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1.发明公开COLUMNAR STRUCTURE, METHOD FOR THE PRODUCTION THEREOF AND DEVICES BASED THEREON 审中-公开柱状结构，制造方法和机构你的基地
公开(公告)号：EP1801840A4
公开(公告)日：2010-06-02
申请号：EP05798720
申请日：2005-09-20
CPC分类号： G01T1/202 , C09K11/616 , G21K4/00
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2.发明公开COLUMNAR STRUCTURE, METHOD FOR THE PRODUCTION THEREOF AND DEVICES BASED THEREON 审中-公开柱状结构，制造方法和机构你的基地
公开(公告)号：EP1801840A2
公开(公告)日：2007-06-27
申请号：EP05798720.8
申请日：2005-09-20
IPC分类号： H01J29/18
CPC分类号： G01T1/202 , C09K11/616 , G21K4/00
摘要： The invention relates to lighting engineering, microelectronic components and to electronic and electromagnetic material science. Said invention makes it possible to increase phosphor conversion efficiency, reduce the cost of the structure production and to improve consumer properties of devices based thereon. The inventive method consists in using columnar structures made of suitable materials, wherein spaces between such structures remain transparent for luminescence exciting particles and the light-guiding properties of the columnar structures ate preserved. The resuh is attained by involving the part of the side surfaces of the columnar structures in particle absorption. A method for producing columnar structures and the production of cathodoluminescent screens, light sources. X-ray image converters and optical dosimeters based on said structures are also disclosed.
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3.发明公开SUBSTRATE FOR CARRYING METHOD FOR COMPREHENSIVELY ACTING WITH MATERIALS, METHOD FOR PRODUCING SAID SUBSTRATE, METHOD FOR PRODUCING A MATERIAL ON A SUBSTRATE AND A DEVICE FOR OPERATING THEREWITH 审中-公开基板实施程序与对提供全面的材料，方法用于制造这种基板制造方法材料上使用为了基板和法处理
公开(公告)号：EP1855098A1
公开(公告)日：2007-11-14
申请号：EP06716844.3
申请日：2006-01-20
CPC分类号： G01N1/2813
摘要： The invention relates to the structural design of a substrate for specimens, to a method for the production thereof and to a device based thereon. The inventive substrate structural design makes it possible to carry out a method for comprehensively investigating thin films consisting in forming a thin-film specimen on a specifically constructed specimen table, which enables to prepare such a specimen and to carry out subsequent operations for the investigation thereof. In particular for investigating a given specimen, said method makes it possible to use devices such as optical, atomic-force and optical near field microscopes, an analyser based on an X-rayogram obtainable by means of a synchrotron radiation, transmission and scanning (raster) electron microscopes, etc., thereby making it possible to identify the concrete investigated specimen areas while the transfer thereof from one device to another one
摘要翻译： 本发明涉及一种用于检体的基片的结构设计，用于生产它们的方法，以及基于其的设备。 本发明的基板结构的设计使得它能够进行为全面调查薄膜在对某特定构造的样品台，这使得能够制备寻求试样并涉及其进行后续操作的调查形成的薄膜样品由方法 ， 特别是用于研究给定样本，所述方法使得有可能使用的设备：诸如光学，原子力和光学近场显微镜，（在分析仪通过同步加速器辐射，传输和扫描光栅的方式在X-rayogram可获得的基于 ）电子显微镜等，从而使得可以识别混凝土试样调查地区而从一个设备其转移到另一个
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4.发明公开TIP STRUCTURE FOR SCANNING DEVICES, METHOD OF ITS PREPARATION AND DEVICES THEREON 审中-公开上部结构为扫描仪，用于生产的事实和机构
公开(公告)号：EP1782432A1
公开(公告)日：2007-05-09
申请号：EP05759618.1
申请日：2005-05-30
摘要： The design of a probe and an instrument on its basis suggested in the present invention solve near-field optical microscopy and near-field infrared microscopy problems. Also the new method of probe manufacture suggested in this invention allows one to considerably reduce the cost of the final product and, thus, considerably increase the number of its possible users. The probe design suggested in this invention and the instrument based on these probes allow one to optically record and read the information and also to perform lithography works, in particular, the works with exposure of a photoresist at a nanometer resolution.
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5.发明公开
公开(公告)号：EP1190206A2
公开(公告)日：2002-03-27
申请号：EP00935762.5
申请日：2000-05-31
CPC分类号： G01Q70/16 , G01Q70/12 , H01J1/3042 , H01J2201/319
摘要： New designs of electron devices such as scanning probes and field emitters based on tip structure are proposed. The tips are prepared from whiskers that are grown from the vapor phase by the vapo-liquid-solid technology. The tip structure includes a single crystalline substrate and a single crystalline tip. The axes of the tip forms a given angle in respect to the vertical that passes through its basis.
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