Dual head laser system with intracavity polarization and particle image velocimetry system using the same
    2.
    发明公开
    Dual head laser system with intracavity polarization and particle image velocimetry system using the same 有权
    Doppelkopf-Lasersystem mitintrakavitärerPolarization und Teilchenbildgeschwindigkeitsmesssystem,das ein solches Lasersystem verwendet

    公开(公告)号:EP1422796A2

    公开(公告)日:2004-05-26

    申请号:EP03257173.9

    申请日:2003-11-13

    申请人: New Wave Research

    发明人: Liu, Kuo-Ching

    IPC分类号: H01S3/23 H01S3/081 H01S3/109

    摘要: A laser system includes a resonator having two gain modules generating pulses, coupled with intra-cavity polarization into a single beam line, using a single output coupler. A laser controller controls the laser heads to emit pulses in rapid succession, such as pulse pairs separated by a time interval of less than about 1 millisecond, and in some embodiments in a range from about zero (overlapping) to about 100 microseconds. Also a system adapted for metrology using particle image velocimetry PIV uses the resonator. For PIV, optics are provided in the output beam paths which expand the beam to form pulsed illumination sheets. A camera is used to capture images of the pulsed illumination sheets for analysis.

    摘要翻译: 激光系统包括具有两个增益模块(350A,350B)的谐振器,该增益模块使用单个输出耦合器(354)产生与腔内偏振耦合到单个光束线(362)中的脉冲。 激光控制器(340)控制激光头(350A,353A,350B,353B)以快速连续的方式发射脉冲,例如以小于约1毫秒的时间间隔分开的脉冲对(505),并且在一些实施例中 从大约零(重叠)到大约100微秒的范围。 同样,使用粒子图像测速法PIV的计量系统也使用谐振器。 对于PIV,在输出光束路径(504)中提供光学器件(515,520,521),其使光束膨胀以形成脉冲照明片材(525)。 相机(533)用于捕获脉冲照明片材(525)的图像(532)用于分析。

    METHOD AND APPARATUS FOR CLEANING ELECTRONIC TEST CONTACTS
    4.
    发明公开
    METHOD AND APPARATUS FOR CLEANING ELECTRONIC TEST CONTACTS 审中-公开
    方法和系统清洗电子测试触点

    公开(公告)号:EP1021822A2

    公开(公告)日:2000-07-26

    申请号:EP98946037.3

    申请日:1998-09-11

    申请人: New Wave Research

    IPC分类号: H01L21/00

    摘要: A method and device for cleaning an electrical contact (310a). Semiconductor testing device. Process of manufacturing integrated circuits. The method comprises directing electromagnetic radiation (210) at the contact. The electromagnetic energy reacts with at least one of the contact (310a) and the debris (314) so as to cause at least a portion of the debris (314) on the contact (310a) to be removed. The electromagnetic radiation (210) may comprise coherent radiation, such as electromagnetic radiation generated using a laser. According to one aspect of the invention, the contact (310a) comprises a conductive material and the electromagnetic radiation (210) causes removal of the portion of the debris (314) substantially without removal of the conductive material. According to another aspect of the invention, the electromagnetic radiation (210) at least partially melts the conductive material. In one preferred system, the contact (310a) comprises a probe tip. In such a system the probe tip may comprise the tip of a probe needle mounted to a probe card used for testing integrated circuits.

    Dual head laser system with intracavity polarization and particle image velocimetry system using the same
    6.
    发明公开
    Dual head laser system with intracavity polarization and particle image velocimetry system using the same 有权
    与腔内偏振和Teilchenbildgeschwindigkeitsmesssystem使用这种激光系统双头激光系统

    公开(公告)号:EP1422796A3

    公开(公告)日:2005-02-23

    申请号:EP03257173.9

    申请日:2003-11-13

    申请人: New Wave Research

    发明人: Liu, Kuo-Ching

    IPC分类号: H01S3/23 H01S3/081 H01S3/109

    摘要: A laser system includes a resonator having two gain modules (350A,350B) generating pulses, coupled with intra-cavity polarization into a single beam line (362), using a single output coupler (354). A laser controller (340) controls the laser heads (350A,353A,350B,353B) to emit pulses in rapid succession, such as pulse pairs (505) separated by a time interval of less than about 1 millisecond, and in some embodiments in a range from about zero (overlapping) to about 100 microseconds. Also a system adapted for metrology using particle image velocimetry PIV uses the resonator. For PIV, optics (515,520,521) are provided in the output beam paths (504) which expand the beam to form pulsed illumination sheets (525). A camera (533) is used to capture images (532) of the pulsed illumination sheets (525) for analysis.