公开(公告)号：EP0151875A3

公开(公告)日：1987-07-15

申请号：EP84308520

申请日：1984-12-07

申请人： FUJITSU LIMITED

发明人： Suzuki, Hirokazu c/o Fujitsu Ltd. ,  Akiyama, Takehiro c/o Fujitsu Ltd. ,  Morita, Teruo c/o Fujitsu Ltd. ,  Masunaga, Hikotaro ,  Takeda, Hirofumi

IPC分类号： H03K05/13

CPC分类号： H03K5/13 ,  G01R31/3191 ,  H03K19/086

摘要： A gate circuit device, for example for an integrated circuit tester (10, 20), for variably setting signal propagation delay time (Tpd), for example to control timings of various output signals delivered from the IC tester to an integrated circuit (11) to be tested to predetermined values, comprises a gate circuit having a pair of emitter coupled transistors (01, Q2) and a constant current source transistor (Q3) connected to the emitter side of the pair of transistors (Q1, Q2) and a terminal for applying a predetermined level of voltage (VC, Vs) to the base of the constant current source transistor (Q3) to control constant current (Figure 1). As an alternative (Figure 6) to such voltage control of signal propagation delay time, a current adjustment circuit (CONT) may be utilized to generate current in a constant current source transistor (e.g. Q35) in response to a control current (I CNT )· Thus, the gate circuot device controls signal propagation delay time by regulating either voltage or current in response to control current.