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1.发明公开CONTACTLESS COMPONENT-INSPECTING APPARATUS AND COMPONENT-INSPECTING METHOD 审中-公开KONTAKTLOSEKOMPONENTENPRÜFVORRICHTUNGUNDKOMPONENTENPRÜFVERFAHREN
公开(公告)号：EP2752638A2
公开(公告)日：2014-07-09
申请号：EP12836154.0
申请日：2012-09-26
申请人： Mirtec Co., Ltd.
CPC分类号： G01N21/8803 , G01N21/95684 , G01N2021/95646 , G06T7/0004 , H05K13/08
摘要： According to one aspect of the present invention, a contactless component-inspecting apparatus captures, using a camera, images of an object to be inspected that is assembled or mounted during a component assembly process and compares the captured image and a previously inputted image to determine whether the object passes or fails the inspection. The contactless component-inspecting apparatus comprises: a stage unit on which the object to be inspected is mounted, and which fixes or transfers the object to be inspected in/to an inspection location; a lighting unit including a color lighting portion for irradiating the object to be inspected with at least four types of visual light having different wavelength ranges, wherein a first white lighting portion is arranged on the color lighting portion so as to irradiate the object to be inspected with white light, and a second white lighting portion arranged beneath the color lighting portion so as to irradiate the object to be inspected with white light; a camera arranged above the lighting unit so as to capture images of the object to be inspected; an image-processing unit which reads the image captured by the camera so as to determine whether the object to be inspected passes or fails the inspection; and a control unit including a motion controller for controlling the stage unit and the camera unit.
摘要翻译： 根据本发明的一个方面，非接触式部件检查装置使用相机拍摄在部件组装过程中组装或安装的待检查对象的图像，并将拍摄图像与先前输入的图像进行比较，以确定 对象是否通过或检查失败。 非接触式部件检查装置包括：安装有检查对象的台单元，将检查对象固定或传送到检查位置; 照明单元，其包括用至少四种具有不同波长范围的视觉光照射被检查物体的颜色照明部分，其中第一白色照明部分布置在彩色照明部分上以照射被检查物体 以及设置在彩色照明部下方的第二白色照明部，以照射被检查物体的白光; 布置在照明单元上方的照相机，以捕获待检查对象的图像; 图像处理单元，其读取由所述照相机拍摄的图像，以便确定所述待检查对象是否通过或不通过所述检查; 以及包括用于控制舞台单元和相机单元的运动控制器的控制单元。
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2.发明公开CONTACTLESS COMPONENT-INSPECTING APPARATUS AND COMPONENT-INSPECTING METHOD 审中-公开非接触KOMPONENTENPRÜFVORRICHTUNG及部件检查服务
公开(公告)号：EP2752638A4
公开(公告)日：2015-07-08
申请号：EP12836154
申请日：2012-09-26
申请人： MIRTEC CO LTD
IPC分类号： G01N21/956 , G01B11/30 , H05K13/08
CPC分类号： G01N21/8803 , G01N21/95684 , G01N2021/95646 , G06T7/0004 , H05K13/08
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公开(公告)号：EP1509777A1
公开(公告)日：2005-03-02
申请号：EP03721116.6
申请日：2003-04-26
申请人： Mirtec Co., Ltd.
IPC分类号： G01R31/309 , G01R31/26 , H01L21/60 , G01N21/956
CPC分类号： H05K13/08 , G09B19/00 , G09B23/183
摘要： The present invention relates to an automatic teaching method for a circuit board inspection system and comprises a data transform step of transforming mounter data into data file for teaching; a coordinate transform step of corresponding coordinates for data for teaching transformed through the data transform step with inspection system coordinates; and a teaching step of programming contents to be inspected based on data for teaching such as part coordinates, part names, reference names and part angles that are formed through the data transform step and coordinate transform step.An automatic teaching method for a circuit board inspection system according to the present invention not only completes teaching operation within a short period of time, but also substantially reduces set up time for a new circuit substrate by enabling automatic teaching utilizing mounter data of parts mounted on a forgoing actual circuit substrate.
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公开(公告)号：EP4372310A1
公开(公告)日：2024-05-22
申请号：EP23209635.4
申请日：2023-11-14
发明人： Kim, Min Hyuk , Cho, Hyeongjun
IPC分类号： G01B11/25
CPC分类号： G01B11/2504 , G01B11/2545
摘要： Disclosed is a three-dimensional (3D) calibration method and device for multi-view phase shift profilometry. A 3D calibration method for multi-view phase shift profilometry, performed by a computer device, according to an example embodiment may include acquiring a phase that is data required for 3D reconstruction from parameters of at least one camera and a projector based on a phase measuring profilometry (PMP) method; defining a phase-to-depth function for each camera-and-projector combination and performing calibration of optimizing the parameters of the camera and the projector; and acquiring a point cloud that includes depth information using the optimized parameters of the camera and the projector.
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公开(公告)号：EP1509777B1
公开(公告)日：2010-09-22
申请号：EP03721116.6
申请日：2003-04-26
申请人： Mirtec Co., Ltd.
IPC分类号： G01R31/309 , G01R31/26 , H01L21/60 , G01N21/956
CPC分类号： H05K13/08 , G09B19/00 , G09B23/183
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公开(公告)号：EP1559304A4
公开(公告)日：2007-08-01
申请号：EP03748763
申请日：2003-09-29
申请人： MIRTEC CO LTD
发明人： JEONG JOON-YOUNG
IPC分类号： G01N21/956 , G01R31/309 , H05K13/04 , H05K13/08
CPC分类号： H05K13/08 , G01N21/95684 , G01R31/309
摘要： The present invention relates to a vision inspection apparatus and method using total reflection mirrors. The present invention provides a vision inspection apparatus using the total reflection mirrors comprising; a board position control module for fixing a printed circuit board; an independent lighting unit for primarily illuminating the printed circuit board; a photographing position control module for changing a reflection angle to required location coordinates of the printed circuit board; a camera for obtaining an image of the printed circuit board; a control unit including a motion controller, a lighting controller, and an to image processor to control the components; and a vision processing unit for reading the image obtained through the camera and judging whether the image is good or bad. The present invention has effects capable of obtaining a clear image of inspection objects by increasing a quantity of light entered into the camera through a stationary direct illuminating type of independent lighting unit, and accomplishing a precise inspection by preventing shadows from generating on the vision inspection of the object such as a printed circuit board on which different sizes of components are mounted.
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公开(公告)号：EP1559304A1
公开(公告)日：2005-08-03
申请号：EP03748763.4
申请日：2003-09-29
申请人： Mirtec Co., Ltd.
发明人： JEONG, Joon-Young
IPC分类号： H05K13/08
CPC分类号： H05K13/08 , G01N21/95684 , G01R31/309
摘要： The present invention relates to a vision inspection apparatus and method using total reflection mirrors. The present invention provides a vision inspection apparatus using the total reflection mirrors comprising; a board position control module for fixing a printed circuit board; an independent lighting unit for primarily illuminating the printed circuit board; a photographing position control module for changing a reflection angle to required location coordinates of the printed circuit board; a camera for obtaining an image of the printed circuit board; a control unit including a motion controller, a lighting controller, and an to image processor to control the components; and a vision processing unit for reading the image obtained through the camera and judging whether the image is good or bad. The present invention has effects capable of obtaining a clear image of inspection objects by increasing a quantity of light entered into the camera through a stationary direct illuminating type of independent lighting unit, and accomplishing a precise inspection by preventing shadows from generating on the vision inspection of the object such as a printed circuit board on which different sizes of components are mounted.
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