摘要:
The invention relates to an ablative production device and method for a periodic line structure on a workpiece (108). The device comprises a pulsed laser (109) for generating ablative light (110), a phase mask (102) arranged in the beam path of the ablative light (110), imaging optics (104) arranged on an optical axis (101), and a holder (106) to hold the workpiece (108) in an image plane (107). The phase mask (102) produces a plurality of equidistant parallel lines (112) in an object plane (103) by interference and suppresses an order of diffraction parallel to the optical axis (101). The optical axis (101) is perpendicular to the object plane (103). The imaging optics (104) comprises a cylindrical lens which is aligned in parallel to the lines (112) and is designed to image the object plane (103) into the image plane (107).
摘要:
To achieve multidimensional high-resolution imaging of a structure of a sample, marked with fluorescent markers, the following steps are repeated for a plurality of measurement regions (18) in said sample: fluorescence-enabling light (3) is focussed into the sample (4), wherein the region illuminated in the sample (4) by the fluorescence-enabling light (3) constitutes the measurement region (18) in question; fluorescence-hindering light (10) is applied to a subsection (20) of the measurement region (18) wherein, since an intensity distribution of the fluorescence-hindering light (10) has a linear or planar zero position (21) that extends across a centre (22) of the measurement region (18), this subsection (20) does not include said centre (22); a minimum extension (23) of the zero position (21) through the centre (22) of the measurement region (18) is smaller, by a factor of k ≥ 2, than a diameter (19) of the measurement region (18) in the same direction; and fluorescent light emitted from the measurement region (18) of the sample is measured without spatial resolution within the measurement region (18) for a plurality of successive angular positions of the zero position (21) around the centre (22), the fluorescence-enabling light (3) being applied to said measurement region (18) for each of the angular positions of the zero position (21).
摘要:
The invention relates to a method and a device for modifying in a spatially periodic manner at least in some regions a surface of a substrate (24), said surface being disposed on a sample plane (P). To that end, different regions of the substrate surface are acted upon successively with a spatially periodic illumination pattern of an energy density above a processing threshold of the substrate surface. The illumination pattern is generated by diffraction of an input beam (10) and superimposition of resulting, diffracted sub-beams (10a, 10b, 10c; 10a', 10b', 10c') by means of a grid interferometer (100). In order to select the substrate surface region to be illuminated in each case, the input beam (10) is deviated by means of an F-theta lens (22) and a beam-deviating unit (16) arranged upstream of the grid interferometer (100).
摘要:
Bei einem Verfahren zum Messen von emittierenden flüchtigen Stoffen aus Holzwerkstoffen, insbesondere von Formaldehyd, ist vorgesehen, dass von einem Holzwerkstoff einige Partikel (5) als Messproben entnommen werden und diese ionenmobilitätsspektrometrisch untersucht werden.
摘要:
Disclosed is a method for producing an optical component, e.g. a four-stage diffractive phase element (6), for electromagnetic radiation by means of laser machining. According to said method, the applied wavelength of the electromagnetic radiation used can be selected independently of the machining wavelength of the laser radiation. The inventive method allows single-stage or multistage profiles to be produced on the component while being useable in a flexible manner on different components, the front face and/or the rear face thereof being optionally machinable. In order to create a staggered component (6) profile (8), a machining cycle is carried out several times, each machining cycle comprising a deposition step in which an absorption layer (2, 2', 2') that absorbs the machining wavelength in a raw state is applied to a substrate element (1) transparent for the machining wavelength range, and an ablation step in which the applied absorption layer (2, 2', 2') is ablated at least across some of the layer thickness at the irradiated points. Furthermore, a material transformation step in which the created profile (8) is transformed into a final state that is transparent for the applied wavelength range is carried out at least once.
摘要:
The invention relates to the identifying of not easily volatilized substances, in particular hazardous materials, in a gas phase. A measurement cell (2) and a gas supply device (14) connected to the measurement cell (2) are heated and a plasmonic surface (1) arranged in the measurement cell (2) is temperature-controlled such that the plasmonic surface (1) has a lower temperature than the measurement cell (2) and the gas supply device (14). The gas phase is guided through the gas supply device (14) into the measurement cell (2) in such a manner that the gas phase reaches the temperature-controlled plasmonic surface (1). Substances adsorbed from the gas phase on the plasmonic surface (1) are analyzed by an optical process. Surface-enhanced Raman spectroscopy or surface-enhanced infrared spectroscopy can be used as the optical process. Selectivity can be increased by combining both methods. Selectivity can be additionally increased by using a gas detector, preferably an ion-mobility spectrometer, along with one or both optical processes, and thus the false alarm rate reduced without loss of time.
摘要:
Die Erfindung bezieht sich auf ein Verfahren zur Erzeugung überwölbter Mikrostrukturen (22, 22'), umfassend die Schritte: - Bereitstellen eines Trägersubstrats (10), auf dem eine zu strukturierende Hartschicht (12) und darüber eine Confinement-Schicht (14) aufgebracht ist, - Bestrahlen der Hartschicht (12) mit einem Strukturierungs-Puls räumlich mikrostrukturierten Laserlichtes einer vorbestimmten Strukturierungs-Fluenz und einer Strukturierungs-Wellenlänge, für die die Hartschicht (12) einen Absorptionskoeffizienten von mindestens 10 4 cm -1 hat,. Die Erfindung zeichnet sich dadurch aus, dass die Schichtdicke der Hartschicht kleiner ist als die Energiewirkungstiefe des Strukturierungs-Pulses und das Verhältnis der Strukturierungs-Fluenz zur Schichtdicke der Hartschicht dem 2- bis 10-fachen des Verhältnisses der Aufschmelzmindestfluenz der Hartschicht zur Energiewirkungstiefe entspricht, wobei die Aufschmelzmindestfluenz diejenige Fluenz ist, die erforderlich ist, um mit einem ansonsten gleichartigen Laserpuls eine ansonsten gleichartige Hartschicht, deren Schichtdicke der Energiewirkungstiefe entspricht, bis zu deren Schmelztemperatur zu erwärmen.
摘要翻译:本发明涉及一种用于制造拱形微结构(22,22“),包括以下步骤: - 提供支撑基板(10),其上是要被图案化硬质层(12),并且还施加的限制层(14) - 照射所述硬层(12)配有一个纹理化脉冲的预定图案形成的微结构化空间激光,和图案化通量波长其中硬层(12)具有至少10 4 cm -1以下的吸收系数。 本发明的特征在于,所述硬质层的层厚度小于所述纹理化脉冲的冲击深度的能量和图案化能量密度的硬质层的层厚度的对应于硬质保护膜的Aufschmelzmindestfluenz的比率的2至10倍至动作的能量深度的比率,其中 的Aufschmelzmindestfluenz是注量是必需的,在其他方式类似的硬质层的其他方面相同的激光脉冲,其层厚度相当于动作的能量深度加热到其熔化温度。