公开(公告)号：EP2212680A2

公开(公告)日：2010-08-04

申请号：EP09787463.0

申请日：2009-07-09

Applicant: Brightview Systems Ltd.

Inventor： FINAROV, Moshe

IPC: G01N21/95 ,  G01N21/31

CPC classification number: G01N21/8422 ,  G01N21/31 ,  G01N21/6489 ,  G01N21/8901 ,  G01N2021/3568 ,  G01N2021/8908 ,  G01N2201/0826 ,  G01N2201/0833 ,  G01N2201/1085

Abstract: Photovoltaic thin film quality control is obtained where the thin film is supported by a support and a section of the film is illuminated by a polychromatic illumination source. The source forms on the thin film a continuous illuminated line. Discrete sampled points located on the illuminated line are imaged onto a two dimensional optical switch. A concordance look-up-table between the coordinates of the above sampled points on the thin film and their coordinates on the two dimensional optical switch are generated. The spectral composition of the illumination reflected by the sampled points is determined and photovoltaic thin film parameters applicable to the quality control are derived from the spectral composition of reflected or transmitted by the photovoltaic thin film illumination.

公开(公告)号：EP2386059A1

公开(公告)日：2011-11-16

申请号：EP09810749.3

申请日：2009-12-23

Applicant: Brightview Systems Ltd.

Inventor： NOY, Noam ,  LIPSON, Ariel ,  FINAROV, Moshe

IPC: G01N21/84

CPC classification number: G01N21/8422 ,  H02S50/15

Abstract: A method of a photovoltaic panel (104) quality control, said method comprising: enabling a relative movement in at least one direction (112) between the photovoltaic panel (104) and a low-resolution scanning imaging unit (132) and capturing successive two-dimensional frames of the scanned area; analyzing the aquired image frames for presence of thin film production defects (144) and communicating to a high resolution image scanning unit (136) locations of said production defects; enabling a relative movement (148) between the photovoltaic panel and the high resolution scanning unit said, movement following the low-resolution unit movement and at least one additional direction parallel to the photovoltaic panel movement direction to aquire and classify the thin film production defects communicated by the low resolution scanning unit; and wherein the low and high resolution scanning units move simultaneously with the same speed (124) across the photovoltaic panel and the speed of the high resolution scanning unit moving in the direction parallel to the thin film movement direction is different from the speed at which the photovoltaic panel moves.