DISPOSITIF D'ANALYSE DE MATERIAUX PAR SPECTROSCOPIE DE PLASMA
    2.
    发明公开
    DISPOSITIF D'ANALYSE DE MATERIAUX PAR SPECTROSCOPIE DE PLASMA 有权
    EINRICHTUNG ZUM ANALYSIEREN VON MATERIALIEN DURCH PLASMASPEKTROSKOPIE

    公开(公告)号:EP2359110A1

    公开(公告)日:2011-08-24

    申请号:EP09759753.8

    申请日:2009-11-03

    Inventor: SENAC Stéphane

    Abstract: The invention relates to a device for analysing materials by plasma spectroscopy, of the type that is portable and self-contained and including a housing (10) containing a laser generator (18) generating laser pulses that are focalised onto the surface of a material to be analysed by a parabolic mirror (32) capable of translation in the housing so as to carry out a series of point measurements along a scanning line at the surface of the material to be analysed and a measurement on a calibration sample (50) mounted in the measurement endpiece (22) of the housing (10).

    Abstract translation: 用于通过等离子体光谱法分析材料的装置是便携式和独立型的装置,包括一个包含激光发生器(18)的壳体(10),该激光发生器(18)发射激光脉冲,该激光脉冲通过抛物面方式聚焦在待分析材料的表面上 反射镜(32),其可在壳体内平移地移动,以便沿着要分析的材料的表面上的扫描线执行一系列点测量,并且从安装在所述待校准样品中的校准样品(50)进行测量 壳体(10)的测量端部件(22)。

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