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14 条记录 (耗时 0.012 秒)

    ION PUMP RELAY CONTROL
    2.
    发明公开
    ION PUMP RELAY CONTROL 有权
    离子泵开关控制

    公开(公告)号：EP1129468A1

    公开(公告)日：2001-09-05

    申请号：EP99951507.5

    申请日：1999-10-13

    申请人： Siemens Applied Automation, Inc.

    发明人： LITTLEJOHN, Duane, P.

    IPC分类号： H01J49/04 ,  H01J49/38

    CPC分类号： H01J49/38 ,  H01J41/12 ,  H01J49/0495

    摘要： A relay control for an ion pump used in a FTICR MS. When it is desired to admit new sample gas into the vacuum system, the high voltage that powers the ion pump is removed from the pump electrode by opening the normally closed relay contact. A normally open contact relay contact is then closed to ground the pump electrodes and discharge any stray capacity. The sample valve is opened momentarily to admit new sample gas and after the ions are formed and trapped in the ion cell in the vacuum system the pump is restarted.

    TOTAL ION NUMBER DETERMINATION IN AN ION CYCLOTRON RESONANCE MASS SPECTROMETER USING ION MAGNETRON RESONANCE
    3.
    发明公开
    TOTAL ION NUMBER DETERMINATION IN AN ION CYCLOTRON RESONANCE MASS SPECTROMETER USING ION MAGNETRON RESONANCE 有权
    离子磁共振质谱法测定离子循环共振质谱仪中的总离子数

    公开(公告)号：EP1082751A1

    公开(公告)日：2001-03-14

    申请号：EP99925783.5

    申请日：1999-05-24

    申请人： Siemens Applied Automation, Inc.

    发明人： BEU, Steven, C.

    IPC分类号： H01J49/38

    CPC分类号： H01J49/38

    摘要： The total number of ions created or obtained during an ionization or ion introduction event in a Fourier transform ion cyclotron resonance mass spectrometer are determined either by using an on-resonance experimental technique or an off-resonance experimental technique. Both techniques exploit ion magnetron motion. In the on-resonance technique the spectrometer is excited in the magnetron mode and the single resonance signal resulting from this excitation is detected to determine the total number of ions. In the off-resonance technique the magnetron mode is excited at a frequency that is near the magnetron frequency while simultaneously detecting the resulting ion motion. The off-resonance technique leaves the ion population in a state that is amenable to subsequent analysis.

    摘要翻译： 通过使用共振实验技术或非共振实验技术来确定在傅立叶变换离子回旋共振质谱仪中在离子化或离子引入事件期间产生或获得的离子的总数。 这两种技术均利用离子磁控管运动。 在共振技术中，光谱仪在磁控管模式下被激励，并且由该激励产生的单个共振信号被检测以确定离子的总数。 在非共振技术中，磁控管模式以接近磁控管频率的频率激励，同时检测所产生的离子运动。 离谐振技术使离子总体处于适合随后分析的状态。

    PROGRAMMED ELECTRON FLUX
    7.
    发明公开
    PROGRAMMED ELECTRON FLUX 有权
    PROGRAMMIERTER ELEKTRONENFLUSS

    公开(公告)号：EP1121709A1

    公开(公告)日：2001-08-08

    申请号：EP99951513.3

    申请日：1999-10-13

    申请人： Siemens Applied Automation, Inc.

    发明人： LITTLEJOHN, Duane, P. ,  ARNOLD, Robert, W.

    IPC分类号： H01J49/42 ,  H01J49/38 ,  H01J49/02

    CPC分类号： H01J49/147 ,  H01J49/022 ,  H01J49/38

    摘要： A quantity of electrons that will be used in the ionization event in an FTICR MS is preprogrammed. When the number of electrons produced reaches that number, the electron beam is turned off. This approach assures that the same number of electrons are used for every measurement and eliminates the variations due to fundamental characteristics of the electron source and the variations in temperature due to changing ambient conditions.

    METHOD FOR FORMING A SEAT IN A PULSED SAMPLING VALVE
    8.
    发明公开
    METHOD FOR FORMING A SEAT IN A PULSED SAMPLING VALVE 有权
    用于生产阀座进样阀

    公开(公告)号：EP1119721A1

    公开(公告)日：2001-08-01

    申请号：EP99951512.5

    申请日：1999-10-13

    申请人： Siemens Applied Automation, Inc.

    发明人： LITTLEJOHN, Duane, P. ,  SCHUBERT, W., Peter

    IPC分类号： F16K25/00 ,  F16K51/02

    CPC分类号： F16K25/005 ,  F16K51/02

    摘要： A method for forming the seat in a pulsed sampling valve used in a FTICR MS. The valve has a ceramic ball (44) that closes against the seat to thereby seal the passageway (36) that is used for introduction of sample into the FTICR MS vacuum chamber. The material from which the seat is formed is chosen to withstand relatively high operating temperatures and a precise deburred hole is drilled in that material. The pre-load spring (48) exerts a force against the ball when the valve is assembled. The force initially exceeds the yield strength of the seat material to deform the material to form the seat.

    PRECISION PRESSURE MONITOR
    10.
    发明公开
    PRECISION PRESSURE MONITOR 有权
    精密压力监测装置

    公开(公告)号：EP1129467A2

    公开(公告)日：2001-09-05

    申请号：EP99970784.7

    申请日：1999-10-13

    申请人： Siemens Applied Automation, Inc.

    发明人： LITTLEJOHN, Duane, P. ,  ARNOLD, Robert, W.

    IPC分类号： H01J41/06 ,  H01J49/38 ,  H01J49/42

    CPC分类号： H01J41/12 ,  H01J49/38

    摘要： During operation of a FTICR MS the time after the opening of the pulsed valve sample gas inlet system that the peak of sample gas pressure occurs in the vacuum chamber is determined by measuring the amplitude of the ion pump current. The FTICR MS then uses that time and the known period of time for which a source of electrons used for an ionization event is energized to energize the electron source so that the known period of time includes the peak of vacuum chamber sample gas pressure. This allows ions to be created during the peak of the sample gas pressure to thereby obtain the maximum sensitivity during measurements.