ILLUMINATION IN DIGITAL PATHOLOGY SCANNING
    1.
    发明公开
    ILLUMINATION IN DIGITAL PATHOLOGY SCANNING 审中-公开
    数字病理学扫描中的照明

    公开(公告)号:EP3191885A1

    公开(公告)日:2017-07-19

    申请号:EP16708152.0

    申请日:2016-03-07

    摘要: The present invention relates to digital pathology. In order provide enhanced use of available imaging radiation, a digital pathology scanner (10) is provided that comprises a radiation arrangement (12), a sample receiving device (14), an optics arrangement (16), and a sensor unit (18). The radiation arrangement comprises a source (20) that provides electromagnetic radiation (22) for radiating a sample received by the sample receiving device. Further, the optics arrangement comprises at least one of the group of a lens (24) and a filter (26) that are arranged between the sample receiving device and the sensor unit. The sensor unit is configured to provide image data of the radiated sample. Still further, a lens array arrangement (28) is provided that comprises at least one lens array (30) arranged between the source and the sample receiving device. The at least one lens array comprises a plurality of linear cylindrical lenses (32) that modulate the electromagnetic radiation from the source such that, in an object plane, a radiation distribution pattern (34) is generated with a plurality of first parts of intensified radiation and a plurality of second parts of weak radiation.

    摘要翻译: 本发明涉及数字病理学。 为了提供对可用成像辐射的增强的使用,提供了包括辐射装置(12),样本接收装置(14),光学装置(16)和传感器单元(18)的数字病理扫描仪(10) 。 辐射装置包括提供用于辐射由样品接收装置接收的样品的电磁辐射(22)的源(20)。 此外,光学装置包括布置在样本接收装置和传感器单元之间的透镜组(24)和过滤器(26)的组中的至少一个。 传感器单元被配置为提供辐射样本的图像数据。 此外,提供了一种透镜阵列布置(28),其包括布置在源和样本接收装置之间的至少一个透镜阵列(30)。 所述至少一个透镜阵列包括多个线性柱面透镜(32),所述多个线性柱面透镜(32)调制来自所述源的电磁辐射,使得在物平面中产生具有多个增强辐射的第一部分的辐射分布图案(34) 和多个弱辐射的第二部分。

    KONFOKALER ABSTANDSSENSOR
    5.
    发明授权
    KONFOKALER ABSTANDSSENSOR 有权
    共焦距离传感器

    公开(公告)号:EP1714109B1

    公开(公告)日:2007-07-25

    申请号:EP05707841.2

    申请日:2005-01-25

    发明人: SCHICK, Anton

    摘要: The invention concerns a confocal distance sensor (300) comprising the following components: an optical component (313) in the form of a point both for sending an illuminating light (314) and for receiving a measuring light (315); a reproduction optics (320) for focusing the illuminating light (314) in the region of an object and for focusing the measuring light (75) reflected by the object surface in the region surrounding the optical component (313); a displacement device (322) for varying the optical path between the optical element (313) and the reproduction optics (320). The invention is characterized in that the displacement device (322) is designed to move directly the optical component (313) relative to the reproduction optics (320), such that the illuminating light (314) emitted by the optical component (313) is directly incident on the reproduction optics (320). The optical component (313) is preferably made of one end of an optical fiber (310). The invention is useful for producing an optical distance sensor with multiple channels, several optical fiber ends being arranged in a one-dimensional or two-dimensional grid and moved together or separately relative to a single reproduction optics.

