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    Laser shock peening plasma diagnostics sensors for real time process monitoring
    1.
    发明公开
    Laser shock peening plasma diagnostics sensors for real time process monitoring 有权
    Laserschockverfestigte Plasma- DiagnosesensorenfürEchtzeit-Prozessüberwachung

    公开(公告)号：EP1795887A1

    公开(公告)日：2007-06-13

    申请号：EP06125751.5

    申请日：2006-12-08

    申请人： GENERAL ELECTRIC COMPANY

    发明人： Benicewicz, Pamela King ,  Azer, Magdi Naim ,  Deaton, Jr., John Broddus ,  Wu, Pingfan Peter ,  Rockstroh, Todd Jay

    IPC分类号： G01N21/70 ,  C21D10/00

    CPC分类号： G01N21/718 ,  B23K26/0069 ,  B23K26/032

    摘要： A system for monitoring a laser shock event includes a detector (20,74,110) connected to a controller (14). The controller (14) includes an input configured to receive a signal from the detector (20,74,110) that is indicative of an emission (36,75,128) associated with a laser shock event at a workpiece (26,56,120). A processor (16,76,140) is connected to the input and is configured to determine a cause of an unacceptable peen event from the signal associated with the emission (36,75,128).

    摘要翻译： 用于监视激光冲击事件的系统包括连接到控制器（14）的检测器（20,71,110）。 控制器（14）包括被配置为从检测器（20,74,110）接收指示与工件（26,56,120）处的激光冲击事件相关联的发射（36,75,128）的信号的输入。 处理器（16,76,140）连接到输入端并且被配置为从与发射相关联的信号（36,75,128）中确定不可接受的喷丸事件的原因。

    Manufacture of engineering components with designed defects for analysis of production components
    3.
    发明公开
    Manufacture of engineering components with designed defects for analysis of production components 审中-公开
    制造具有设计缺陷的工程组件，用于分析生产组件

    公开(公告)号：EP2530460A3

    公开(公告)日：2018-01-03

    申请号：EP12169742.9

    申请日：2012-05-29

    申请人： General Electric Company

    发明人： Rose, Curtis Wayne ,  Deaton, Jr., John Broddus

    IPC分类号： G01N27/00 ,  G01N29/30 ,  G01N29/44 ,  G01N21/93 ,  G01N23/00 ,  G01N29/04

    CPC分类号： G01N29/4436 ,  B33Y80/00 ,  G01N21/91 ,  G01N21/93 ,  G01N29/043 ,  G01N29/30 ,  G01N29/4427 ,  G01N2291/0258 ,  G05B19/401

    摘要： An engineering component (60) with a designed defect and use of an engineering component (60) with a designed defect to evaluate a production component are disclosed. A test component (70) having a known defect is manufactured. This known defect is a flaw that is intentionally included in the test component (70). The test component (70) is then analyzed to obtain a test profile (40) of the defect. In addition, the engineering component (60) to be tested is analyzed to obtain a production profile (40). This production profile (40) is compared with the test profile (40) to determine whether the engineering component (60) has a defect that corresponds to the known defect.

    摘要翻译： 公开了一种具有设计缺陷的工程部件（60）和具有设计缺陷的工程部件（60）的使用以评估生产部件。 制造具有已知缺陷的测试部件（70）。 这种已知缺陷是故意包含在测试部件（70）中的缺陷。 然后分析测试部件（70）以获得缺陷的测试轮廓（40）。 另外，分析要测试的工程部件（60）以获得生产简档（40）。 将该生产简档（40）与测试简档（40）进行比较以确定工程部件（60）是否具有与已知缺陷相对应的缺陷。