摘要:
A probe station which includes a base machine (10), a probe platen (17) mounted on the base machine (10), and a single passive air cooled Nd:YAG laser (100), mounted with a microscope (22). The single laser supplies an output beam to a first non-linear crystal (106) for generating the second harmonic of the fundamental output wavelength. A mirror (107) then directs the beam at a 90 degree angle through a polarizer (108) to repolarize the fundamental wavelength. The beam then passes to a second non-linear crystal (109) for generating the third and fourth harmonic of the fundamental wavelength. A reflecting mirror (111) then directs the beam to a variable attenuator (112) to select the appropriate output wavelength in the infrared (1064 nm), in the green (532 nm), or in the ultraviolet (355 or 266 nm).
摘要:
A laser system includes a resonator having two gain modules generating pulses, coupled with intra-cavity polarization into a single beam line, using a single output coupler. A laser controller controls the laser heads to emit pulses in rapid succession, such as pulse pairs separated by a time interval of less than about 1 millisecond, and in some embodiments in a range from about zero (overlapping) to about 100 microseconds. Also a system adapted for metrology using particle image velocimetry PIV uses the resonator. For PIV, optics are provided in the output beam paths which expand the beam to form pulsed illumination sheets. A camera is used to capture images of the pulsed illumination sheets for analysis.
摘要:
A method and device for cleaning an electrical contact (310a). Semiconductor testing device. Process of manufacturing integrated circuits. The method comprises directing electromagnetic radiation (210) at the contact. The electromagnetic energy reacts with at least one of the contact (310a) and the debris (314) so as to cause at least a portion of the debris (314) on the contact (310a) to be removed. The electromagnetic radiation (210) may comprise coherent radiation, such as electromagnetic radiation generated using a laser. According to one aspect of the invention, the contact (310a) comprises a conductive material and the electromagnetic radiation (210) causes removal of the portion of the debris (314) substantially without removal of the conductive material. According to another aspect of the invention, the electromagnetic radiation (210) at least partially melts the conductive material. In one preferred system, the contact (310a) comprises a probe tip. In such a system the probe tip may comprise the tip of a probe needle mounted to a probe card used for testing integrated circuits.
摘要:
A probe station which includes a base machine (10), a probe platen (17) mounted on the base machine (10), and a single passive air cooled Nd:YAG laser (100), mounted with a microscope (22). The single laser supplies an output beam to a first non-linear crystal (106) for generating the second harmonic of the fundamental output wavelength. A mirror (107) then directs the beam at a 90 degree angle through a polarizer (108) to repolarize the fundamental wavelength. The beam then passes to a second non-linear crystal (109) for generating the third and fourth harmonic of the fundamental wavelength. A reflecting mirror (111) then directs the beam to a variable attenuator (112) to select the appropriate output wavelength in the infrared (1064 nm), in the green (532 nm), or in the ultraviolet (355 or 266 nm).
摘要:
A laser system includes a resonator having two gain modules (350A,350B) generating pulses, coupled with intra-cavity polarization into a single beam line (362), using a single output coupler (354). A laser controller (340) controls the laser heads (350A,353A,350B,353B) to emit pulses in rapid succession, such as pulse pairs (505) separated by a time interval of less than about 1 millisecond, and in some embodiments in a range from about zero (overlapping) to about 100 microseconds. Also a system adapted for metrology using particle image velocimetry PIV uses the resonator. For PIV, optics (515,520,521) are provided in the output beam paths (504) which expand the beam to form pulsed illumination sheets (525). A camera (533) is used to capture images (532) of the pulsed illumination sheets (525) for analysis.
摘要:
A probe station which includes a base machine (10), a probe platen (17) mounted on the base machine (10), and a single passive air cooled Nd:YAG laser (100), mounted with a microscope (22). The single laser supplies an output beam to a first non-linear crystal (106) for generating the second harmonic of the fundamental output wavelength. A mirror (107) then directs the beam at a 90 degree angle through a polarizer (108) to repolarize the fundamental wavelength. The beam then passes to a second non-linear crystal (109) for generating the third and fourth harmonic of the fundamental wavelength. A reflecting mirror (111) then directs the beam to a variable attenuator (112) to select the appropriate output wavelength in the infrared (1064 nm), in the green (532 nm), or in the ultraviolet (355 or 266 nm).