1) on said metal surface (31) of said roll (3) as an electrically non-conductive, non-ferromagnetic web or a film material (2) is fed in said gap (5), said second device (42) being adapted to measure the distance of a measuring point (x2) on the top surface (21) of a web or film material (2) which passes through said gap (5), said first and second measuring devices (41, 42) being integrally formed, which comprises a device (6, 63, 64) for driving a metal screen (7) between a first position, in which said screen (7) is interposed between said measuring head (4) and said roll (3) and a second position, in which said screen (7) is not interposed between said measuring head (4) and said roll (3), means (81, 82) for adjusting the distance between said metal screen (7) and said measuring head (4) along said measuring axis (31) of said roll (3).

    APPARATUS AND METHOD FOR AUTOMATICALLY ANALYZING EXTRUDED FILMS
    6.
    发明公开
    APPARATUS AND METHOD FOR AUTOMATICALLY ANALYZING EXTRUDED FILMS 审中-公开
    DEVICE AND METHOD FOR挤出淋膜自动分析

    公开(公告)号:EP3033210A1

    公开(公告)日:2016-06-22

    申请号:EP14761962.1

    申请日:2014-08-13

    发明人: MARTENA, Florinda

    IPC分类号: B29C47/16 B29C47/92 B29C47/88

    摘要: The invention relates to an apparatus (20) for automatically analyzing extruded films, in particular stretched films (7), wherein a neck-in portion is formed at each of both edges of the film at a specific distance from an extrusion lip of a film extruder along the longitudinal transport direction of the film, and a respective method. The apparatus comprises two edge detectors (31a, 31b) being arranged along a first line substantially transversal to the longitudinal direction and being spaced from each other by a specific distance, wherein each one edge detector (31a, 31b) is configured to detect, preferably to continuously detect the lateral position of one respective edge of the neck-in portion of the film, a calculation means for determining the spatial relation between at least one lateral position at the extrusion lip and a respective lateral position at the neck-in portion on the basis of the two lateral positions of the edges of the neck-in portion of the film.

    Apparatus and process for measuring the thickness of electrically non conductive and non ferromagnetic materials in the form of films, webs and the like
    7.
    发明公开

    公开(公告)号:EP1947416A3

    公开(公告)日:2014-07-23

    申请号:EP08000902.0

    申请日:2008-01-18

    IPC分类号: G01B7/06 G01B13/06

    CPC分类号: G01B7/06 G01B2210/42

    摘要: There are disclosed herein an apparatus (1) and a process for measuring the thickness of an electrically non-conductive, non-ferromagnetic film or web material (2), comprising:
    - a roll (3) having a metal surface (31);
    - a measuring head (4) that defines, in combination with the roll (3), a gap for the passage of the electrically non-conductive and non-ferromagnetic film or web material (2), having a top surface (21) facing towards said measuring head (4) and spaced therefrom, and a bottom surface (22) in contact with said metal surface (31), said measuring head (4) having a first measuring device (41) and a second measuring device (42) which operate in two coaxial regions in space, so that measurements thereof relate to a common measurement axis (X), said first measuring device (41) being an induction device (41), adapted to measure the distance of a measuring point (x1) on said metal surface (31) of said roll (3) as an electrically non-conductive, non-ferromagnetic web or a film material (2) is fed in said gap (5), said second device (42) being adapted to measure the distance of a measuring point (x2) on the top surface (21) of a web or film material (2) which passes through said gap (5), said first and second measuring devices (41, 42) being integrally formed, which comprises a device (6, 63, 64) for driving a metal screen (7) between a first position, in which said screen (7) is interposed between said measuring head (4) and said roll (3) and a second position, in which said screen (7) is not interposed between said measuring head (4) and said roll (3), means (81, 82) for adjusting the distance between said metal screen (7) and said measuring head (4) along said measuring axis (31) of said roll (3).

    Process and device for contactless measurement of the thickness of non-metallic films by using an infrared semiconductor emitter
    10.
    发明公开
    Process and device for contactless measurement of the thickness of non-metallic films by using an infrared semiconductor emitter 审中-公开
    用于由半导体红外线辐射源来测量非金属层的厚度的方法和装置

    公开(公告)号:EP1271096A1

    公开(公告)日:2003-01-02

    申请号:EP01830405.5

    申请日:2001-06-18

    IPC分类号: G01B11/06

    CPC分类号: G01B11/06 G01B11/0633

    摘要: Described herein is an apparatus for carrying out a process for contactless measurement of the thickness of non-metallic films or laminates (4) comprising the steps of:

    emitting infrared radiation pulse-modulated in the 1-6 µm range;
    directing said at least one infrared radiation towards a non-metallic film material (4);
    measuring the amount of said modulated infrared radiation, in at least two sub-bands of the 1-6 µm range, which traverses or is reflected or diffused by said film material (4), said measurement being performed in synchronism with the emission of said infrared radiation; and
    generating an electrical signal proportional to the ratio between the intensity of the infrared radiation in said at least two sub-bands (3);
    where the modulated infrared radiation is obtained by modulating a semiconductor device (2) electronically.

    摘要翻译: 在描述了一种用于执行用于非金属薄膜或层压材料(4)的厚度的非接触式测量的方法,包括以下步骤的装置:发射红外辐射脉冲调制在1-6微米范围内; 所述朝向非金属材料膜(4)将至少一个红外辐射; 测量调制的所述红外辐射的量,在1-6微米范围内,这横穿或反射或由所述电影材料扩散的至少两个子带(4),所述正在执行同步地的发射测量 所述红外辐射; 和成比例的电信号中。所述的红外辐射的强度之间的比率产生至少两个子频带(3); 其中调制的红外辐射被调制的半导体装置(2)电子方式获得程序。