    Vorrichtung zum Positionieren eines optischen Bauteils in einem Strahlengang
    6.
    发明公开
    Vorrichtung zum Positionieren eines optischen Bauteils in einem Strahlengang 有权
    Vorrichtung zum Positionieren eines optischen Bauteils在einem Strahlengang

    公开(公告)号:EP1122575A3

    公开(公告)日:2004-01-02

    申请号:EP01101475.0

    申请日:2001-01-24

    IPC分类号: G02B21/26 G02B21/00 G02B7/00

    摘要: Eine Vorrichtung zum Positionieren eines optischen Bauteils (1) in einem Strahlengang (2), vorzugsweise im Strahlengang (2) eines Mikroskops, insbesondere eines konfokalen Rastermikroskops, wobei mehrere optische Bauteile (1) in einer Fassung (3) justiert angeordnet sind, ist dadurch gekennzeichnet, dass die Fassung (3) als Magazin (3) in einem im Strahlengang (2) positionierten, einen Durchgang (4) für den Strahlengang (2) aufweisenden Führungsblock (5) geführt ist. Weiterhin ist zum einfachen, schnellen und präzisen Austausch der optischen Elemente unter Vermeidung einer stets erforderlichen Justage der optischen Bauteile eine Vorrichtung zum Positionieren eines optischen Bauteils in einem Strahlengang (2), vorzugsweise im Strahlengang eines Mikroskops, insbesondere eines konfokalen Rastermikroskops, dadurch gekennzeichnet, dass das optische Bauteil als ein monolithisches Substrat (19) mit Bereichen unterschiedlicher optischer Eigenschaften ausgebildet ist und in einem im Strahlengang (2) positionierten, einen Durchgang (4) für den Strahlengang (2) aufweisenden Führungsblock (5) geführt ist.

    摘要翻译: 形成在光学部件(1)上的光学活性表面(6)位于平行于安装件(3)的引导表面(7)的平面上。 引导块(5)具有沿着光束路径(2)形成的开口(4)。 光学部件设置在安装座上。 共焦扫描显微镜还包括一个独立的权利要求。

    CONFOCAL MICROSCOPY APPARATUS AND METHOD
    7.
    发明授权
    CONFOCAL MICROSCOPY APPARATUS AND METHOD 有权
    DEVICE AND METHOD FOR共聚焦显微镜

    公开(公告)号:EP1145067B1

    公开(公告)日:2002-09-04

    申请号:EP00900715.4

    申请日:2000-01-17

    IPC分类号: G02B21/00

    摘要: The confocal microscope has two matched light sources: a first light source (1) and a second light source (8). The light sources (1,8) are arranged to illuminate opposite sides of a modulating mask (6). The light either reflecting from or passing through the modulating mask (6) is then used to illuminate an object O supported on a mount (5). The microscope is arranged so that the object O is mounted on the opposite side of the mask (6) to a camera (7) such that light reflected from the object O passes through the modulating mask (6) before being captured by the camera (7). Subtraction of the image produced using the second light source (8) from the image produced using the first light source (1) generates a confocal image that contains substantially less noise than is possible with available confocal microscopy apparatus.

    VERFAHREN ZUR UNTERSUCHUNG EINES OBJEKTS MIT EINEM MIKROSKOP UND EIN MIKROSKOP
    10.
    发明公开
    VERFAHREN ZUR UNTERSUCHUNG EINES OBJEKTS MIT EINEM MIKROSKOP UND EIN MIKROSKOP 审中-公开
    步骤中使用的显微镜​​和显微镜的对象

    公开(公告)号:EP2064578A1

    公开(公告)日:2009-06-03

    申请号:EP07788340.3

    申请日:2007-08-09

    发明人: SIECKMANN, Frank

    IPC分类号: G02B21/36

    摘要: A method for examining a specimen using a microscope, in particular a confocal scanning microscope, has the following steps. First, a scanning region, containing a specimen to be examined or a plurality of specimens to be examined, in a predeterminable spatial direction is selected. Then, a series of images in the scanning region along the spatial direction are recorded such that the individual images can be uniquely assigned to individual planes in the spatial direction. Then, an image analysis method is selected with at least one predeterminable criterion with respect to the specimen to be examined or the specimens to be examined. Finally, the image analysis method is applied to the individual planes for ascertaining a preferred plane which at least to a great extent satisfies the predeterminable criterion or criteria. Furthermore, a microscope for carrying out the method is specified.