ALKALI METAL ANODE
    3.
    发明公开
    ALKALI METAL ANODE 审中-公开

    公开(公告)号:EP4106036A1

    公开(公告)日:2022-12-21

    申请号:EP21179327.8

    申请日:2021-06-14

    摘要: The present invention relates to a composite material (1) comprising a Na alloy (2) and a fluoropolymer (3). This comprises a Na alloy (2) comprising Na as a first constituent and one of K, Li, Se, Sb, Sn and Bi as a second constituent. The composite material (1) comprising Na originating from the Na alloy (2) cross-linked with F originating from the fluoropolymer (3) such that a solid electrolyte interphase (17) is formed within the composite material (1). In the Na alloy (2) the first constituent is present in at least 60 mol % and the second constituent is present in at most 40 mol %. The present invention further relates to an anode (6), a battery (9) and methods (10, 20, 30) for producing said composite material (1) and said anode (6).

    TAGGING OF AN OBJECT
    4.
    发明公开

    公开(公告)号:EP3699856A1

    公开(公告)日:2020-08-26

    申请号:EP19158449.9

    申请日:2019-02-21

    IPC分类号: G06Q30/00

    摘要: The present invention relates to a method for tagging an object (101). The method comprising: measuring a physical characteristic pertaining to the object (101); determining an object reference unique identification (105) from the physical characteristic pertaining to the object (101); generating a cipher (108) using an encryption algorithm (107) having the object reference unique identification (105) as input data; tagging the object (101) with the cipher (108); and registering the cipher (108) and a key (110) for decrypting the cipher (108) in a ledger (111).

    A MATERIAL STRUCTURE FOR A SOLAR CELL, A SOLAR CELL AND A METHOD FOR MANUFACTURING A MATERIAL STRUCTURE
    6.
    发明公开
    A MATERIAL STRUCTURE FOR A SOLAR CELL, A SOLAR CELL AND A METHOD FOR MANUFACTURING A MATERIAL STRUCTURE 审中-公开
    太阳能电池的材料结构,太阳能电池及制造材料结构的方法

    公开(公告)号:EP3281232A1

    公开(公告)日:2018-02-14

    申请号:EP16714907.9

    申请日:2016-04-07

    IPC分类号: H01L31/0224

    摘要: The present invention relates to a material structure for a solar cell and a method for manufacturing the material structure. A solar cell comprising the material structure is also disclosed. The material structure (100) comprising, a light absorbing layer (102), a metal layer (104), a passivation layer (106) arranged in between the light absorbing layer (102) and the metal layer (104), the passivation layer (106) comprising a plurality of electrical contacts (108), the electrical contacts (108) extending from a top surface (110) to a bottom surface (112) of the passivation layer (106) such that the electrical contacts (108) are in galvanic contact with the light absorbing layer (102) and the metal layer (104).

    METHOD FOR VALIDATING A RESONATOR
    7.
    发明公开
    METHOD FOR VALIDATING A RESONATOR 审中-公开
    验证谐振器的方法

    公开(公告)号:EP3258239A1

    公开(公告)日:2017-12-20

    申请号:EP16179080.3

    申请日:2016-07-12

    IPC分类号: G01N11/16

    CPC分类号: G01N11/16 G01N2291/02818

    摘要: Method for validating a resonator. The method comprises: providing a first set of resonator responses of the resonator pertaining to a first validation fluid, contacting the resonator and a second validation fluid, wherein the first and the second validation fluids have different viscoelastic properties, obtaining in contact with the second validation fluid a second set of resonator responses of the resonator, wherein each resonator response pertains to a resonance frequency or a dissipation of the resonator, validating the resonator by comparing a first and a second value, the first value being obtained from at least one resonator response of the first set of resonator responses and at least one resonator response from the second set of resonator responses, the second value being based on a relationship between frequency or dissipation responses of the resonator and a function of the viscoelastic properties of the first and the second validation fluid.

    摘要翻译: 验证谐振器的方法。 该方法包括:提供与第一验证流体有关的谐振器的第一组谐振器响应,接触谐振器和第二验证流体,其中第一和第二验证流体具有不同的粘弹性特性,获得与第二验证 使谐振器的第二组谐振器响应流体化,其中每个谐振器响应与谐振器的谐振频率或耗散有关,通过比较第一和第二值来验证谐振器,第一值从至少一个谐振器响应 所述第一组谐振器响应和来自所述第二组谐振器响应的至少一个谐振器响应,所述第二值基于所述谐振器的频率或耗散响应与所述第一组和第二组的粘弹性性质的函数之间的关系 验证液。

    ELECTRODE MATERIAL
    8.
    发明公开
    ELECTRODE MATERIAL 审中-公开
    电极材料

    公开(公告)号:EP3170921A1

    公开(公告)日:2017-05-24

    申请号:EP15195667.9

    申请日:2015-11-20

    IPC分类号: C25B11/03 C25B11/04 C25B1/04

    摘要: The present invention relates to a self supporting electrode material suitable for hydrogen and oxygen evolution reactions. The self supporting electrode material comprises a porous core material and a coating material, wherein the porous core material comprises carbon, and the coating material comprises transition metal phosphide. The present invention further relates to a system for water electrolysis, and a method for manufacturing a self supporting electrode material.

    摘要翻译: 本发明涉及适用于氢气和氧气放出反应的自支撑电极材料。 自支撑电极材料包括多孔芯材料和涂层材料,其中多孔芯材料包含碳,并且涂层材料包含过渡金属磷化物。 本发明还涉及用于水电解的系统和用于制造自支撑电极材料的方法。

    METHOD AND DEVICE FOR MEASURING THICKNESS OF A FLUORESCENT LAYER

    公开(公告)号:EP3964791A1

    公开(公告)日:2022-03-09

    申请号:EP20204202.4

    申请日:2020-10-27

    IPC分类号: G01B11/06 G01B9/04 G01B11/24

    摘要: Method for direct measurement of thickness or topography of a structure or layer in respect of a nearfield photoluminescence quenching layer, by using time-resolved photoluminescence microscopy lifetime imaging, for measuring quenching of photoluminescence lifetime caused by nonradiative energy transfer, from the photoluminescent layer, acting as an energy donor layer, to the quenching layer, acting as nonradiative energy acceptor layer, comprising the steps of:
    illuminating a portion of a sample having a quenching layer and a photoluminescent layer with variable-thickness, with an excitation light source for obtaining photoluminescence emission,
    measuring the photoluminescence emission for obtaining the time-resolved photoluminescence and determine the photoluminescence lifetime from the time-resolved photoluminescence;
    determining the thickness of the photoluminescent layer from the determined photoluminescence lifetime.