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    DETECTOR ARRANGEMENT FOR AN X-RAY PHASE CONTRAST SYSTEM AND METHOD FOR X-RAY CONTRAST IMAGING
    1.
    发明公开
    DETECTOR ARRANGEMENT FOR AN X-RAY PHASE CONTRAST SYSTEM AND METHOD FOR X-RAY CONTRAST IMAGING 审中-公开

    公开(公告)号：EP3382719A1

    公开(公告)日：2018-10-03

    申请号：EP17163089.0

    申请日：2017-03-27

    Applicant: Koninklijke Philips N.V.

    Inventor： PROKSA, Roland

    IPC: G21K1/02 ,  G01T1/00 ,  G21K4/00

    CPC classification number: G21K1/025 ,  G01T1/00 ,  G21K2004/06 ,  G21K2207/005

    Abstract: The present invention relates to a detector arrangement for an X-ray phase contrast system (5), the detector arrangement (1) comprising: a scintillator (11); an optical grating (12); and a detector (13); wherein the optical grating (12) is arranged between the scintillator (11) and the detector (13); wherein the scintillator (11) converts X-ray radiation (2) into optical radiation; wherein the optical grating (12) is configured to be an analyzer grating being adapted to a phase-grating (21) of an X-ray phase contrast system (5). The present invention further relates to a method for performing X-ray phase contrast imaging with a detector arrangement (1) mentioned above. The invention avoids the use of an X-ray absorption grating as G2 grating in an X-ray phase contrast interferometer system.

    AUTONOMOUS DETECTOR MODULE AS A BUILDING BLOCK FOR SCALABLE PET AND SPECT SYSTEMS
    4.
    发明授权
    AUTONOMOUS DETECTOR MODULE AS A BUILDING BLOCK FOR SCALABLE PET AND SPECT SYSTEMS 有权
    自动化系统

    公开(公告)号：EP2376940B1

    公开(公告)日：2017-05-17

    申请号：EP09764065.0

    申请日：2009-11-16

    Applicant: Koninklijke Philips N.V. ,  Philips Intellectual Property & Standards GmbH

    Inventor： DEGENHARDT, Carsten ,  FRACH, Thomas ,  PRESCHER, Gordian

    IPC: G01T1/164

    CPC classification number: G01T1/1644 ,  A61B6/037 ,  G01T1/00

    Abstract: When detecting scintillation events in a nuclear imaging system, time-stamping and energy-gating processing is incorporated into autonomous detection modules (ADM) (14) to reduce downstream processing. Each ADM (14) is removably coupled to a detector fixture (13), and comprises a scintillation crystal array (66) and associated light detect or (s) (64), such as a silicon photomultiplier or the like. The light detector(s) (64) is coupled to a processing module (62) in or on the ADM (14), which performs the energy gating and time-stamping.

    Abstract translation: 当检测核成像系统中的闪烁事件时，时间戳和能量门控处理被并入到自主检测模块（ADM）（14）中以减少下游处理。 每个ADM（14）可移除地耦合到检测器夹具（13），并且包括闪烁晶体阵列（66）和相关联的光检测（64），例如硅光电倍增管等。 光检测器（64）耦合到ADM（14）中或其上的处理模块（62），其执行能量门控和时间戳。

    SENSOR UNIT AND SOLID-STATE IMAGING DEVICE
    7.
    发明公开
    SENSOR UNIT AND SOLID-STATE IMAGING DEVICE 有权
    SENSOREINHEIT UNDFESTKÖRPER-BILDGEBUNGSVORRICHTUNG

    公开(公告)号：EP2790219A1

    公开(公告)日：2014-10-15

    申请号：EP12855813.7

    申请日：2012-12-04

    Applicant: Hamamatsu Photonics K.K.

    Inventor： FUJITA Kazuki ,  KYUSHIMA Ryuji ,  MORI Harumichi ,  OKADA Haruyoshi ,  SAWADA Junichi

    IPC: H01L27/14 ,  G01T7/00 ,  H01L27/144 ,  H04N5/32 ,  H04N5/369

    CPC classification number: H01L31/024 ,  G01T1/00 ,  H01L27/14618 ,  H01L27/14623 ,  H01L27/14632 ,  H01L27/14663 ,  H01L2224/48091 ,  H01L2224/48137 ,  H04N5/2257 ,  H04N5/32 ,  H04N5/378 ,  H01L2924/00014

    Abstract: A sensor unit 2A includes a metallic base member 20A, a solid-state imaging element 30, and amplifier chips 40. The base member 20A has a first placement surface 21 a and a second placement surface 21b. The solid-state imaging element 30 has a photodetecting surface 32, and is disposed on the first placement surface 21 a such that a rear surface 33 and the first placement surface 21a face each other. The amplifier chips 40 are mounted on a substrate 50 disposed on the second placement surface 21 b. The base member 20A further has side wall portions 25 facing side surfaces of the solid-state imaging element 30. The chips 40 and the solid-state imaging element 30 are electrically connected to one another via a bonding wire 92. The chips 40 are thermally coupled to the base member 20A via a thermal via 53 of the substrate 50.

    Abstract translation: 传感器单元2A包括金属基底构件20A，固态成像元件30和放大器芯片40.基座构件20A具有第一放置面21a和第二放置面21b。 固态成像元件30具有受光面32，并且配置在第一放置面21a上，使得后表面33和第一放置面21a彼此面对。 放大器芯片40安装在设置在第二放置表面21b上的基板50上。 基部构件20A还具有面向固态摄像元件30的侧面的侧壁部25.芯片40和固体摄像元件30经由接合线92彼此电连接。芯片40是热的 通过基板50的热通孔53耦合到基体部件20A。

    MCP unit, MCP detector, and time-of-flight mass spectrometer
    9.
    发明公开
    MCP unit, MCP detector, and time-of-flight mass spectrometer 审中-公开
    MCP单元，MCP检测器和飞行时间质谱仪

    公开(公告)号：EP2720251A2

    公开(公告)日：2014-04-16

    申请号：EP13188096.5

    申请日：2013-10-10

    Applicant: HAMAMATSU PHOTONICS K.K.

    Inventor： Suzuki, Akio ,  Washiyama, Yuuya

    IPC: H01J43/24

    CPC classification number: H01J43/246 ,  G01T1/00 ,  H01J49/40 ,  H01J49/403

    Abstract: An MCP unit of the present invention has a triode structure with a structure to achieve a desired time response characteristic independent of restrictions from a channel diameter of MCP, and is provided with an MCP group, a first electrode, a second electrode, an anode, and an acceleration electrode. Particularly, the MCP unit further comprises a ring member between the acceleration electrode and the anode, as s restriction structure for confining reflected electrons emitted from the anode in response to incidence of secondary electrons from the MCP group, within a space between the acceleration electrode and the anode.

    Abstract translation: 本发明的MCP单元具有三极管结构，该三极管结构具有以下结构，以实现与MCP的沟道直径的限制无关的期望的时间响应特性，并且设置有MCP组，第一电极，第二电极，阳极， 和加速电极。 特别地，MCP单元还包括加速电极和阳极之间的环构件，为s限制结构用于限制在响应于来自所述MCP组的二次电子的入射从阳极发出的反射电子，所述加速电极之间的空间内 阳极。

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