摘要:
A device (100) for measuring a plant (105) comprises a plurality of light-section measuring devices (110), a rotator for causing a rotation (120) between the plant (105) and the plurality of light-section measuring devices (110) around a rotation axis (101), wherein each of the plurality of light-section measuring devices (110) is configured to generate a respective fan beam (130) in a respective fan plane, wherein the fan planes are arranged such that the rotation axis (101) extends within each of the fan planes, wherein the plurality of light-section measuring devices (110) is configured such that the fan beams (130) are directed to the plant (105) from different fan directions (135) which, when projected into a common plane (115) through which the rotation axis extends, by rotation around the rotation axis, differ from each other.
摘要:
A device (100) for measuring a plant (105) comprises a plurality of light-section measuring devices (110), a rotator for causing a rotation (120) between the plant (105) and the plurality of light-section measuring devices (110) around a rotation axis (101), wherein each of the plurality of light-section measuring devices (110) is configured to generate a respective fan beam (130) in a respective fan plane, wherein the fan planes are arranged such that the rotation axis (101) extends within each of the fan planes, wherein the plurality of light-section measuring devices (110) is configured such that the fan beams (130) are directed to the plant (105) from different fan directions (135) which, when projected into a common plane (115) through which the rotation axis extends, by rotation around the rotation axis, differ from each other.
摘要:
The invention relates to a device and to a method for detecting at least partially reflective surfaces. Said device comprises a detection surface and an illumination device which is designed to project a pattern by reflecting over the at least partially reflective surface to the detection surface.