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公开(公告)号:EP0866993B1
公开(公告)日:2004-02-25
申请号:EP97935534.4
申请日:1997-07-22
申请人: CARL ZEISS JENA GmbH
CPC分类号: G02B21/0032 , G02B21/0024 , G02B21/0052 , G02B21/0072 , G02B21/06
摘要: The invention concerns a doublet system for a microscope, with one lens (25) being provided for focusing object illumination onto an object point, and one lens (33) for collecting light emitted by the object point. The optical axes of the two lens systems (25, 33) are at a slant to one another, so that the direction of observation and the direction of illumination are at an angle to one another. The two lens systems (25, 33) are grouped together into a doublet unit (1) on a joint holder (3); light can be supplied to this unit from an object illumination source, through a light aperture (5). A light deflection system (19, 21, 23, 37, 39) is also provided, which distorts the illumination path (35) and/or the observation path (35) in such a way that the observation light coming from the observation lens (33) leaves the doublet unit (1) through the light aperture (5). Thus the doublet unit can be employed in a conventional microscope design.
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公开(公告)号:EP1019769A1
公开(公告)日:2000-07-19
申请号:EP99938354.0
申请日:1999-07-27
申请人: CARL ZEISS JENA GmbH
IPC分类号: G02B21/00
CPC分类号: G02B21/0056 , G02B21/0032 , G02B21/0072 , G02B21/0076
摘要: The invention relates to a compact confocal theta microscope which can be used as theta microscope with single objective or dual-objective system. Said microscope is characterized by separate directions of illumination and detection, whereby the direction of detection in the objective is inclined at a set angle in relation to the direction of illumination. Said angle is chosen such that the area of overlap of the illumination volume and detection volume is reduced in comparison with a conventional confocal microscope. In the optical path between the objective and an image plane of the microscope a beam splitter or reflector are positioned for injecting the illumination light and/or coupling out the detection light. The injection of the illumination light into the microscope and/or coupling out of the detection light from the microscope can take place via one or more optic fibres.
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公开(公告)号:EP0866993A1
公开(公告)日:1998-09-30
申请号:EP97935534.0
申请日:1997-07-22
申请人: CARL ZEISS JENA GmbH
IPC分类号: G02B21
CPC分类号: G02B21/0032 , G02B21/0024 , G02B21/0052 , G02B21/0072 , G02B21/06
摘要: The invention concerns a doublet system for a microscope, with one lens (25) being provided for focusing object illumination onto an object point, and one lens (33) for collecting light emitted by the object point. The optical axes of the two lens systems (25, 33) are at a slant to one another, so that the direction of observation and the direction of illumination are at an angle to one another. The two lens systems (25, 33) are grouped together into a doublet unit (1) on a joint holder (3); light can be supplied to this unit from an object illumination source, through a light aperture (5). A light deflection system (19, 21, 23, 37, 39) is also provided, which distorts the illumination path (35) and/or the observation path (35) in such a way that the observation light coming from the observation lens (33) leaves the doublet unit (1) through the light aperture (5). Thus the doublet unit can be employed in a conventional microscope design.
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公开(公告)号:EP1019769B1
公开(公告)日:2004-09-29
申请号:EP99938354.0
申请日:1999-07-27
申请人: CARL ZEISS JENA GmbH
IPC分类号: G02B21/00
CPC分类号: G02B21/0056 , G02B21/0032 , G02B21/0072 , G02B21/0076
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5.
公开(公告)号:EP0859968B1
公开(公告)日:2004-02-25
申请号:EP97934516.2
申请日:1997-07-22
申请人: CARL ZEISS JENA GmbH
CPC分类号: G02B21/18
摘要: The invention relates to a beam diverter unit for multiaxial investigation of samples in a microscope, allowing on the one hand the illumation and/or observation of the sample from various sides, and on the other hand observation of the sample at a certain angle to the illumination axis. Investigation of the sample occurs through an available microscope with the above-mentioned beam diverter unit, which is located between the microscope objective and the focal plane. The observation optical path (1) can be partially constructed in a manner symetrical to the illumination optical path (1) (indicated with dotted lines). The central beam (12) emanating from the illumination focal point (9) indicating the situation of the observation axis, and the marginal beams (13, 14) hit the beam diverter unit (8) in accordance with the invention and are reflected there. They are collimated by an appropriate distance between the beam diverter unit (8) and the focal plane (6) and an appropriate inclination angle α2 of the beam diverter unit from the microscope objective (5). The beams (12, 13, 14) pass through the exit aperture of the objective (5) at a reflexion angle β2 and reach a detector (30) with an upstream pinhole (20) via the lense and the optical system (25, 26). Without a beam diverter unit the beams (12, 13, 14) would intersect each other at a point (15) in the focal plane (6). This beam path is indicated by thin lines.
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6.
公开(公告)号:EP0859968A1
公开(公告)日:1998-08-26
申请号:EP97934516.0
申请日:1997-07-22
申请人: CARL ZEISS JENA GmbH
IPC分类号: G02B21
CPC分类号: G02B21/18
摘要: The invention relates to a beam diverter unit for multiaxial investigation of samples in a microscope, allowing on the one hand the illumation and/or observation of the sample from various sides, and on the other hand observation of the sample at a certain angle to the illumination axis. Investigation of the sample occurs through an available microscope with the above-mentioned beam diverter unit, which is located between the microscope objective and the focal plane. The observation optical path (1) can be partially constructed in a manner symetrical to the illumination optical path (1) (indicated with dotted lines). The central beam (12) emanating from the illumination focal point (9) indicating the situation of the observation axis, and the marginal beams (13, 14) hit the beam diverter unit (8) in accordance with the invention and are reflected there. They are collimated by an appropriate distance between the beam diverter unit (8) and the focal plane (6) and an appropriate inclination angle α2 of the beam diverter unit from the microscope objective (5). The beams (12, 13, 14) pass through the exit aperture of the objective (5) at a reflexion angle β2 and reach a detector (30) with an upstream pinhole (20) via the lense and the optical system (25, 26). Without a beam diverter unit the beams (12, 13, 14) would intersect each other at a point (15) in the focal plane (6). This beam path is indicated by thin lines.
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