公开(公告)号：EP2534440A1

公开(公告)日：2012-12-19

申请号：EP11704323.2

申请日：2011-01-21

申请人： Canon Kabushiki Kaisha

发明人： NAGAI, Kentaro

IPC分类号： G01B11/25 ,  G01B15/00 ,  G21K7/00

CPC分类号： G01B11/254 ,  G01B15/00 ,  G21K2207/005

摘要： An analyzing method for deriving phase information by analyzing a periodic pattern of moiré comprises steps of: subjecting at least a part of the periodic pattern of moiré to a windowed Fourier transform by a window function; calculating analytically, based on the moiré subjected to the windowed Fourier transform, information of a first spectrum carrying the phase information, and information of a second spectrum superimposed on the information of the first spectrum; and separating the information of the first spectrum from the information of the second spectrum, to derive the phase information.

公开(公告)号：EP2932246B1

公开(公告)日：2020-04-22

申请号：EP13821202.2

申请日：2013-12-12

申请人： Canon Kabushiki Kaisha

发明人： NAGAI, Kentaro

IPC分类号： G01N23/04

公开(公告)号：EP2718699A1

公开(公告)日：2014-04-16

申请号：EP12729751.3

申请日：2012-05-30

申请人： Canon Kabushiki Kaisha

发明人： NAGAI, Kentaro

IPC分类号： G01N23/04 ,  G01B9/02

CPC分类号： G01T1/00 ,  A61B6/4035 ,  A61B6/4291 ,  A61B6/484 ,  G01B9/02098 ,  G01N23/20075 ,  G01N2223/345

摘要： An imaging apparatus includes a shearing interferometer and a calculation unit configured to calculate information on an object from an interference pattern obtained by the shearing interferometer, wherein the calculation unit solves, as simultaneous equations, three or more equations that express Fourier components at coordinates in a wave number space obtained by performing a windowed Fourier transform on the interference pattern.

公开(公告)号：EP2932246A1

公开(公告)日：2015-10-21

申请号：EP13821202.2

申请日：2013-12-12

申请人： Canon Kabushiki Kaisha

发明人： NAGAI, Kentaro

IPC分类号： G01N23/04

摘要： The present invention relates to an object information obtaining apparatus that obtains information about a phase image of an object using information about an interference pattern produced by a shearing interferometer, the interference pattern being formed by an electromagnetic wave or electron beam passed through or reflected by the object. The apparatus includes a first obtaining unit configured to obtain information about a differential phase image of the object using the information about the interference pattern, a second obtaining unit configured to obtain information about contrast in each region of the interference pattern, a third obtaining unit configured to weight the information about the differential phase image using the information about the contrast to obtain information about a weighted differential phase image, and a fourth obtaining unit configured to integrate the information about the weighted differential phase image to obtain the information about the phase image of the object.

摘要翻译： 本发明涉及一种使用关于由剪切干涉仪产生的干涉图案的信息获取关于对象的相位图像的信息的对象信息获取装置，该干涉图案是由通过或反射的电磁波或电子束形成的 目的。 该装置包括：第一获取单元，被配置为使用关于干扰图案的信息获得关于对象的差分相位图像的信息;第二获取单元，被配置为获得关于干涉图案的每个区域中的对比度的信息;第三获取单元， 使用关于对比度的信息来加权关于差分相位图像的信息，以获得关于加权差分相位图像的信息;以及第四获取单元，被配置为将关于加权微分相位图像的信息进行积分，以获得关于加权微分相位图像的相关图像的信息 物体。

公开(公告)号：EP2342551A1

公开(公告)日：2011-07-13

申请号：EP09788095.9

申请日：2009-10-28

申请人： Canon Kabushiki Kaisha

发明人： NAGAI, Kentaro ,  DEN, Toru

IPC分类号： G01N23/04

CPC分类号： G06T7/0002 ,  A61B6/4291 ,  A61B6/484 ,  G01J9/02 ,  G01N23/04 ,  G01N23/20075 ,  G01N2223/401 ,  G21K1/06 ,  G21K2201/06 ,  G21K2201/067

摘要： An analysis method for use in a radiation imaging apparatus employing intensity information of interference fringes of radiation rays that have passed through a detected object includes the steps of generating first phase information of the detected object wrapped into a range of 2p from the intensity information of the interference fringes; generating information on an absorption intensity gradient of the detected object from the intensity information of the interference fringes; generating a weighting function on the basis of an absolute value of a gradient in the information on the absorption intensity gradient; and generating second phase information by unwrapping the first phase information by using the weighting function.

公开(公告)号：EP2779902A1

公开(公告)日：2014-09-24

申请号：EP12798431.8

申请日：2012-11-02

申请人： Canon Kabushiki Kaisha

发明人： NAGAI, Kentaro ,  TAKEDA, Mitsuo

IPC分类号： A61B6/00 ,  G01N21/45 ,  G01N23/205

CPC分类号： G06K9/62 ,  A61B6/00 ,  A61B6/484 ,  A61B6/5258 ,  G01J9/0215 ,  G01N23/04 ,  G01N2223/345 ,  G01N2223/401

摘要： Disclosed is an imaging apparatus for generating data of a phase image based on an interference pattern acquired by a shearing interferometer, including: a differential phase data calculating unit that calculates first differential phase data expressing a change of a phase in a first direction and second differential phase data expressing a change of a phase in a second direction, based on interference pattern data generated by an electromagnetic wave transmitted through a subject; a second-order differential phase data calculating unit that calculates first second-order differential phase data by differentiating the first differential phase data in the first direction, and calculates second second-order differential phase data by differentiating the second differential phase data in the second direction; and a phase data calculating unit that calculates the phase image by solving a second-order differential equation including the first and second second-order differential phase data as functions.